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51. 发明授权

US08218857B2 Color-coded target, color code extracting device, and three-dimensional measuring system 有权
标题翻译：彩色编码目标，色码提取装置和三维测量系统
公开(公告)号：US08218857B2
公开(公告)日：2012-07-10
申请号：US12327998
申请日：2008-12-04
申请人： Takuya Moriyama , Nobuo Kochi
发明人： Takuya Moriyama , Nobuo Kochi
IPC分类号： G06K9/00 , G06K9/34
CPC分类号： G01C15/02
摘要： To provide a color-coded target having a color code of colors chosen not to cause code reading errors and technique for automatically detecting and processing the targets. The color-coded target CT1 of this invention includes, on its surface: a position detecting pattern P1 indicating a position to be measured; a reference color pattern P2 having a plurality of unit areas tinted in different colors for use as color references; and a color code pattern P3 having a plurality of unit areas tinted in different colors for discriminating the targets. The colors of the color code pattern P3 are chosen so that adjacent colors in the HSI color space are different in at least one of hue, saturation, and intensity by a specified value or greater.
摘要翻译：提供具有选择不引起代码读取错误的颜色的颜色代码的颜色编码目标以及用于自动检测和处理目标的技术。本发明的彩色编码对象CT1在其表面上包括表示待测位置的位置检测图案P1，参考颜色图案P2，其具有以不同颜色着色的多个单位区域，用作颜色参考; 以及具有以不同颜色着色的多个单位区域的颜色码图案P3，用于区分目标。选择颜色码图案P3的颜色，使得HSI色彩空间中的相邻颜色在色调，饱和度和强度中的至少一个中不同于指定值或更大。

52. 发明申请

US20070091174A1 Projection device for three-dimensional measurement, and three-dimensional measurement system 审中-公开
标题翻译：三维测量投影仪，三维测量系统
公开(公告)号：US20070091174A1
公开(公告)日：2007-04-26
申请号：US11526885
申请日：2006-09-26
申请人： Nobuo Kochi , Mitsuharu Yamada , Hiroto Watanabe , Takuya Moriyama
发明人： Nobuo Kochi , Mitsuharu Yamada , Hiroto Watanabe , Takuya Moriyama
IPC分类号： H04N7/18
CPC分类号： G01B11/2545 , G01B11/2509 , G01C11/06 , H04N13/204 , H04N13/239 , H04N13/243
摘要： The object of the invention is to improve the efficiency of and promote the automation of non-contact three-dimensional measurement over a wide area utilizing a projection device for projecting a target pattern. A projection device for three-dimensional measurement 80 according to the invention includes: a projection section 12 for projecting onto the shape of a measuring object a measurement pattern P indicating measurement points Q; a pattern projection control section 493 for controlling the projection section 12 to project the measurement pattern P; a pattern detection section 491 for detecting the measurement points Q from a photographed image of the measurement pattern P projected by the projection section 12; and a pattern forming section 492 for forming, based on displacement of the measurement points Q in a first measurement pattern detected by the pattern detection section 491, a second measurement pattern where the measurement points are increased, deleted or changed.
摘要翻译：本发明的目的是利用投影目标图案的投影装置来提高广域上的非接触三维测量的效率和促进自动化。根据本发明的用于三维测量的投影装置80包括：投影部分12，用于将表示测量点Q的测量图案P投影到测量对象的形状上; 用于控制投影部分12投影测量图案P的图案投影控制部分493; 用于从由投影部12投影的测量图案P的拍摄图像中检测测量点Q的图案检测部分491; 以及图案形成部492，用于基于由图案检测部491检测出的第一测量图案中的测量点Q的位移，形成测量点增加，删除或改变的第二测量图案。

