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    • 47. 发明授权
    • Semiconductor memory device capable of shortening erase time
    • 能够缩短擦除时间的半导体存储器件
    • US08971130B2
    • 2015-03-03
    • US13660044
    • 2012-10-25
    • Noboru Shibata
    • Noboru Shibata
    • G11C11/34G11C16/14
    • G11C16/3445G11C16/10G11C16/14G11C16/26
    • In a memory cell array, a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines are arranged in a matrix. A control circuit controls the potentials of said plurality of word lines and said plurality of bit lines. In an erase operation, the control circuit erases an n number of memory cells (n is a natural number equal to or larger than 2) of said plurality of memory cells at the same time using a first erase voltage, carries out a verify operation using a first verify level, finds the number of cells k (k≦n) exceeding the first verify level, determines a second erase voltage according to the number k, and carries out an erase operation again using the second erase voltage.
    • 在存储单元阵列中,连接到多个字线和多个位线的多个存储单元被布置成矩阵。 控制电路控制所述多个字线和所述多个位线的电位。 在擦除操作中,控制电路使用第一擦除电压同时擦除所述多个存储单元的n个存储单元(n为等于或大于2的自然数),执行使用 第一验证电平,找到超过第一验证电平的单元数k(k≦̸ n),根据数k确定第二擦除电压,并使用第二擦除电压再次执行擦除操作。