会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 43. 发明申请
    • LUMINESCENCE MICROSCOPY
    • 荧光显微镜
    • US20120319007A1
    • 2012-12-20
    • US13518115
    • 2010-10-22
    • Michael KempeRalf NetzGerhard Krampert
    • Michael KempeRalf NetzGerhard Krampert
    • G01N21/64
    • G01N21/6458G02B21/16
    • A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.
    • 发光显微镜方法包括使用的样品,其包含某种物质,其中某些物质可以从其可被激发发射发光辐射的第一状态重复地转换到第二状态,其中不能是 激发发射发光辐射。 存在于样品中的物质可以通过照射开关辐射而进入第一状态。 可以通过照射激发辐射来激发某些物质发射发光辐射。 可以显示发射发光辐射的样品。 垂直于样品表面延伸的样品区域的高分辨率选择是通过照射样品的结构照明中的开关辐射或激发辐射来进行的。 通过将开关辐射和/或激发辐射照射作为样品的TIRF照明来进行样品表面的高分辨率选择。
    • 45. 发明申请
    • LASER BEAM MACHINING
    • 激光加工
    • US20100294749A1
    • 2010-11-25
    • US12744216
    • 2008-11-20
    • Michael KempePeter WestphalWolfgang GrauGeorg Von Freymann
    • Michael KempePeter WestphalWolfgang GrauGeorg Von Freymann
    • B23K26/06
    • B23K26/046G02B7/32G02B21/244G02B21/245G03F7/70375G03F7/70383
    • A method for laser beam machining of a workpiece in which a laser beam is focused by an objective, into or onto the workpiece having a boundary surface, to produce a machining effect by a two-photon process, and the position of the focal point with respect to the workpiece is shifted. To obtain a reference for the position of the focal point, an image of a luminating modulation object is projected through the objective onto the workpiece into the focal plane or so as to intersect it. Reflections of the image occurring at the boundary surface are imaged into an autofocus image plane, and are detected by a camera. The camera image plane either intersects the autofocus image plane when the image of the illuminating modulation object lies in the focal plane, or lies in the autofocus image plane when the image of the modulation object intersects the focal plane.
    • 一种用于激光束加工的方法,其中激光束被物镜聚焦到具有边界表面的工件中或之上,以通过双光子过程产生加工效果,并且焦点的位置与 相对于工件移动。 为了获得焦点的位置的参考,发光调制对象的图像通过物镜投射到工件上进入焦平面或与之相交。 在边界面发生的图像的反射被成像为自动聚焦图像平面,并且由相机检测。 当照明调制对象的图像位于焦平面时,相机图像平面与自动聚焦图像平面相交,或者当调制对象的图像与焦平面相交时,相机图像平面位于自动聚焦图像平面中。
    • 46. 发明申请
    • METHOD FOR THE MICROSCOPIC THREE-DIMENSIONAL REPRODUCTION OF A SAMPLE
    • 一种样品的微观三维再现方法
    • US20100201784A1
    • 2010-08-12
    • US12680056
    • 2008-09-16
    • Helmut LippertBenno RadtMichael KempeChristian Dietrich
    • Helmut LippertBenno RadtMichael KempeChristian Dietrich
    • H04N13/02
    • G06T7/97G02B21/002G02B21/244G02B21/367
    • A method for the three-dimensional imaging of a sample in which image information from different depth planes of the sample is stored in a spatially resolved manner, and the three-dimensional image of the sample is subsequently reconstructed from this stored image information is provided. A reference structure is applied to the illumination light, at least one fluorescing reference object is positioned next to or in the sample, images of the reference structure of the illumination light, of the reference object are recorded from at least one detection direction and evaluated. The light sheet is brought into an optimal position based on the results and image information of the reference object and of the sample from a plurality of detection directions is stored. Transformation operators are obtained on the basis of the stored image information and the reconstruction of the three-dimensional image of the is based on these transformation operators.
