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    • 53. 发明申请
    • MAINTENANCE OPERATION INSTANCE COLLECTION APPARATUS, MAINTENANCE OPERATION INSTANCE COLLECTION METHOD, AND MAINTENANCE OPERATION INSTANCE COLLECTION PROGRAM
    • 维护操作实例收集装置,维护操作实例收集方法和维护操作实例收集程序
    • US20130091134A1
    • 2013-04-11
    • US13702771
    • 2010-06-08
    • Hiroki UchiyamaShinya YudaKozo Nakamura
    • Hiroki UchiyamaShinya YudaKozo Nakamura
    • G06F17/30
    • G06F17/30424G06Q10/20G06Q30/016
    • A maintenance operation instance collection apparatus includes: a storage unit that includes a maintenance operation instance database in which operation information obtained from a device via a sensor and maintenance information on a measure to deal with the operation information corresponding thereto are stored in association with each other; and a control unit that receives an input of new operation information, receives an input of new maintenance information, searches the maintenance operation instance database using the newly-received maintenance information as a search key, acquires searched operation information, compares the newly-received operation information to the acquired operation information, determines whether or not the newly-received operation information is close to the acquired operation information in such a degree of satisfying a prescribed criterion, and, if the newly-received operation information is not determined to be close to the acquired operation information, prompts a re-input of the newly-received maintenance information.
    • 维护操作实例收集装置包括:存储单元,其包括维护操作实例数据库,其中通过传感器从设备获得的操作信息和关于对应于其的操作信息的测量的维护信息彼此关联地存储 ; 以及控制单元,接收新的操作信息的输入,接收新的维护信息的输入,使用新接收的维护信息作为搜索关键字检索维护操作实例数据库,获取搜索的操作信息,比较新接收的操作 对所获取的操作信息的信息,以满足规定标准的程度确定新接收的操作信息是否接近所获取的操作信息,并且如果新接收的操作信息未被确定为接近于 所获取的操作信息提示重新输入新接收的维护信息。
    • 55. 发明申请
    • MONITORING AND DIAGNOSING DEVICE FOR WORKING MACHINE
    • 工作机械监控与诊断装置
    • US20120317444A1
    • 2012-12-13
    • US13575668
    • 2010-01-28
    • Hideaki SuzukiYoshinori FurunoKozo NakamuraShinya YudaHiroki Uchiyama
    • Hideaki SuzukiYoshinori FurunoKozo NakamuraShinya YudaHiroki Uchiyama
    • G06F11/30
    • E02F9/2025B66C13/16E02F9/264E02F9/267G05B23/0278G06Q10/06
    • Monitoring and diagnosing device including: a classification information storage section; frequency information storage section; a first data classifier section reading out reference classification information from the classification information storage section, comparing operational data, detected by a plurality of sensors and inputted in time sequence, with the reference classification information to classify the operational data, and then generating operational data classification information; a frequency comparator section compiling the operational data classification information, generating operational data frequency information by adding, to the operational data classification information, appearance frequency information for each classification of operational data, reading out reference frequency information from the frequency information storage section, and then generating operational data frequency comparison information by comparing operational data frequency information with the reference frequency information; and an abnormality diagnosing section performing an abnormality diagnosis upon the working machine by use of the operational data classification information and operational data frequency comparison information.
    • 监测和诊断装置包括:分类信息存储部分; 频率信息存储部分; 从分类信息存储部分读取参考分类信息的第一数据分类器部分,将由多个传感器检测并且按时间顺序输入的操作数据与参考分类信息进行比较,以分类操作数据,然后生成操作数据分类 信息; 频率比较器部分,编译操作数据分类信息,通过向操作数据分类信息添加用于操作数据的每个分类的出现频率信息,从频率信息存储部分读出参考频率信息,生成操作数据频率信息,然后 通过将操作数据频率信息与参考频率信息进行比较来产生操作数据频率比较信息; 以及异常诊断部,其通过使用所述操作数据分类信息和操作数据频率比较信息对所述作业机进行异常诊断。
    • 56. 发明申请
    • FAILURE CAUSE DIAGNOSIS SYSTEM AND METHOD
    • 故障原因诊断系统和方法
    • US20120310597A1
    • 2012-12-06
    • US13578034
    • 2010-02-26
    • Hiroki UchiyamaShinya YudaHideaki SuzukiKozo Nakamura
    • Hiroki UchiyamaShinya YudaHideaki SuzukiKozo Nakamura
    • G06F15/00
    • G05B23/0221G05B23/0278G05B2219/24019G05B2219/24042
    • Conditional base maintenance has been gaining widespread acceptance, with numerous sensors attached to equipment for constant monitoring of its operational state, the resulting sensor data being compared with those about the equipment in the normal state for a diagnosis to determine whether the equipment is currently operating normally, the result of the diagnosis being used to conduct maintenance. Conditional base maintenance can rapidly detect aging deterioration of the equipment, so that abnormal sates that were not detected before in time base maintenance can now be detected. However, although conventional diagnosis technology can distinguish between the normal state and anomaly, it has been difficult with such technology to identify causes including abnormal phenomena and parts. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.
