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    • 52. 发明授权
    • Antenna structures having slot-based parasitic elements
    • 天线结构具有基于槽的寄生元件
    • US09203139B2
    • 2015-12-01
    • US13464789
    • 2012-05-04
    • Jiang ZhuJerzy GutermanMattia PascoliniHongfei Hu
    • Jiang ZhuJerzy GutermanMattia PascoliniHongfei Hu
    • H01Q1/24H01Q1/38H01Q1/52H01Q9/42H01Q13/10H01Q21/28
    • H01Q1/243H01Q1/521H01Q9/42H01Q13/10H01Q21/28
    • Electronic devices may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may include antenna resonating elements and antenna ground plane structures. An electronic device may have antennas formed from the antenna resonating elements and an antenna ground plane. The antenna ground plane may have slot structures. The slot structures may be configured to form a slot-based parasitic antenna element to minimize coupling between the antennas in a device. The slot-based parasitic antenna element may be located between the antennas in a device. The slots structures from which a parasitic antenna element is formed may include open slots and closed slots. Slots may have one or more arms and one or more bends. Slots may be formed in internal housing members, traces on dielectric carriers, and other conductive structures.
    • 电子设备可以包括射频收发器电路和天线结构。 天线结构可以包括天线谐振元件和天线接地平面结构。 电子设备可以具有由天线谐振元件和天线接地层形成的天线。 天线接地平面可以具有槽结构。 槽结构可以被配置为形成基于槽的寄生天线元件,以最小化设备中的天线之间的耦合。 基于时隙的寄生天线元件可以位于设备中的天线之间。 形成寄生天线元件的槽结构可以包括开放槽和闭合槽。 插槽可以具有一个或多个臂和一个或多个弯曲。 插槽可以形成在内部壳体构件中,电介质载体上的迹线以及其它导电结构。
    • 55. 发明申请
    • TEST SYSTEM WITH CONTACT TEST PROBES
    • 具有接触测试探针的测试系统
    • US20130015870A1
    • 2013-01-17
    • US13183393
    • 2011-07-14
    • Joshua G. NickelMattia PascoliniAdil Syed
    • Joshua G. NickelMattia PascoliniAdil Syed
    • G01R31/20
    • G01R1/06772G01R31/2822
    • Electronic device structures such as structures containing antennas, cables, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a test system to perform conducted testing. The test system may include a vector network analyzer or other test unit that generates radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using a contact test probe that has at least signal and ground pins. The test probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
    • 可以使用测试系统对包含天线,电缆,连接器,焊接,电子设备部件,导电壳体结构和其他结构的结构的电子设备结构进行故障测试,以执行进行的测试。 测试系统可以包括矢量网络分析器或其它测试单元,其在一个频率范围内产生射频测试信号。 射频测试信号可以使用至少具有信号和接地引脚的接触测试探头传输到被测电子设备结构。 测试探头可以接收相应的射频信号。 可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。
    • 56. 发明申请
    • ELECTRONIC DEVICE WITH PASSIVELY COMBINED ANTENNAS
    • 具有常规组合天线的电子设备
    • US20120302282A1
    • 2012-11-29
    • US13117050
    • 2011-05-26
    • Mattia Pascolini
    • Mattia Pascolini
    • H04W88/02H01P5/18H04B1/06H03H7/01
    • H03H7/38H01Q1/22H01Q1/243H01Q21/28
    • Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry coupled to multiple antennas though a passive coupler. When transmitting signals, the passive coupler can divide transmitted signals between each of the multiple antennas. When using the antennas to receive signals, the received signals can be combined using the passive coupler. The combined signals may be provided to a receiver in the transceiver circuitry. A tap may be interposed in a path between the passive coupler and one of the antennas to monitor radio-frequency signal power. Phase-shift elements may be interposed in the paths between the antennas and the passive coupler to adjust the relative phase between signals associated with the first and second antennas.
