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    • 53. 发明授权
    • Parameter setting method and circuit operation testing method and electronic processing device
    • 参数设定方法及电路运行试验方法及电子处理装置
    • US07463988B2
    • 2008-12-09
    • US11644350
    • 2006-12-21
    • Takayuki InoueYoshiyuki Kurokawa
    • Takayuki InoueYoshiyuki Kurokawa
    • G06F17/50G06F17/00
    • G06F17/5036
    • The invention provides a method for testing a circuit operation (circuit simulation), which is conducted by using a model of high precision. After parameters are extracted by using a model of which physical precision is low and parameter extraction time is short from measurement data, the parameters are converted to those obtained by a model of which parameter extraction time is generally long and a circuit operation test is performed by a model of high physical precision. In other words, a parameter is extracted first by a model of low physical precision and then, the extracted parameter is converted into a parameter obtained by the model of high physical precision. Finally, a circuit operation test is performed by using the model having high physical precision.
    • 本发明提供了一种通过使用高精度模型进行电路操作(电路仿真)的测试方法。 通过使用物理精度低,参数提取时间短的测量数据的模型提取参数后,将参数转换为通过参数提取时间一般较长的模型获得的参数,并进行电路运行测试 高度物理精度的模型。 换句话说,首先通过低物理精度的模型提取参数,然后将提取的参数转换为由高物理精度的模型获得的参数。 最后,通过使用具有高物理精度的模型进行电路操作测试。
    • 58. 发明申请
    • Parameter setting method and circuit operation testing method and electronic processing device
    • 参数设定方法及电路运行试验方法及电子处理装置
    • US20070150250A1
    • 2007-06-28
    • US11644350
    • 2006-12-21
    • Takayuki InoueYoshiyuki Kurokawa
    • Takayuki InoueYoshiyuki Kurokawa
    • G06F17/50
    • G06F17/5036
    • The invention provides a method for testing a circuit operation (circuit simulation), which is conducted by using a model of high precision. After parameters are extracted by using a model of which physical precision is low and parameter extraction time is short from measurement data, the parameters are converted to those obtained by a model of which parameter extraction time is generally long and a circuit operation test is performed by a model of high physical precision. In other words, a parameter is extracted first by a model of low physical precision and then, the extracted parameter is converted into a parameter obtained by the model of high physical precision. Finally, a circuit operation test is performed by using the model having high physical precision.
    • 本发明提供了一种通过使用高精度模型进行电路操作(电路仿真)的测试方法。 通过使用物理精度低,参数提取时间短的测量数据的模型提取参数后,将参数转换为通过参数提取时间一般较长的模型获得的参数,并进行电路运行测试 高度物理精度的模型。 换句话说,首先通过低物理精度的模型提取参数,然后将提取的参数转换为由高物理精度的模型获得的参数。 最后,通过使用具有高物理精度的模型进行电路操作测试。