    • 有条件的基地维护得到了广泛的接受,许多传感器连接到设备上,用于持续监控其运行状态,所得到的传感器数据与正常状态下的设备进行比较,以进行诊断,以确定设备是否正常运行 ,诊断结果用于进行维护。 有条件的基座维护可以快速检测设备的老化恶化,从而可以检测到在时基维护中未检测到的异常状态。 然而,虽然常规诊断技术可以区分正常状态和异常现象,但是通过这种技术难以识别出异常现象和部件的原因。 如果确定要诊断的目标设备偏离正常状态,则将每个参数与作为基准的正常状态的偏差程度计算为异常贡献率。 根据计算出的异常贡献率与过去收集的每个故障原因的异常贡献率,包括故障现象和故障部分之间的相似度估计故障原因。
    • 57. 发明申请
    • DIAGNOSIS SYSTEM AND DIAGNOSIS METHOD FOR CONSTRUCTION MACHINE
    • 建筑机械诊断系统及诊断方法
    • US20120209570A1
    • 2012-08-16
    • US13502896
    • 2009-10-19
    • Hiroki UchiyamaYoshinori FurunoHideaki SuzukiKozo Nakamura
    • Hiroki UchiyamaYoshinori FurunoHideaki SuzukiKozo Nakamura
    • G06F15/00
    • E02F9/2025E02F9/267G06Q10/20
    • Provided is a construction machine diagnosing system and method in which even a user who has little knowledge of any procedures and techniques for diagnosing construction machines can speedily diagnose a desired machine in a manner appropriate for particular data characteristics of the machine.A diagnosis device 10 acquires diagnostic data from a diagnostic data storage device 30, extracts data characteristics from the information contained in the diagnostic data, acquires from a diagnostic knowledge storage device 20 any diagnosing techniques considered to be effective for the data characteristics, and presents to a user the diagnosing techniques along with respective degrees of effectiveness. The user uses the presented degrees of effectiveness to select a desired diagnosing technique and conduct a diagnosis. In addition, in order to make effective use of the diagnostic knowledge stored within the diagnostic knowledge storage device 20, a diagnostic knowledge generating section 107 classifies common data characteristics by elements of diagnosing techniques and stores the classified data characteristics and the elements of the diagnosing techniques, as new diagnostic knowledge.
    • 提供了一种施工机械诊断系统和方法,其中即使对于用于诊断施工机械的任何程序和技术知之甚少的用户也可以以适合于机器的特定数据特性的方式快速地诊断期望的机器。 诊断装置10从诊断数据存储装置30获取诊断数据,从诊断数据中包含的信息中提取数据特征,从诊断知识存储装置20获取被认为对数据特性有效的诊断技术, 用户诊断技术以及相应的有效性程度。 用户使用呈现的有效性来选择所需的诊断技术并进行诊断。 此外,为了有效利用存储在诊断知识存储装置20内的诊断知识,诊断知识生成部107通过诊断技术的要素对公共数据特征进行分类,并存储分类数据特征和诊断技术的要素 ,作为新的诊断知识。
    • 59. 发明申请
    • SILICON WAFER HEAT TREATMENT METHOD
    • 硅波热处理方法
    • US20100075267A1
    • 2010-03-25
    • US12443365
    • 2007-09-28
    • Shinya SadoharaKozo NakamuraShiro Yoshino
    • Shinya SadoharaKozo NakamuraShiro Yoshino
    • C30B15/14
    • H01L21/324H01L21/3225H01L22/12
    • A silicon wafer preferable to a semiconductor device is produced by determining a heat treatment condition hardly causing slip dislocations and heat-treating the silicon wafer under the condition. The resistance is calculated by using a calculation formula used for predicting the slip resistance of the wafer from the density, size, and residual solid-solution oxygen concentration of the oxygen precipitation in the silicon wafer, the state of oxygen precipitation such that heat treatment not causing any slip dislocation can be carried out is designed, and thus a silicon wafer heat treatment method under the heat treatment condition not causing any slip dislocation is determined. A silicon wafer heat-treated under such a condition can be provided.
    • 通过确定在该条件下几乎不引起滑移位错和热处理硅晶片的热处理条件来制造优于半导体器件的硅晶片。 通过使用用于从硅晶片中的氧沉淀的密度,尺寸和残留固溶度氧浓度来预测晶片的滑动阻力的计算公式,氧沉淀的状态使得不进行热处理来计算电阻 导致任何滑移位错都可以进行设计,因此硅片热处理方法在热处理条件下不会产生滑脱错位。 可以提供在这种条件下热处理的硅晶片。