53. 发明授权

US4676004A Automatic marking device for lensmeter 失效
标题翻译：镜头自动打标装置
公开(公告)号：US4676004A
公开(公告)日：1987-06-30
申请号：US784845
申请日：1985-10-04
申请人： Shinichi Nakamura , Hideo Tomoda , Nobuo Kochi
发明人： Shinichi Nakamura , Hideo Tomoda , Nobuo Kochi
IPC分类号： G01M11/02 , G01B9/08 , A61B3/10
CPC分类号： G01M11/0214 , G01M11/0207
摘要： An automatic marking device for a lensmeter comprising: a lens support member; a lens holder having a lens holding member cooperative with the lens supporting member for clamping therebetween the lens movably in a plane substantially perpendicular to a measuring optical axis of the lensmeter; a marking device having a marking unit movably mounted on the lens holder and having at least one marking stylus. The marking unit is carried for rotation about an axis which is parallel to the measuring optical axis. Two hands having inner surfaces are provided and adapted for contacting adjacent edges of the lens such as to clamp the lens therebetween. A hand moving device is provided for moving the hands in the plane in accordance with the result of measurement of the refraction characteristics of the lens.
摘要翻译：一种用于透镜计的自动打标装置，包括：透镜支撑构件; 透镜保持器，其具有与透镜支撑构件协作的透镜保持构件，用于在基本上垂直于透镜计的测量光轴的平面中可移动地夹持透镜; 标记装置具有可移动地安装在透镜架上并具有至少一个标记触针的标记单元。标记单元承载围绕平行于测量光轴的轴线旋转。提供具有内表面的两只手并适于接触透镜的相邻边缘，以便将透镜夹在其间。提供了一种手动移动装置，用于根据透镜的折射特性的测量结果在平面中移动手。

54. 发明授权

US08300986B2 Image measurement apparatus for creating a panoramic image 有权
标题翻译：用于创建全景图像的图像测量装置
公开(公告)号：US08300986B2
公开(公告)日：2012-10-30
申请号：US12186893
申请日：2008-08-06
申请人： Nobuo Kochi , Tetsuharu Anai , Hitoshi Ohtani
发明人： Nobuo Kochi , Tetsuharu Anai , Hitoshi Ohtani
IPC分类号： G06K9/32
CPC分类号： G06T3/4038 , G06T7/33 , G06T2207/10012
摘要： A measurement processing block obtains a plurality of first images of the object to be measured, taken with very small movements in the imaging area. A feature extraction processing block extracts an approximate feature portion of the object from the first images obtained by the measurement processing block. A partial-image creation processing block creates a plurality of first partial images by grouping the plurality of first images obtained by the measurement processing block in the vicinity of the approximate feature portion extracted by the feature extraction processing block. A super-resolution-image creation processing block creates a super-resolution image from the plurality of first partial images created by the partial-image creation processing block. Thus, detailed features of the object are measured precisely and easily even when the object is located far away.
摘要翻译：测量处理块在成像区域中以非常小的移动获得待测量对象的多个第一图像。特征提取处理块从由测量处理块获得的第一图像中提取对象的近似特征部分。部分图像创建处理块通过将由测量处理块获得的多个第一图像分组在由特征提取处理块提取的近似特征部分附近来创建多个第一部分图像。超分辨率图像创建处理块从由部分图像创建处理块创建的多个第一部分图像创建超分辨率图像。因此，即使当物体位于远处时，物体的详细特征也被精确且容易地测量。

55. 发明申请

US20100322482A1 THREE-DIMENSIONAL MEASUREMENT SYSTEM AND METHOD OF THE SAME, AND COLOR-CODED MARK 审中-公开
标题翻译：三维测量系统及其相关方法和彩色标记
公开(公告)号：US20100322482A1
公开(公告)日：2010-12-23
申请号：US12871057
申请日：2010-08-30
申请人： Nobuo Kochi , Takuya Moriyama , Masayuki Hideshima , Mitsuharu Yamada
发明人： Nobuo Kochi , Takuya Moriyama , Masayuki Hideshima , Mitsuharu Yamada
IPC分类号： G06K9/00
CPC分类号： G01C15/02 , G01C11/06 , G06K9/3216 , G06K2009/3225
摘要： This invention provides a three-dimensional measurement system that improves the efficiency of and enables the automation of non-contact three-dimensional measurement over a wide range using a coded target. A measuring object 1 is photographed in stereo such that the resulting images include four coded marks CT each having a position detection pattern P1 and a code pattern P3. A series of images are photographed in stereo such that adjacent images share two coded marks CT. The position detection pattern P1 and the code pattern P3 are extracted from a pair of photographed images. A point corresponding to a reference point is searched for using the identification codes of the coded marks CT. A stereo matching area is determined. All the processes including photographing, extraction, orientation and three-dimensional measurement can be fully automated.
摘要翻译：本发明提供了一种三维测量系统，其使用编码目标提高了在宽范围内的非接触三维测量的效率并使其能够自动化。测量对象1以立体声拍摄，使得所得到的图像包括四个具有位置检测图案P1和代码图案P3的编码标记CT。以立体声拍摄一系列图像，使得相邻图像共享两个编码标记CT。从一对拍摄图像中提取位置检测图案P1和码图案P3。使用编码标记CT的识别码来搜索与参考点相对应的点。确定立体匹配区域。包括拍摄，提取，取向和三维测量在内的所有过程都可以完全自动化。

