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61. 发明授权

US06526326B2 Fraction defective estimating method and system for estimating an assembly fraction defective of an article 有权
$Fraction defective estimating method and system for estimating an assembly fraction defective of an article$
公开(公告)号：US06526326B2
公开(公告)日：2003-02-25
申请号：US09927374
申请日：2001-08-13
申请人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
发明人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
IPC分类号： G06F1900
CPC分类号： G06Q10/06
摘要： A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.

62. 发明授权

US06411791B1 Developing apparatus including a developer charging member shaft and a holding member including a shaft guide groove 有权
公开(公告)号：US06411791B1
公开(公告)日：2002-06-25
申请号：US09758117
申请日：2001-01-12
申请人： Susumu Nittani , Jun Miyamoto , Tatsuya Suzuki
发明人： Susumu Nittani , Jun Miyamoto , Tatsuya Suzuki
IPC分类号： G03G1508
摘要： A developing apparatus includes a developing frame having an opening portion a developer carrying member provided in the opening portion and is adapted to carry developer a developer charging member contacted with the developer carrying member and is adapted to charge the developer carried by the developer carrying member. A voltage is applied to the developer charging member. A holding member, provided at a longitudinal end portion of the developing frame, is adapted to hold the developer carrying member and the developer charging member.

63. 发明授权

US06401000B1 Fraction defective estimating method and system for estimating an assembly fraction defective of an article 有权
$Fraction defective estimating method and system for estimating an assembly fraction defective of an article$
标题翻译：用于估计制品的组装部分缺陷的分数缺陷估计方法和系统
公开(公告)号：US06401000B1
公开(公告)日：2002-06-04
申请号：US09566481
申请日：2000-05-08
申请人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
发明人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
IPC分类号： G06F1900
CPC分类号： G06Q10/06
摘要： A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
摘要翻译：用于估计制造前的阶段中的物品的装配相关分数不良系数的方法和系统，例如，在设计阶段。作为数据输入组装操作，要组装的部件的属性/条件以及对组装工作中出现故障可能性具有重大影响的组装车间的条件。基于所输入的数据，通过执行组装相关分数缺陷值估计程序，以高精度算术地确定装配相关分数有缺陷的估计值。

64. 外观设计

USD456036S1 Digital camera 失效
公开(公告)号：USD456036S1
公开(公告)日：2002-04-23
申请号：US29146517
申请日：2001-08-08
申请人： Tatsuya Suzuki , Michio Imada
设计人： Tatsuya Suzuki , Michio Imada

65. 发明授权

US06324349B2 Camera having a sheath which is incorporated into the camera body without being distorted 有权
标题翻译：相机具有并入相机主体而不会变形的护套
公开(公告)号：US06324349B2
公开(公告)日：2001-11-27
申请号：US09360259
申请日：1999-07-26
申请人： Toshifumi Nakano , Shinya Takahashi , Tatsuya Suzuki
发明人： Toshifumi Nakano , Shinya Takahashi , Tatsuya Suzuki
IPC分类号： G03B1702
CPC分类号： G03B17/02
摘要： A camera comprising a camera sheath composed of a front cover unit and a rear cover unit, a camera body supported in the camera sheath, and positioning mechanism for positioning the camera body with respect to the camera sheath without fixing them. The positioning mechanism is composed of a pair of protrusions protruding from the front cover unit and a pair of hole portions formed in a reinforcing plate unit of the camera body and capable of being fitted individually on the protrusions. A gap of about 1 mm or less is formed in the whole area between the camera body and the camera sheath except fitting portions including the positioning mechanism.
摘要翻译：一种照相机，包括由前盖单元和后盖单元组成的相机外壳，支撑在相机外壳中的相机主体以及用于相机相对于相机外壳定位而不固定的定位机构。定位机构由从前盖单元突出的一对突起和形成在相机主体的加强板单元中的一对孔部分组成，并且能够单独地装配在突起上。除了包括定位机构的配合部分之外，在照相机主体和照相机外壳之间的整个区域中形成约1mm以下的间隙。

