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    • 61. 发明授权
    • Glitchless clock multiplexer optimized for synchronous and asynchronous clocks
    • 针对同步和异步时钟优化的无毛刺时钟复用器
    • US07679408B2
    • 2010-03-16
    • US11960832
    • 2007-12-20
    • Eskinder HailuTakeo Yasuda
    • Eskinder HailuTakeo Yasuda
    • G06F1/08
    • H03K17/005G06F1/08
    • A circuit for switching clock signals with logic devices using a glitchless clock multiplexer optimized for synchronous and asynchronous clocks. The circuit comprises an asynchronous clock group and one or more synchronous clock group(s). The asynchronous group comprises a plurality of high frequency glitchless control (HFGC) blocks for asynchronous clock sources. Each synchronous group comprises a plurality of HFGC blocks for synchronous clock sources. The circuit comprises a multiplexer for receiving delayed input clock signals from HFGC blocks for asynchronous clock sources and from HFGC blocks for synchronous clock sources. A switching latency from a first input clock signal belonging to a synchronous group to a second input clock signal belonging to the same synchronous group is one clock cycle or less of the second input clock signal. Switching latency is the period in which no clock pulse appears at the final output of the circuit.
    • 用于使用针对同步和异步时钟优化的无毛刺时钟复用器的逻辑器件来切换时钟信号的电路。 该电路包括异步时钟组和一个或多个同步时钟组。 异步组包括用于异步时钟源的多个高频无毛刺控制(HFGC)块。 每个同步组包括用于同步时钟源的多个HFGC块。 该电路包括用于从用于异步时钟源的HFGC块和用于同步时钟源的HFGC块接收延迟的输入时钟信号的多路复用器。 属于同步组的第一输入时钟信号与属于同一同步组的第二输入时钟信号的切换等待时间是第二输入时钟信号的一个时钟周期。 切换延迟是在电路的最终输出处没有出现时钟脉冲的周期。
    • 63. 发明授权
    • Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
    • 在校准模式和测试模式下工作的占空比测量方法和装置
    • US07595675B2
    • 2009-09-29
    • US11381031
    • 2006-05-01
    • David William BoerstlerEskinder HailuJieming Qi
    • David William BoerstlerEskinder HailuJieming Qi
    • H03K5/04
    • G01R31/31727
    • The disclosed methodology and apparatus measure the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
    • 所公开的方法和装置测量时钟电路提供给占空比测量(DCM)电路的参考时钟信号的占空比。 在一个实施例中,DCM电路包括由电荷泵驱动的电容器。 参考时钟信号驱动电荷泵。 时钟电路在多个已知的占空比值之间改变参考时钟信号的占空比。 DCM电路将对应于每个已知占空比值的合成电容电压值存储在数据存储器中。 DCM电路通过电荷泵向电容器施加具有未知占空比的测试时钟信号,从而将电容器充电到对应于测试时钟信号占空比的新电压值。 控制软件访问数据存储,以确定测试时钟信号对应的占空比。
    • 65. 发明授权
    • Systems and methods for level shifting using AC coupling
    • 使用交流耦合进行电平转换的系统和方法
    • US07511554B2
    • 2009-03-31
    • US11764262
    • 2007-06-18
    • Masaaki KanekoDavid W. BoerstlerEskinder HailuJieming Qi
    • Masaaki KanekoDavid W. BoerstlerEskinder HailuJieming Qi
    • H03L5/00
    • H03K19/01812H03K19/01831
    • Systems and methods for conveying signals between integrated circuit (IC) components in domains having different supply voltages. AC coupling is used to increase the speed at which the common mode voltage of a signal is shifted from one level to another. One embodiment comprises a method for level shifting a binary signal in an IC. This method includes receiving an input binary signal and decoupling its AC component from its common mode component. A second common mode component is added to the AC component, providing a binary output signal. The common mode voltage of the input signal may be greater (or smaller) than that of the output signal. In one embodiment of the method, duty cycle compensation (DCC) is performed. The DCC drives the duty cycle toward a desired value.