56. 发明授权

US07648237B2 Device for installing suction jig for eyeglass lens and method for determining suction jig installation position 失效
标题翻译：用于安装眼镜镜片的吸尘装置的装置和用于确定抽吸夹具安装位置的方法
公开(公告)号：US07648237B2
公开(公告)日：2010-01-19
申请号：US10594318
申请日：2005-03-24
申请人： Tsutomu Kigawa , Kazuo Kitamura , Nobuo Kochi , Takahiro Watanabe , Yoshimasa Ogawa
发明人： Tsutomu Kigawa , Kazuo Kitamura , Nobuo Kochi , Takahiro Watanabe , Yoshimasa Ogawa
IPC分类号： G02C13/00
CPC分类号： G01M11/0214 , B24B9/146 , B24B13/005 , B24B49/12 , G01M11/0207
摘要： An automatic suction device for an eyeglass lens and a method for determining suction jig installation position, capable of recognizing that a frame exchange lens holder is being installed on a placement table, making transition to installation work of a frame exchange mode, and avoiding an erroneous contact between the frame exchange frame and a lens holding frame. The kind of holding means placed on the placement table is determined from an image of the inside of an opening (141), which image is taken by a CCD camera (105), and the installation position of a suction jig (121) at an eyeglass lens (L) placed on a frame exchange lens holder (300) is obtained.
摘要翻译：一种用于眼镜镜片的自动抽吸装置和一种用于确定抽吸夹具安装位置的方法，其能够识别框架更换镜头保持器正在安装在放置台上，转变为框架更换模式的安装工作，并避免错误框架更换框架与透镜保持架之间的接触。放置在放置台上的保持装置的种类根据由CCD照相机（105）拍摄的开口（141）的内部的图像和吸入夹具（121）的安装位置获得放置在框架更换镜架（300）上的眼镜镜片（L）。

57. 发明授权

US07329867B2 Electron beam system and electron beam measuring and observing methods 失效
标题翻译：电子束系统和电子束测量和观测方法
公开(公告)号：US07329867B2
公开(公告)日：2008-02-12
申请号：US11505872
申请日：2006-08-18
申请人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
发明人： Nobuo Kochi , Hirotami Koike , Yasuko Tsuruga , Shinichi Okada
IPC分类号： H01J37/28
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/2611
摘要： To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing section 32 for storing a correction factor at a reference tilt angle with respect to a plane which is used to tilt a sample by a sample tilting section 5, an approximate coordinate measuring section 28 for obtaining an approximate shape or approximate coordinate values of the sample based on an output corresponding to a stereo image from an electron beam detecting section 4, an image correcting section 30 for correcting the stereo image according to the tilt angle created by the sample tilting section 5 based on the shape or coordinate values of the sample obtained in the approximate coordinate measuring section 28 using a correction factor stored in the correction factor storing section 32, and a precise coordinate measuring section 34 for obtaining a shape or coordinate values of the sample which are more precise than those obtained in the approximate coordinate measuring section 28 based on a corrected stereo image obtained in the image correcting section 30.
摘要翻译：提供能够以高精度执行样品的三维测量的电子束系统，而与样品的倾斜角度和高度无关。电子束系统具有校正因子存储部分32，用于存储相对于用于通过样本倾斜部分5倾斜样本的平面的参考倾斜角的校正因子，用于获得近似坐标测量部分28的近似坐标测量部分28 基于与来自电子束检测部分4的立体图像相对应的输出的样本的形状或近似坐标值，用于根据由样本倾斜部分5产生的倾斜角校正立体图像的图像校正部分30 使用存储在校正因子存储部分32中的校正因子在近似坐标测量部分28中获得的样本的形状或坐标值，以及精确坐标测量部分34，用于获得样本的形状或坐标值，其比基于所获得的校正立体图像在近似坐标测量部分28中获得的那些在图像校正部30中。