    • 可以提供包含无线通信电路的电子设备。 无线通信电路可以包括通过无源耦合器耦合到多个天线的射频收发器电路。 当发射信号时,无源耦合器可以在多个天线中的每一个之间划分发射信号。 当使用天线接收信号时,接收到的信号可以使用无源耦合器进行组合。 组合的信号可以被提供给收发器电路中的接收器。 可以在无源耦合器和一个天线之间的路径中插入抽头以监视射频信号功率。 可以将相移元件置于天线和无源耦合器之间的路径中,以调整与第一和第二天线相关联的信号之间的相对相位。
    • 57. 发明授权
    • Methods for reducing path loss while testing wireless electronic devices with multiple antennas
    • 在测试具有多个天线的无线电子设备的同时降低路径损耗的方法
    • US09319908B2
    • 2016-04-19
    • US13272067
    • 2011-10-12
    • Joshua G. NickelMattia PascoliniJr-Yi Shen
    • Joshua G. NickelMattia PascoliniJr-Yi Shen
    • H04W24/06G01R29/10
    • H04W24/06G01R29/10
    • A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
    • 测试台可以包括测试主机,测试单元和测试机箱。 具有至少第一和第二天线的被测设备(DUT)可以在生产测试期间被放置在测试外壳中。 射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。 在测试第一天线的性能的第一时间段期间,DUT可以被定向在第一位置,使得第一天线和测试天线之间的路径损耗最小化。 在测试第二天线的性能的第二时间段期间,DUT可以定位在第二位置,使得第二天线和测试天线之间的路径损耗最小化。 如果收集的测试数据令人满意,DUT被标记为通过的DUT。
    • 58. 发明申请
    • Methods for Reducing Path Loss While Testing Wireless Electronic Devices with Multiple Antennas
    • 使用多个天线测试无线电子设备时减少路径损耗的方法
    • US20130093447A1
    • 2013-04-18
    • US13272067
    • 2011-10-12
    • Joshua G. NickelMattia PascoliniJr-Yi Shen
    • Joshua G. NickelMattia PascoliniJr-Yi Shen
    • G01R31/00
    • H04W24/06G01R29/10
    • A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
    • 测试台可以包括测试主机,测试单元和测试机箱。 具有至少第一和第二天线的被测设备(DUT)可以在生产测试期间被放置在测试外壳中。 射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。 在测试第一天线的性能的第一时间段期间,DUT可以被定向在第一位置,使得第一天线和测试天线之间的路径损耗最小化。 在测试第二天线的性能的第二时间段期间,DUT可以定位在第二位置,使得第二天线和测试天线之间的路径损耗最小化。 如果收集的测试数据令人满意,DUT被标记为通过的DUT。
    • 59. 发明申请
    • CUSTOMIZABLE ANTENNA FEED STRUCTURE
    • 可定制的天线进料结构
    • US20130050046A1
    • 2013-02-28
    • US13223102
    • 2011-08-31
    • Daniel W. JarvisMattia PascoliniJoshua G. Nickel
    • Daniel W. JarvisMattia PascoliniJoshua G. Nickel
    • H01Q1/50G01R31/28
    • H01Q9/0421H01Q1/243H01Q9/145Y10T29/49004
    • Custom antenna structures may be used to compensate for manufacturing variations in electronic device antennas. An antenna may have an antenna feed and conductive structures such as portions of a peripheral conductive electronic device housing member. The custom antenna structures compensate for manufacturing variations that could potentially lead to undesired variations in antenna performance. The custom antenna structures may make customized alterations to antenna feed structures or conductive paths within an antenna. An antenna may be formed from a conductive housing member that surrounds an electronic device. The custom antenna structures may be formed from a printed circuit board with a customizable trace. The customizable trace may have a contact pad portion on the printed circuit board. The customizable trace may be customized to connect the pad to a desired one of a plurality of contacts associated with the conductive housing member to form a customized antenna feed terminal.
    • 定制天线结构可用于补偿电子设备天线的制造变化。 天线可以具有天线馈电和导电结构,例如外围导电电子器件壳体部件的部分。 定制天线结构补偿可能导致天线性能不期望的变化的制造变化。 定制的天线结构可以对天线馈送结构或天线内的导电路径进行定制的改变。 天线可以由围绕电子设备的导电外壳构件形成。 定制天线结构可以由具有可定制轨迹的印刷电路板形成。 可定制的迹线可以在印刷电路板上具有接触焊盘部分。 可定制的迹线可以被定制以将焊盘连接到与导电外壳构件相关联的多个触点中期望的一个触点,以形成定制的天线馈电端子。
    • 60. 发明申请
    • ELECTRONIC DEVICE WITH MAGNETIC ANTENNA MOUNTING
    • 具有磁性天线安装的电子设备
    • US20130002517A1
    • 2013-01-03
    • US13175764
    • 2011-07-01
    • Mattia PascoliniJerzy GutermanJonathan HaylockJiang ZhuPeter Jeziorek
    • Mattia PascoliniJerzy GutermanJonathan HaylockJiang ZhuPeter Jeziorek
    • H01Q1/12
    • H01Q1/2258H01Q1/2266
    • An electronic device may have magnetically mounted antenna structures. The electronic device may have a dielectric member against which one or more antennas are mounted. The dielectric member may be a cover glass layer that covers a display in the electronic device, a dielectric antenna window, or other dielectric structure. Each antenna may have an antenna support structure. Conductive antenna structures for the antenna may be mounted to the antenna support structure. The antennas may be cavity-backed planar inverted-F antennas. Portions of each antenna support structure may be configured to receive magnets. The magnets may be attracted towards ferromagnetic structures mounted on the dielectric member. As the magnets are attracted towards the ferromagnetic structure, the antennas may be held in place against the dielectric member.
    • 电子设备可以具有磁性安装的天线结构。 电子设备可以具有安装一个或多个天线的电介质构件。 电介质构件可以是覆盖电子设备中的显示器,电介质天线窗口或其它电介质结构的覆盖玻璃层。 每个天线可以具有天线支撑结构。 用于天线的导电天线结构可以安装到天线支撑结构。 天线可以是腔背平面倒F天线。 每个天线支撑结构的部分可被配置为接收磁体。 可以将磁体吸引到安装在电介质构件上的铁磁结构。 当磁体被吸引到铁磁结构时,天线可以保持在抵靠电介质构件的位置。