66. 外观设计

USD449633S1 Lens barrier for a camera 失效
公开(公告)号：USD449633S1
公开(公告)日：2001-10-23
申请号：US29134152
申请日：2000-12-14
申请人： Tatsuya Suzuki , Hiroshi Iue
设计人： Tatsuya Suzuki , Hiroshi Iue

67. 发明授权

US06301093B1 Electrochemical capacitor 失效
标题翻译：电化学电容器
公开(公告)号：US06301093B1
公开(公告)日：2001-10-09
申请号：US09478521
申请日：2000-01-06
申请人： Minoru Noguchi , Tatsuya Suzuki , Yoshio Yamamoto , Kenji Matsumoto , Takashi Higono
发明人： Minoru Noguchi , Tatsuya Suzuki , Yoshio Yamamoto , Kenji Matsumoto , Takashi Higono
IPC分类号： H01G902
CPC分类号： H01G9/155 , H01G11/06 , H01G11/34 , Y02E60/13
摘要： An electrochemical capacitor has a pair of positive and negative electrode elements each having a solid electrode disposed on a surface of a current collector. The positive and negative electrode elements are disposed in confronting relation to each other with a separator interposed therebetween. The positive and negative electrode elements, together with an electrolytic solution, are housed in the casing. The solid electrode of the negative electrode element is made of a lithium vanadium oxide and an electrically conductive filler, and the solid electrode of the positive electrode element is made of activated carbon.
摘要翻译：电化学电容器具有一对正极和负极元件，每个正极和负极元件均具有设置在集电器表面上的固体电极。正极和负极元件以彼此面对的关系设置在隔板之间。正极和负极元件以及电解溶液容纳在壳体中。负极元件的固体电极由锂钒氧化物和导电性填料构成，正极元件的固体电极由活性炭构成。

68. 发明授权

US06226617B1 Product disposal system 失效
标题翻译：产品处理系统
公开(公告)号：US06226617B1
公开(公告)日：2001-05-01
申请号：US09091192
申请日：1998-06-10
申请人： Tatsuya Suzuki , Toshijiro Ohashi , Yuzo Hiroshige , Yuji Ochiai , Takashi Kitamura , Takahiro Tachi , Masakatsu Hayashi
发明人： Tatsuya Suzuki , Toshijiro Ohashi , Yuzo Hiroshige , Yuji Ochiai , Takashi Kitamura , Takahiro Tachi , Masakatsu Hayashi
IPC分类号： G06F1760
CPC分类号： G06Q10/06 , B09B5/00 , G06Q10/06312 , Y10S707/99945 , Y10S707/99948
摘要： A treatment processing system for determining proper and appropriate treatment methods and procedures in accordance with states of discarded articles and outputting the determined procedures. Treatment methods are decided which are desirable for manufactured articles for carrying out corresponding treatments of the manufactured articles. The treatment processing system includes a unit for reading out information affixed to the discarded articles, a unit for storing databases for required information, a treatment procedure decision unit, a treatment procedure altering unit, and a detector for detecting whether or not treatment is being executed in conformance with the relevant treatment procedure.
摘要翻译：一种处理处理系统，用于根据废弃物的状态确定适当和适当的处理方法和程序，并输出确定的程序。决定对制造物品进行制造品的相应处理的处理方法。处理处理系统包括读出附着在废弃物品上的信息的单元，存储所需信息的数据库的单元，处理程序决定单元，处理程序变更单元以及检测是否正在执行处理的检测器符合相关治疗手续。

