会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 51. 发明授权
    • Systems for alternate row-based reading and writing for non-volatile memory
    • 用于非易失性存储器的替代行读和写的系统
    • US07443726B2
    • 2008-10-28
    • US11321346
    • 2005-12-29
    • Daniel C. Guterman
    • Daniel C. Guterman
    • G11C16/04
    • G11C11/5628G11C11/5642G11C16/3418G11C2211/5622
    • A set of storage elements is programmed beginning with a word line WLn adjacent a select gate line for the set. After programming the first word line, the next word line WLn+1 adjacent to the first word line is skipped and the next word line WLn+2 adjacent to WLn+1 is programmed. WLn+1 is then programmed. Programming continues according to the sequence {WLn+4, WLn+3, WLn+6, WLn+5, . . . } until all but the last word line for the set have been programmed. The last word line is then programmed. By programming in this manner, some of the word lines of the set (WLn+1, WLn+3, etc.) have no subsequently programmed neighboring word lines. The memory cells of these word lines will not experience any floating gate to floating gate coupling threshold voltage shift impact due to subsequently programmed neighboring memory cells. The word lines having no subsequently programmed neighbors are read without using offsets or compensations based on neighboring memory cells. The other word lines are read using compensations based on data states within both subsequently programmed neighboring word lines.
    • 一组存储元件从与集合的选择栅极线相邻的字线WLn开始被编程。 在对第一字线进行编程之后,跳过与第一字线相邻的下一个字线WLn + 1,并对与WLn + 1相邻的下一个字线WLn + 2进行编程。 然后编程WLn + 1。 根据序列{WLn + 4,WLn + 3,WLn + 6,WLn + 5,..., 。 。 }直到所有集合的最后一个字线都被编程为止。 然后编程最后一个字线。 通过以这种方式进行编程,组(WLn + 1,WLn + 3等)的一些字线没有随后编程的相邻字线。 这些字线的存储单元将不会经历由于随后编程的相邻存储单元而产生的任何漂浮栅极与浮栅耦合阈值电压偏移的影响。 在不使用基于相邻存储单元的偏移或补偿的情况下读取没有随后编程的邻居的字线。 使用基于随后编程的相邻字线内的数据状态的补偿来读取其他字线。
    • 58. 发明授权
    • Boosting to control programming of non-volatile memory
    • 促进控制非易失性存储器的编程
    • US07301812B2
    • 2007-11-27
    • US11392901
    • 2006-03-29
    • Daniel C. GutermanNima MokhlesiYupin Fong
    • Daniel C. GutermanNima MokhlesiYupin Fong
    • G11C16/04
    • G11C16/0483G11C16/12G11C16/30G11C16/3418G11C16/3427G11C16/3454G11C16/3459
    • A system is disclosed for programming non-volatile memory with greater precision. In one embodiment, the system includes applying a first phase of a boosting signal to one or more unselected word lines for a set of NAND strings, applying a programming level to selected bit lines of the NAND strings while applying the first phase of the boosting signal, and applying an inhibit level to unselected bit lines of the NAND strings while applying the first phase of the boosting signal. Subsequently, a second phase of the boosting signal is applied to the one or more unselected word lines and the signal(s) on the selected bit lines are changed by applying the inhibit level to the selected bit lines so that NAND strings associated with the selected bit lines will be boosted by the second phase of the boosting signal. A program voltage signal is applied to a selected word line in order to program storage elements connected to the selected word line.
    • 公开了一种更精确地编程非易失性存储器的系统。 在一个实施例中,该系统包括将一个升压信号的第一相位应用于一组NAND串的一个或多个未选字线,将编程电平施加到NAND串的选定位线,同时施加升压信号的第一相位 并且在施加升压信号的第一相位时将禁止电平施加到NAND串的未选位线。 随后,将升压信号的第二相位施加到一个或多个未选字线,并且通过将所述禁止电平施加到所选择的位线来改变所选位线上的信号,使得与所选择的位线相关联的NAND串 位线将由升压信号的第二阶段提升。 将程序电压信号施加到所选择的字线,以便编程连接到所选字线的存储元件。
    • 60. 发明授权
    • Reducing the effects of noise in non-volatile memories through multiple reads
    • 通过多次读取降低非易失性存储器中噪声的影响
    • US07177195B2
    • 2007-02-13
    • US11191823
    • 2005-07-27
    • Carlos J. GonzalezDaniel C. Guterman
    • Carlos J. GonzalezDaniel C. Guterman
    • G11C11/34
    • G11C7/106G11C7/1006G11C7/1051G11C16/12G11C16/26G11C16/28G11C16/3454G11C16/3459G11C2013/0057
    • Storage elements are read multiple times and the results are accumulated and averaged for each storage element to reduce the effects of noise or other transients in the storage elements and associated circuits that may adversely affect the quality of the read. Several techniques may be employed, including: A full read and transfer of the data from the storage device to the controller device for each iteration, with averaging performed by the controller; a full read of the data for each iteration, with the averaging performed by the storage device, and no transfer to the controller until the final results are obtained; one full read followed by a number of faster re-reads exploiting the already established state information to avoid a full read, followed by an intelligent algorithm to guide the state at which the storage element is sensed. These techniques may be used as the normal mode of operation, or invoked upon exception condition, depending on the system characteristics. A similar form of signal averaging may be employed during the verify phase of programming. An embodiment of this technique would use a peak-detection scheme. In this scenario, several verify checks are performed at the state prior to deciding if the storage element has reached the target state. If some predetermined portion of the verifies fail, the storage element receives additional programming. These techniques allow the system to store more states per storage element in the presence of various sources of noise.
    • 存储元件被读取多次,并且对于每个存储元件累积和平均结果,以减少可能不利地影响读取质量的存储元件和相关电路中的噪声或其他瞬变的影响。 可以采用几种技术,其中包括:由控制器对平均数据进行每次迭代从存储设备到控制器设备的完整读取和传输; 对每次迭代的数据进行完全读取,并由存储设备进行平均,并且在获得最终结果之前不转移到控制器; 一次完全读取,然后利用已建立的状态信息进行多次更快的重新读取,以避免完全读取,随后是引导存储元件被感测的状态的智能算法。 这些技术可以用作正常操作模式,或者根据异常情况被调用,这取决于系统特性。 可以在编程的验证阶段期间采用类似形式的信号平均。 该技术的实施例将使用峰值检测方案。 在这种情况下,在决定存储元件是否达到目标状态之前,先在状态下执行多个验证检查。 如果验证的一些预定部分失败,则存储元件接收另外的编程。 这些技术允许系统在存在各种噪声源的情况下存储每个存储元件的更多状态。