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    • 56. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07948790B2
    • 2011-05-24
    • US12558058
    • 2009-09-11
    • Takayuki TsukamotoReika Ichihara
    • Takayuki TsukamotoReika Ichihara
    • G11C11/00
    • G11C13/0007G11C11/5685G11C13/0064G11C13/0069G11C16/3413G11C16/3463G11C2013/009G11C2211/5642G11C2213/31G11C2213/56G11C2213/71G11C2213/72
    • A memory cell arranged between first and second wirings includes a variable-resistor element. A controller controls a voltage applied between the first and second wirings. The controller performs a first operation that applies a first voltage between the first and second wirings to switch the variable-resistor element from a first state with a resistance value not less than a first resistance value, to a second state with a resistance value not more than a second resistance value smaller than the first resistance value. The second operation applies a second voltage smaller than the first voltage between the first and second wirings to switch the variable-resistor element from the second state to the first state. In the first operation, a verify voltage is applied between the first and second wirings. Based on the obtained signal, a third voltage smaller than the first voltage is applied between the first and second wirings.
    • 布置在第一和第二布线之间的存储单元包括可变电阻器元件。 控制器控制施加在第一和第二布线之间的电压。 控制器执行第一操作,其在第一和第二布线之间施加第一电压,以将具有不小于第一电阻值的电阻值的第一状态的可变电阻元件切换到具有不大于电阻值的第二状态 比第一电阻值小的第二电阻值。 第二操作施加小于第一和第二布线之间的第一电压的第二电压,以将可变电阻元件从第二状态切换到第一状态。 在第一操作中,在第一和第二布线之间施加验证电压。 基于获得的信号,在第一和第二布线之间施加小于第一电压的第三电压。
    • 58. 发明申请
    • NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE
    • 非易失性半导体存储器件
    • US20110032745A1
    • 2011-02-10
    • US12846198
    • 2010-07-29
    • Reika ICHIHARATakayuki TsukamotoKenichi MurookaHirofumi InoueHiroshi Kanno
    • Reika ICHIHARATakayuki TsukamotoKenichi MurookaHirofumi InoueHiroshi Kanno
    • G11C11/00
    • G11C13/0061G11C13/0007G11C13/0023G11C13/0069G11C13/0097G11C2013/0092
    • A non-volatile semiconductor memory device according to an aspect of embodiments of the present invention includes a memory cell array including: multiple first wirings; multiple second wirings crossing the multiple first wirings; and multiple electrically rewritable memory cells respectively arranged at intersections of the first wirings and the second wirings, and each formed of a variable resistor which stores a resistance value as data in a non-volatile manner. The non-volatile semiconductor memory device according to an aspect of the embodiments of the present invention further includes a controller for selecting a given one of the memory cells, generating an erase pulse which is used for erasing data, and supplying the erase pulse to the selected memory cell. The erase pulse has a pulse width which is increased or decreased exponentially in accordance with an access path length to the selected memory cell.
    • 根据本发明的实施例的非易失性半导体存储器件包括:存储单元阵列,包括:多个第一布线; 多个第二布线穿过多个第一布线; 以及分别布置在第一布线和第二布线的交点处的多个电可重写存储器单元,并且每个由可变电阻器形成,其以非易失性方式存储电阻值作为数据。 根据本发明实施例的一个方面的非易失性半导体存储器件还包括用于选择给定的一个存储单元的控制器,产生用于擦除数据的擦除脉冲,并将擦除脉冲提供给 选择的存储单元。 擦除脉冲具有根据到所选存储单元的访问路径长度指数地增加或减少的脉冲宽度。