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    • 54. 发明授权
    • Combination coating thickness gauge using a magnetic flux density sensor
and an eddy current search coil
    • 使用磁通密度传感器和涡流搜索线圈的组合涂层厚度计
    • US5343146A
    • 1994-08-30
    • US956280
    • 1992-10-05
    • Frank J. KochLeon C. VandervalkDavid J. Beamish
    • Frank J. KochLeon C. VandervalkDavid J. Beamish
    • G01B7/00G01B7/06G01D3/028G01D5/20G01K13/00G01N27/72G01R33/12G01B7/10
    • G01B7/105
    • A gauge probe for a handheld combination coating thickness gauge allows the combination coating thickness gauge to measure both nonferrous coatings on ferrous substrate and nonconductive coatings on conductive nonferrous substrate. The gauge probe enables the combination coating thickness gauge to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. The technique used to measure coatings on a ferrous substrate utilizes a permanent magnet to provide a constant magnetic flux and a Hall sensor and thermistor arranged to measure the temperature-compensated magnetic flux density at one of the poles of the permanent magnet. The flux density at the magnet pole can be related to a nonferrous coating thickness on a ferrous substrate. The technique used to measure nonconductive coatings on a conductive nonferrous substrate utilizes eddy current effects. A coil near the gauge probe tip is excited by an alternating current oscillating between about 6 MHz and about 12 MHz. The coil sets up eddy currents on the surface of the conducting substrate. The resulting eddy currents set up an opposing magnetic field which in turn have an effect on the excited coil. The eddy current effects on the coil are quantified, and the degree of the eddy current effects on the coil are related to the nonconductive coating thickness on a conductive substrate. The gauge probe detects the substrate type and automatically determines the coating thickness on the detected substrate.
    • 用于手持组合涂层厚度计的测量探头允许组合涂层厚度计测量有色金属基底上的有色涂层和导电有色基底上的非导电涂层。 量规探头使得组合涂层厚度计可以通过单个探针自动确定基底特性,并对该基底上的涂层厚度进行测量。 用于测量含铁基底上的涂层的技术利用永久磁铁提供恒定的磁通量,霍尔传感器和热敏电阻被布置成测量永久磁体的一个磁极处的温度补偿磁通密度。 磁极处的磁通密度可以与铁基底上的有色涂层厚度有关。 用于测量导电有色基底上非导电涂层的技术采用涡流效应。 靠近测量头探头的线圈由约6MHz至约12MHz之间的交流振荡激发。 线圈在导电基板的表面上设置涡流。 所产生的涡流设置相反的磁场,这又对激励的线圈产生影响。 量化线圈上的涡流效应,并且涡流对线圈的影响程度与导电衬底上的非导电涂层厚度有关。 量规探头检测基板类型,并自动确定检测到的基板上的涂层厚度。
    • 58. 发明授权
    • Method of and apparatus for layer thickness measurement
    • 层厚度测量方法和装置
    • US4695797A
    • 1987-09-22
    • US699667
    • 1985-02-08
    • Volker K. DeutschWerner F. Roddeck
    • Volker K. DeutschWerner F. Roddeck
    • G01B7/06G01B7/10
    • G01B7/105
    • A method of and apparatus for measuring the layer of coating thickness of non-magnetic substances on a ferromagnetic parent material by the magneto-inductive method or of non-metallic substances on a conductive parent material by the eddy current method. This is done with the use of a probe whose coil inductance is evaluated as a criterion for the thickness of the layer to be measured. An adjustment to the geometry and the magnetic properties of the specimen are made before the first measurement. In the adjustment, at least one non-magnetic or non-conductive foil is disposed or are consecutively disposed between the probe and the surface of the coated specimen and the measured data obtained then and in the subsequent measurements are fed to a microcomputer. In the semiconductor store of the micro-computer, the non-linear relationship between the coil inductance of at least one probe and the distance between the probe and the parent material is being or has been stored in the form of at least one values table and in which the layer thickness values of the foils are being or have been stored. The microcomputer calculates the thickness values of the layer material from the measurement data fed to it and from the stored data.
    • 通过涡电流法通过磁感应法或非金属物质在导电母材上测量铁磁母体上的非磁性物质的涂层厚度的方法和装置。 这是通过使用其线圈电感被评估为要测量的层的厚度的标准的探针来完成的。 在第一次测量之前对样品的几何形状和磁性进行调整。 在调整中,至少一个非磁性或非导电箔被布置或连续地设置在探测器和被涂覆样本的表面之间,然后将获得的测量数据馈送到微型计算机。 在微型计算机的半导体存储器中,至少一个探针的线圈电感与探针与母材之间的距离之间的非线性关系正在或已经以至少一个值表的形式存储,并且 其中箔的层厚度正在或已被存储。 微型计算机从提供给它的测量数据和从存储的数据中计算层材料的厚度值。
    • 60. 发明授权
    • Electro-magnetic thickness measuring probe
    • 电磁厚度测量探头
    • US4618825A
    • 1986-10-21
    • US659654
    • 1984-10-11
    • Helmut Fischer
    • Helmut Fischer
    • G01B7/06G01R33/12G01B7/10
    • G01B7/105
    • An electro-magnetic thickness measuring probe has a pot core which has a central bore, a pot chamber coaxial to the central bore accommodating a winding, and a pot rim. A pole-piece has one end fixed into the central bore and a free front-face with a coaxial recess machined therein such that an outer shell remains around the recess. A hard-metal pin is seated in the recess and has a front-face forming a crowned contact surface which stands a little proud of the pot rim. A coaxial annular disk made of highly permeable magnetic material has an outer edge in contact with the pot rim, a non-magnetic slot, and an intrados-radius surface having a diameter greater than the diameter of the pole-piece but significantly smaller than the diameter of the pot chamber. The intrados-radius surface lies close to the front-face of the pole-piece, whereby the magnetic resistance between the intrados-radius surface and the outer shell is significantly greater than the magnetic resistance between the intrados-radius surface and the free front-face when the measuring probe is set down on a surface.
    • 电磁厚度测量探针具有锅芯,其具有中心孔,与容纳绕组的中心孔同轴的罐室和罐边缘。 极片具有固定到中心孔中的一端和在其中加工有同轴凹槽的自由前表面,使得外壳保持在凹部周围。 硬金属销位于凹槽中,并具有形成凸起的接触表面的前表面,凸起接触表面稍微骄傲于盆缘。 由高度可渗透的磁性材料制成的同轴环形圆盘具有与罐边缘接触的外边缘,非磁性狭槽和直径大于极片直径的凹凸半径表面,但显着小于 罐室直径。 内半径表面靠近极片的前表面,由此内半径表面和外壳之间的磁阻显着大于内半径表面和自由前端之间的磁阻, 当测量探针在表面上放下时,面对面。