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    • 52. 发明授权
    • Method of manufacturing semiconductor device by sputter doping
    • 通过溅射掺杂制造半导体器件的方法
    • US06784080B2
    • 2004-08-31
    • US09840306
    • 2001-04-24
    • Bunji MizunoHiroaki NakaokaMichihiko TakaseIchiro Nakayama
    • Bunji MizunoHiroaki NakaokaMichihiko TakaseIchiro Nakayama
    • H01L2104
    • H01L29/66106H01J37/32082H01J37/32192H01J37/32412H01J37/32678H01L21/2236
    • A semiconductor substrate and an impurity solid that comprises of impurity to be introduced to a diode formation region are held in a vacuum chamber. Inert or reactive gas is introduced into the vacuum chamber to generate plasma composed of the inert or reactive gas. A first voltage allowing the impurity solid to serve as a cathode for the plasma is applied to the said impurity solid and the said impurity solid is sputtered by ions in the plasma, thereby mixing the impurity within the said impurity solid into the plasma. A second voltage allowing a semiconductor substrate to serve as a cathode for the plasma is applied to the said semiconductor substrate, thereby directly introducing the impurity within the plasma to the surface portion of the diode formation region of the said semiconductor substrate, generating a impurity layer.
    • 将包含待引入到二极管形成区域的杂质的半导体衬底和杂质固体保持在真空室中。 将惰性或反应性气体引入真空室以产生由惰性或反应性气体组成的等离子体。 将杂质固体用作等离子体的阴极的第一电压施加到所述杂质固体上,并且所述杂质固体被等离子体中的离子溅射,从而将所述杂质固体内的杂质混合到等离子体中。 将半导体衬底用作等离子体的阴极的第二电压被施加到所述半导体衬底,从而将等离子体内的杂质直接引入到所述半导体衬底的二极管形成区域的表面部分,产生杂质层 。