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    • 52. 发明申请
    • Organic EL display device
    • 有机EL显示装置
    • US20080136339A1
    • 2008-06-12
    • US11984161
    • 2007-11-14
    • Toshiyuki MatsuuraMasahiro TanakaSukekazu ArataniMasao Shimizu
    • Toshiyuki MatsuuraMasahiro TanakaSukekazu ArataniMasao Shimizu
    • G09G3/00H01L51/54
    • H01L51/5052H01L27/3244H01L51/5234H01L2251/5315
    • The invention allows a top-emission-type organic EL display device to use a chemically stable conductive film containing ITO for forming a lower electrode of an organic EL layer. The organic EL layer includes an electron injection layer, an electron transport layer, a light emission layer, a hole transport layer and a hole injection layer. An upper electrode which constitutes a transparent electrode is formed of an IZO film. A lower electrode adopts the two-layered structure consisting of a lower layer made of Al or an Al alloy having high reflectance and an upper layer formed of a chemically stable ITO film. To enable the injection of electrons from the ITO film which constitutes the lower electrode, the electron injection layer is formed using a film which is acquired by co-depositing Li and Alq3 at a molecular ratio of 3:1. Due to such a constitution, electrons can be injected from the ITO film thus realizing the top-emission-type organic EL display device.
    • 本发明允许顶部发射型有机EL显示装置使用含有ITO的化学稳定的导电膜来形成有机EL层的下电极。 有机EL层包括电子注入层,电子传输层,发光层,空穴传输层和空穴注入层。 构成透明电极的上电极由IZO膜形成。 下电极采用由具有高反射率的Al或Al合金制成的下层和由化学稳定的ITO膜形成的上层构成的双层结构。 为了能够从构成下电极的ITO膜注入电子,使用通过以3:1的分子比共沉积Li和Alq3而获得的膜形成电子注入层。 由于这样的结构,可以从ITO膜注入电子,从而实现顶部发射型有机EL显示装置。
    • 57. 发明授权
    • Semiconductor test equipment
    • 半导体测试设备
    • US5592496A
    • 1997-01-07
    • US416048
    • 1995-04-04
    • Masao ShimizuKenji Yoshida
    • Masao ShimizuKenji Yoshida
    • G01R31/28G01R31/319G06F11/00
    • G01R31/31922G01R31/2851G01R31/31928
    • A semiconductor test equipment for testing a semiconductor device which is capable of reducing the cost and size is disclosed. The semiconductor test equipment includes a main clock generator for generating a main clock signal having the highest frequency, a first pattern generator which receives the main clock signal for generating a first test pattern signal, a clock divider which divides the main clock signal to generate a lower frequency clock signal, and a second pattern generator which receives the lower frequency clock for generating a second test pattern. The semiconductor test equipment further includes a first wave formatter which receives the first pattern signal for forming a predetermined wave shape, and a second wave formatter which receives the second pattern signal for forming a predetermined wave shape, a first comparator circuit which receives a first output signal from the device under test and compares the first output signal with a first expected pattern from the first pattern generator, and a second comparator circuit which receives a second output signal from the device under test and compares the second output signal with a second expected pattern from the second pattern generator.
    • 公开了一种用于测试能够降低成本和尺寸的半导体器件的半导体测试设备。 半导体测试设备包括用于产生具有最高频率的主时钟信号的主时钟发生器,接收用于产生第一测试图形信号的主时钟信号的第一模式发生器,分频主时钟信号以产生 低频时钟信号,以及接收用于产生第二测试图案的较低频率时钟的第二模式发生器。 半导体测试设备还包括接收用于形成预定波形的第一图案信号的第一波形格式器和接收用于形成预定波形的第二图案信号的第二波形格式器,接收第一输出 信号,并且将第一输出信号与来自第一模式发生器的第一预期模式进行比较,以及第二比较器电路,其从被测器件接收第二输出信号,并将第二输出信号与第二预期模式进行比较 从第二模式发生器。
    • 58. 发明授权
    • Slit system
    • 狭缝系统
    • US5508838A
    • 1996-04-16
    • US292735
    • 1994-08-18
    • Masao ShimizuKenji Ishikawa
    • Masao ShimizuKenji Ishikawa
    • H01J49/06G02B26/02
    • H01J49/06
    • A small-sized, simple, high-resolution slit system adapted for use in a mass spectrometer. The slit system forms a slit whose width can be electrically controlled. The slit system comprises two displacement-enlarging mechanisms disposed in rotation symmetry. Each displacement-enlarging mechanism comprises two levers disposed in series. Each displacement-enlarging mechanism is formed by one flange provided with a groove extending therethrough. A piezoelectric device which expands and contracts along one axis is mounted to the input end of each displacement-enlarging mechanism. A blade is mounted to the output end of each displacement-enlarging mechanism. Both blades together form the slit which can be opened and closed.
    • 适用于质谱仪的小尺寸,简单,高分辨率的狭缝系统。 狭缝系统形成其宽度可以被电控制的狭缝。 狭缝系统包括以旋转对称设置的两个位移放大机构。 每个位移放大机构包括串联布置的两个杠杆。 每个位移放大机构由设有延伸穿过其中的槽的一个凸缘形成。 沿着一个轴线膨胀和收缩的压电装置安装到每个位移放大机构的输入端。 叶片安装到每个位移放大机构的输出端。 两个叶片一起形成可以打开和关闭的狭缝。