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    • 65. 发明授权
    • Method for foreseeing residual life of structural member making use of
X-ray
    • 利用X射线预测结构构件残余寿命的方法
    • US4404682A
    • 1983-09-13
    • US217083
    • 1980-12-16
    • Makoto HayashiTasuku Shimizu
    • Makoto HayashiTasuku Shimizu
    • G01N23/207G01L1/00G01N3/32G01N23/02G01N23/20
    • G01N23/20G01N23/02
    • Provided is a method for foreseeing the residual life of a structural member, making use of an X-ray, comprising: preparing a plurality of test pieces made of the same material and subjected to the same working and heat-treating conditions as the structural member to be examined of which the fatigue strength is in question; executing fatigue tests with said test pieces till failure under a plurality of different stress conditions; obtaining for each stress the relationship between the residual life of said test piece and the halfvalue width ratio of X-ray diffraction profile; determining, from the above-mentioned relationships, a first relationship region between the halfvalue width ratio and the residual life that is independent of the level of the stress; measuring the halfvalue width ratio of said structural member; and determining the residual life of said structural member from the measured halfvalue width ratio in accordance with said first relationship region.
    • 提供一种利用X射线预测结构构件的残余寿命的方法,其包括:制备由相同材料制成的多个试件并经受与结构构件相同的加工和热处理条件 要检查哪个疲劳强度是有问题的; 执行所述试件的疲劳试验,直到在多种不同的应力条件下发生破坏; 针对每个应力获得所述试件的剩余寿命与X射线衍射曲线的半值宽比之间的关系; 从上述关系确定半值宽度比和残余寿命之间的第一关系区域,其与应力水平无关; 测量所述结构构件的半值宽度比; 以及根据所述第一关系区域根据所测量的半值宽度比确定所述结构构件的剩余寿命。