69. 发明授权

US6107197A Method of removing a carbon-contaminated layer from a silicon substrate surface for subsequent selective silicon epitaxial growth thereon and apparatus for selective silicon epitaxial growth 失效
标题翻译：从硅衬底表面去除碳污染层以用于其后的选择性硅外延生长的方法以及用于选择性硅外延生长的设备的方法
公开(公告)号：US6107197A
公开(公告)日：2000-08-22
申请号：US781821
申请日：1997-01-10
申请人： Tatsuya Suzuki
发明人： Tatsuya Suzuki
IPC分类号： C30B25/02 , C30B29/06 , H01L21/20 , H01L21/205 , H01L21/285 , H01L21/302 , H01L21/304 , H01L21/306 , C30B25/04
CPC分类号： H01L21/02046 , H01L21/02381 , H01L21/02532 , H01L21/0262 , H01L21/02658 , H01L21/28525 , Y10S438/906
摘要： A method of removing a carbon-contaminated layer from a silicon substrate surface before a silicon epitaxial growth on the silicon substrate surface. A carbon-contaminated layer on the silicon substrate is exposed to a chlorine radical to cause a chemical reaction of the chlorine radical with carbon atoms of the carbon-contaminated layer to generate chlorine carbide to form chlorine carbide for removal of the carbon-contaminated layer from the silicon substrate surface, wherein the chlorine radical has been generated by passing a chlorine gas through a heating filament so that the chlorine radical is generated at a much higher generation efficiency than when the chlorine radical were generated by using a deep ultraviolet ray. This means that the use of the filament for generating the chlorine radical at the higher generation efficiency results in a larger amount of the chlorine radical to be irradiated onto the carbon-contaminated layer and then reacted with carbon atoms to generate chlorine carbide at a higher efficiency whereby carbon on the silicon substrate surface or the carbon-contaminated layer may be removed therefrom at a higher efficiency. The epitaxial growth of the silicon layer on the carbon-free or carbon pile-up free silicon substrate surface results in the epitaxial silicon layer having a high crystal quality or crystal perfection.
摘要翻译：在硅衬底表面上的硅外延生长之前从硅衬底表面去除碳污染层的方法。在硅衬底上的碳污染层暴露于氯自由基以引起氯自由基与碳污染层的碳原子的化学反应，以产生碳化碳以形成氯碳化物以从碳污染层中去除碳污染层硅衬底表面，其中通过使氯气通过加热丝而产生氯自由基，使得以比通过使用深紫外线产生氯自由基更高的发生效率产生氯自由基。这意味着在更高的发电效率下使用丝来产生氯自由基导致较大量的氯自由基被照射到碳污染的层上，然后与碳原子反应以产生更高效率的碳化碳由此可以以更高的效率从硅衬底表面或碳污染层上除去碳。在无碳或无碳堆积自由硅衬底表面上的硅层的外延生长导致具有高晶体质量或晶体完美性的外延硅层。

70. 发明授权

US06055651A Emulator and corresponding trace control method 失效
标题翻译：仿真器及相应的跟踪控制方法
公开(公告)号：US06055651A
公开(公告)日：2000-04-25
申请号：US763318
申请日：1996-12-10
申请人： Hiroyuki Sasaki , Yoshikazu Aoto , Shuya Fujita , Tatsuya Suzuki
发明人： Hiroyuki Sasaki , Yoshikazu Aoto , Shuya Fujita , Tatsuya Suzuki
IPC分类号： G06F11/28 , G06F11/00 , G06F11/22 , G06F11/34 , G06F11/36 , G06F11/30
CPC分类号： G06F11/3636 , G06F11/3466 , G06F11/348
摘要： A trace memory in the emulator is formed into a plurality of memory banks. Data to be traced is in principle stored sequentially in each memory bank. A trace condition setting circuit (trace registers) and a trace condition agreement detecting circuit (comparators) are provided to generate a valid/invalid flag FB indicating whether or not the data meet the set condition. This flag FB is stored along with the trace data in each memory bank.
摘要翻译：仿真器中的跟踪存储器形成为多个存储体。要跟踪的数据原则上按顺序存储在每个存储体中。提供跟踪条件设置电路（跟踪寄存器）和跟踪条件协议检测电路（比较器）以产生指示数据是否满足设置条件的有效/无效标志FB。该标志FB与跟踪数据一起存储在每个存储体中。

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