58. 发明授权

US06928384B2 Image measurement and display device, image measurement and display system, construction management method, and construction status monitor system 有权
标题翻译：图像测量和显示设备，图像测量和显示系统，施工管理方法和施工状态监控系统
公开(公告)号：US06928384B2
公开(公告)日：2005-08-09
申请号：US10156763
申请日：2002-05-29
申请人： Nobuo Kochi
发明人： Nobuo Kochi
IPC分类号： G01C11/04 , G06T1/00 , G06T7/00 , H04N13/00 , G01B15/04
CPC分类号： G01C15/00 , G06T7/593 , G06T2207/10012 , H04N13/194 , H04N13/221 , H04N13/239 , H04N2013/0081
摘要： A device includes a shape measuring section 350 for measuring shape data from a pair of stereovision images of an object taken with an image taking section 2209 a memory section 340 for storing target data related to the images of the object; an image display section 330 for superposing the paired stereovision images of the object and the stereovision target data image based on the target data and for displaying the images; and a comparison display processing section 360 for comparing the shape data of the object measured by the shape measuring section 350, with the target data and reflecting the results of the comparison on the superposed display on the image display section 330.
摘要翻译：一种装置包括：形状测量部分350，用于从图像拍摄部分2209拍摄的对象的一对立体图像中测量形状数据;存储部分340，用于存储与对象的图像相关的目标数据; 图像显示部分330，用于基于目标数据叠加对象的立体视觉图像和立体视觉目标数据图像并显示图像; 以及比较显示处理部分360，用于将由形状测量部分350测量的对象的形状数据与目标数据进行比较，并将重叠的显示的比较结果反映在图像显示部分330上。

59. 发明申请

US20050161601A1 Electron beam system and electron beam measuring and observing method 失效
标题翻译：电子束系统和电子束测量和观测方法
公开(公告)号：US20050161601A1
公开(公告)日：2005-07-28
申请号：US10962752
申请日：2004-10-13
申请人： Nobuo Kochi , Hiroyuki Aoki
发明人： Nobuo Kochi , Hiroyuki Aoki
IPC分类号： G01B15/00 , G01N23/00 , G01N23/225 , G06T7/00 , G21K7/00 , H01J37/28
CPC分类号： G01N23/2251 , G01B15/00 , G06T7/593 , G06T7/85 , H01J37/28 , H01J2237/2611 , H01J2237/2814 , H01J2237/2826
摘要： This invention provides an electron beam measuring device capable of performing three-dimensional image measurement of a sample with high precision, irrespective of the tilt angle and height of the sample, by adjusting an electron optical system of a scanning charged-particle beam device so as to be suitable for image measurement. The electron beam measuring device includes a measuring section 20 adapted to tilt a reference template held by a sample holder 3 and an irradiated electron beam 7 relative to each other by means of a sample tilting section 5, to find the shape or coordinate values of the reference template based on a stereo image photographed by an electron beam detecting section 4, a calibration data preparing section 30 for comparing the measuring results at the measuring section 20 with known reference data to prepare calibration data for a stereo image photographed by the electron beam measuring device, and a calibration section 40 for performing a calibration based on the calibration data so as to reduce aberration in an image of the sample detected by the electron beam detecting section 4. Based on the stereo image calibrated by the calibration section 40, the shape or coordinate values of the sample 9 are found.
摘要翻译：本发明提供一种电子束测量装置，其能够通过调整扫描带电粒子束装置的电子光学系统，而与样品的倾斜角和高度无关地以高精度执行样品的三维图像测量，从而适合图像测量。电子束测量装置包括测量部分20，该测量部分20借助于样本倾斜部分5相对于彼此倾斜由样本保持器3保持的参考模板和照射的电子束7，以便找到该样本的形状或坐标值基于由电子束检测部分4拍摄的立体图像的参考模板，用于将测量部分20的测量结果与已知参考数据进行比较的校准数据准备部分30，以准备通过电子束测量拍摄的立体图像的校准数据装置和用于基于校准数据执行校准的校准部分40，以便减少由电子束检测部分4检测的样本的图像的像差。基于由校准部40校准的立体图像，找到样品9的形状或坐标值。

60. 发明授权

US06852974B2 Electron beam device and method for stereoscopic measurements 失效
公开(公告)号：US06852974B2
公开(公告)日：2005-02-08
申请号：US10086625
申请日：2002-03-04
申请人： Nobuo Kochi , Hirotami Koike
发明人： Nobuo Kochi , Hirotami Koike
IPC分类号： H01J37/26 , G01N23/00
CPC分类号： H01J37/26 , H01J2237/2611
摘要： An electron beam device according to the present invention is made up of an electron beam source for emitting an electron beam, an electron optical system for irradiating the electron beam onto a specimen, a specimen holder for holding the specimen, a specimen tilting section for producing relative tilt angles between the specimen holder and the electron beam, an electron beam detecting section for detecting electron beam emitted from the specimen, and a data correcting section for correcting the three-dimensional detection data to have specified relationship under the condition of a relative tilt angle between the specimen holder and the electron beam.

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