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    • 52. 发明授权
    • Mass spectrometer with superimposed electric and magnetic fields
    • 具有叠加电场和磁场的质谱仪
    • US4054796A
    • 1977-10-18
    • US698316
    • 1976-06-22
    • Motohiro Naito
    • Motohiro Naito
    • H01J49/28G01N27/62H01J49/32H01J39/34
    • H01J49/32
    • A mass spectrometer comprising superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam produced by an ion source is located on an equipotential surface in the electric field. The ion beam is accelerated by a means for producing a constant accelerating voltage. The electric field is swept by a sweep means. The change of the focal length of the superimposed field when the electric field is swept by said sweep means is compensated by a compensating means, thereby providing a mass spectrometer capable of measuring ions having a wide range of mass to charge ratios and capable of scanning at high speed and having a high accuracy mass marker.
    • 质谱仪包括基本成直角排列的叠加的电场和磁场。 由离子源产生的离子束的中心轨道位于电场中的等势面上。 通过用于产生恒定加速电压的装置来加速离子束。 电场被扫掠装置扫过。 当通过所述扫描装置扫描电场时,叠加场的焦距的变化由补偿装置补偿,从而提供能够测量具有宽范围的质荷比并可以扫描的离子的质谱仪 高速度并具有高精度的质量标记。
    • 54. 发明授权
    • Method of electrostatic filtration
    • 静电过滤方法
    • US3916188A
    • 1975-10-28
    • US43469574
    • 1974-01-18
    • ANVAR
    • DEVIENNE FERNAND MARCEL
    • H01J49/10G01N27/62H01J49/14H01J49/28H01J39/34B01D59/44
    • H01J49/286H01J49/14
    • Electrostatic filtration of secondary ions of mass m in a given mass ratio with a primary ion of mass M which has formed the secondary ions by fission is carried out by a method which consists in forming a singly-charged primary ion of the substance having a molecular mass M and extracting the ion at a voltage V1 with respect to ground, in causing the primary ion to cross a potential barrier V2, in producing the dissociation of said ion into at least two fragments of secondary ions, in extracting the fragment ion of mass m at a voltage V2, in carrying out a filtration in an electrostatic analyzer through which only the ions of energy eV'''' are permitted to pass, in detecting the ions which have thus been filtered and the mass m of which is such that

      D R A W I N G
    • 通过裂变形成二次离子的质量为M的质量m的质量m的二次离子的静电过滤通过一种方法进行,该方法包括形成具有分子的物质的单一带电的一次离子 质量M并且以相对于地面的电压V1提取离子,在使主离子穿过势垒V2时,在产生质量的碎片离子中产生离子到至少两个次级离子的片段中的解离 在电压V2下进行过滤,在静电分析仪中进行过滤,在静电分析仪中仅允许能量eV“的离子通过,以检测已经被过滤的离子,其质量m使得M V1 - V2 =。 m V“ - V2
    • 57. 发明授权
    • Ion accelerator and ion species selector
    • 离子加速器和离子物种选择器
    • US3786359A
    • 1974-01-15
    • US3786359D
    • 1969-03-28
    • ALPHA IND INC
    • KING W
    • G21K1/14H01J37/317H01J49/28H01J23/10H01J37/26
    • H01J37/3171G21K1/14H01J49/284
    • The apparatus disclosed herein provides high energy positive ions, suitable for semiconductor doping, by projecting positive ions through an electron stripping gas at relatively low energy thereby to obtain positive ions which are multiply ionized or charged. Those ions which are raised to a preselected ionization level or state are segregated, and then accelerated by a relatively high accelerating voltage to achieve an energy suitable for ion implantation in a semiconductor matrix. Since the ions subjected to the relatively high accelerating voltage are multiply ionized, the energy imparted thereto, measured in electron volts, is substantially equal to an integer multiple of the accelerating voltage.
    • 本文公开的装置通过以相对低的能量将正离子投射通过电子剥离气体来提供适合于半导体掺杂的高能正离子,从而获得多重电离或带电的正离子。 升高到预选电离水平或状态的那些离子被分离,然后通过相对高的加速电压加速,以获得适合于半导体基质中的离子注入的能量。 由于经受相对高的加速电压的离子被多次电离,所以以电子伏特测量的赋予的能量基本上等于加速电压的整数倍。