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    • 52. 发明授权
    • Multilayer wiring technique for a semiconductor device
    • 半导体器件的多层布线技术
    • US4866009A
    • 1989-09-12
    • US306211
    • 1989-02-03
    • Tetsuo Matsuda
    • Tetsuo Matsuda
    • H01L21/3205H01L21/768H01L23/522
    • H01L21/76879Y10S148/05Y10S148/06
    • A method of manufacturing a semiconductor device includes the steps of (a) forming a first conductive pattern on a semiconductor substrate, (b) forming a first interlayer insulating film, covering the first conductive pattern, (c) forming a second conductive pattern, composed of a refractory metal, on the first interlayer insulating film, (d) forming a contact hole reaching the first conductive pattern through the second conductive pattern and the first interlayer insulating film at a predetermined position, (e) performing an annealing step before or after formation of the contact hole in step (d), and (f) covering in the contact hole with a metal film, after annealing step (e), to connect the second conductive pattern to the first conductive pattern. In this method, annealing step--for example, gettering--is performed before the wiring layer of the refractory metal is placed in contact with the semiconductor layer. For this reason, even if the other semiconductor layers are made of silicon, silicification of the refractory metal can be prevented.
    • 一种制造半导体器件的方法包括以下步骤:(a)在半导体衬底上形成第一导电图案,(b)形成第一层间绝缘膜,覆盖第一导电图案,(c)形成第二导电图案, 在第一层间绝缘膜上,(d)在预定位置形成通过第二导电图案到达第一导电图案的接触孔和第一层间绝缘膜,(e)在前后进行退火步骤 在步骤(d)中形成接触孔,和(f)在退火步骤(e)之后用金属膜覆盖接触孔,以将第二导电图案连接到第一导电图案。 在该方法中,在难熔金属的布线层与半导体层接触之前进行退火步骤,例如吸杂。 因此,即使其他半导体层由硅制成,也可以防止难熔金属的硅化。