    • 提供了一种用于样本的三维成像的方法,其中以空间分辨的方式存储来自样本的不同深度平面的图像信息,并且随后从该存储的图像信息重建样本的三维图像。 参考结构被应用于照明光,至少一个发荧光参考对象被放置在样本旁边或样本中,从至少一个检测方向记录参考物体的照明光的参考结构的图像并进行评估。 基于结果使光照片进入最佳位置,存储参考对象的图像信息和来自多个检测方向的样本的图像信息。 基于存储的图像信息和基于这些变换算子的三维图像的重建获得转换算子。
    • 47. 发明授权
    • Microscopy method and microscope including two detections
    • 显微镜方法和显微镜包括两个检测
    • US07728270B2
    • 2010-06-01
    • US12088410
    • 2006-09-14
    • Ralf WolleschenskyMichael Kempe
    • Ralf WolleschenskyMichael Kempe
    • H01L27/00
    • G02B21/002
    • A microscopy method is provided for generating an image of an image field passing in a predetermined depth of a sample to be examined, comprising a plurality of illumination steps, in which a part of the image field is in each case illuminated with a focused illumination beam bundle, which effects the generation of sample radiation on account of an interaction with the sample, detection steps, in which the sample radiation generated is detected, and an evaluation step, in which the image is generated on the basis of the sample radiation detected, wherein a first and second detection step are carried out during each illumination step, wherein sample radiation generated at the focus and outside the focus is detected in the first detection step and a smaller proportion of the sample radiation generated at the focus than in the first detection step and also sample radiation generated outside the focus are detected in the second detection step, and wherein the sample radiation detected in the second detection step is used in the evaluation step to reduce the proportion outside the focus in the sample radiation detected in the first detection step.
    • 提供了一种显微镜方法,用于产生通过待检查样本的预定深度的图像场的图像,包括多个照明步骤,其中图像场的一部分在每种情况下被照射聚焦照明光束 束,其由于与样品的相互作用而影响样品辐射的产生,其中检测到产生的样品辐射的检测步骤以及基于检测到的样品辐射而产生图像的评估步骤, 其中在每个照明步骤期间执行第一和第二检测步骤,其中在第一检测步骤中检测在焦点处和在焦点外部产生的样品辐射,以及在焦点处产生的样品辐射比在第一检测中产生的较小比例 在第二检测步骤中检测步骤,并且在焦点外产生的样本辐射被检测,并且其中在t中检测到的样本辐射 在评估步骤中使用第二检测步骤来减少在第一检测步骤中检测到的样品辐射中焦点外的比例。
    • 48. 发明授权
    • Method and arrangement for optical examination or processing of a sample
    • 用于光学检查或样品处理的方法和装置
    • US07612884B2
    • 2009-11-03
    • US10539491
    • 2003-11-29
    • Ralf WolleschenskyMichael Kempe
    • Ralf WolleschenskyMichael Kempe
    • G01N21/00
    • G02B21/0076G02B21/0032
    • A method and an arrangement for the optical examination and/or processing of a sample comprise an element for generating an illumination light, an element arranged downstream of the latter for spectral splitting of the illumination light for generating spatially separated spectral components, an element for parallelizing the split illumination light, an element for focusing the illumination light on or in the sample, wherein the spectral components are superposed, and an element for detecting the sample light, advantageously comprising an element for generating a short-pulse illumination light, an element arranged downstream of the latter for spectral splitting of the illumination light for generating spatially separated spectral components with pulse lengths that are greater than the pulse length of the illumination light, wherein these spectral components are combined again in the sample.
    • 用于光学检查和/或处理样品的方法和装置包括用于产生照明光的元件,布置在其后面的元件,用于分光照明光以产生空间上分离的光谱分量,用于并行化的元件 分割照明光,用于将照明光聚焦在样品上或样品中的元件,其中重叠光谱分量,以及用于检测样品光的元件,有利地包括用于产生短脉冲照明光的元件,布置成 后者用于分光光束,用于产生具有大于照明光的脉冲长度的脉冲长度的空间分离的光谱分量,其中这些光谱分量再次组合在样本中。