    • 在具有不同电源电压的域中的集成电路(IC)组件之间传送信号的系统和方法。 AC耦合用于增加信号的共模电压从一个电平转移到另一个电平的速度。 一个实施例包括用于电平移位IC中的二进制信号的方法。 该方法包括接收输入二进制信号并将其AC分量与其共模分量去耦。 第二共模分量被添加到AC分量,提供二进制输出信号。 输入信号的共模电压可以大于(或更小)输出信号的共模电压。 在该方法的一个实施例中,执行占空比补偿(DCC)。 DCC将占空比驱动到所需的值。
    • 68. 发明申请
    • Duty Cycle Correction Circuit Whose Operation is Largely Independent of Operating Voltage and Process
    • 占空比校正电路,其操作与工作电压和工艺大不相同
    • US20080246524A1
    • 2008-10-09
    • US12140335
    • 2008-06-17
    • David W. BoerstlerEskinder HailuJieming Qi
    • David W. BoerstlerEskinder HailuJieming Qi
    • H03K3/017
    • H03K5/1565
    • A Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal.
    • 提供了一种占空比校正(DCC)电路,其中已知DCC电路拓扑中的成对的场效应晶体管(FET)被连接到DCC电路的开关的线性电阻器代替,使得当开关断开时,输入信号被路由 通过线性电阻。 线性电阻器比FET更容忍工艺,电压和温度(PVT)波动,因此,所得到的DCC电路与使用FET的已知DCC电路拓扑结构相比,具有PVT波动的DCC校正范围相对较小的变化。 线性电阻器可以与开关并联设置并且与具有相对较大电阻值的一对FET串联。 线性电阻器提供上拉或下拉输入信号的脉冲宽度的电阻,以便对输入信号的占空比提供校正。
    • 69. 发明授权
    • Method and apparatus for correcting the duty cycle of a digital signal
    • 用于校正数字信号占空比的方法和装置
    • US07330061B2
    • 2008-02-12
    • US11381050
    • 2006-05-01
    • David William BoerstlerEskinder HailuJieming Qi
    • David William BoerstlerEskinder HailuJieming Qi
    • H03K5/04
    • H03K5/1565
    • The disclosed methodology and apparatus measure and correct the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds, thus providing a measured duty cycle. The apparatus generates an error signal when the measured duty cycle varies from a predetermined duty cycle. The apparatus includes a variable duty cycle clock generator that alters the duty cycle of the test clock signal to reduce the error.
    • 所公开的方法和装置测量并校正时钟电路提供给占空比测量(DCM)电路的参考时钟信号的占空比。 在一个实施例中,DCM电路包括由电荷泵驱动的电容器。 参考时钟信号驱动电荷泵。 时钟电路在多个已知的占空比值之间改变参考时钟信号的占空比。 DCM电路将对应于每个已知占空比值的合成电容电压值存储在数据存储器中。 DCM电路通过电荷泵向电容器施加具有未知占空比的测试时钟信号,从而将电容器充电到对应于测试时钟信号占空比的新电压值。 控制软件访问数据存储器以确定测试时钟信号对应的占空比,从而提供测量的占空比。 当测量的占空比从预定的占空比变化时,该装置产生误差信号。 该装置包括可变占空比时钟发生器,其改变测试时钟信号的占空比以减少误差。
    • 70. 发明授权
    • Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance
    • 用于自动自校准占空比电路以实现最大芯片性能的装置和方法
    • US07322001B2
    • 2008-01-22
    • US11242677
    • 2005-10-04
    • David W. BoerstlerEskinder HailuJieming Qi
    • David W. BoerstlerEskinder HailuJieming Qi
    • G01R31/28H03K3/017
    • H03K5/1565G01R31/31727G01R31/3187
    • An apparatus and method for automatically calibrating a duty cycle circuit for maximum performance. A chip level built-in circuit automatically calibrates the duty cycle correction (DCC) circuit setting for each chip. The chip level built-in circuit includes a clock generation macro unit, a simple duty cycle correction (DCC) circuit, an array slice and built-in self test unit, and a DCC circuit controller. A built-in self-test provides results, i.e. pass or fail, of an array to the DCC circuit controller. If the result of the built-in self test is a pass, then the current DCC circuit controller's DCC control bit setting is set as the setting for the chip. If the result from the built-in self test is a fail, the DCC circuit controller's DCC control bits setting is incremented to a next setting and the self-test is performed again.
    • 一种用于自动校准占空比电路以实现最大性能的装置和方法。 芯片级内置电路自动校准每个芯片的占空比校正(DCC)电路设置。 芯片级内置电路包括时钟生成宏单元,简单占空比校正(DCC)电路,阵列片和内置自检单元以及DCC电路控制器。 内置的自检向DCC电路控制器提供阵列的结果,即通过或失败。 如果内置自检的结果是通过,则将当前DCC电路控制器的DCC控制位设置设置为芯片的设置。 如果内置自检的结果为失败,DCC电路控制器的DCC控制位设置将增加到下一个设置,并再次执行自检。