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    • 41. 发明授权
    • High modulation frequency light emitting device exhibiting spatial relocation of minority carriers to a non-radiative recombination region
    • US06448582B1
    • 2002-09-10
    • US09666231
    • 2000-09-21
    • Jerry M. WoodallRobert D. Koudelka
    • Jerry M. WoodallRobert D. Koudelka
    • H01L2715
    • H01L33/02B82Y10/00B82Y20/00H01S5/041H01S5/2009
    • A light emitting device is constructed so as to provide a first part that includes a source of excess minority carriers including excess electron-hole pairs; a second part, coupled to the first part, that includes a minority carrier barrier; and a third part, coupled to the second part, that includes a region that exhibits a low radiative recombination efficiency and a short minority carrier lifetime. In response to a first stimulus minority carriers are constrained by the second part to remain in the first part, leading to an increase of minority carrier radiative recombination in the first part and an increase in light emission; while in response to a second stimulus the minority carriers are enabled to cross the minority carrier barrier of the second part to enter the third part, leading to a decrease of minority carrier radiative recombination in the first part and a decrease in light emission. In certain embodiments the first stimulus includes an absence of an electrical signal applied between the second part and the third part, and the second stimulus comprises a presence of the electrical signal applied between the second part and the third part. In other embodiments the first stimulus includes a change in an electric field in the second part that is generated by optically induced electron-hole pairs in the second part, and the second stimulus includes an absence of the change in the electric field. In another embodiment the reverse is true. In certain embodiments the first or second stimulus can be the presence of modulating light incident on the second part and a resultant decrease in band bending. The first part can include, by example, a light emitting diode, a laser diode, a resonant cavity LED, or a vertical cavity surface emitting laser device. In another, all optical embodiment the first part includes a material that, in response to optical pumping, provides a photoluminescent emission. The second part can include a resonant tunneling structure or a potential barrier structure formed by compositional grading or impurity concentration grading. The third part can include a low temperature grown material and/or a Schottky barrier contact. It is shown that embodiments of this invention are capable of exhibiting optical gain, and an optical semiconductor light emitting device with optical gain (SLEDOG) is thus made possible.
    • 42. 发明授权
    • Method of making metal-insulator-metal junction structures with
adjustable barrier heights
    • 制造具有可调节阻挡高度的金属 - 绝缘体 - 金属结合结构的方法
    • US5019530A
    • 1991-05-28
    • US512245
    • 1990-04-20
    • Alan W. KleinsasserJerry M. Woodall
    • Alan W. KleinsasserJerry M. Woodall
    • H01L49/02H01L45/00
    • H01L45/00Y10S148/139Y10S148/14Y10S148/142
    • A method and structures are described for fabricating junctions having metal electrodes separated by polycrystalline barriers with arbitrarily-chosen but controlled barrier height and shape is accomplished by varying the composition and doping of polycrystalline multinary compound semiconductor materials in the barrier, hence varying the Fermi level pinning position such that the Fermi level is fixed and controlled at and everywhere in between the two metal-insulator interfaces. It is known that Schottky barrier heights at metal/compound semiconductor interfaces are determined by a Fermi level pinning mechanism rather than by the electronic properties of the applied metallurgy. The present invention exploits the knowledge that the same type of Fermi level pinning occurs at semiconductor dislocations and grain boundaries. The present invention uses polycrystalline compound semiconductor alloys in which the pinning position is varied over a large range in metal/semiconductor structures. The structures are composed of sandwiches of metal, compound semiconductor and metal. Tunneling currents are determined by barrier height, controlled by semiconductor alloy composition, and semiconductor thickness. The energy barrier in the polycrystalline material can be uniform throughout, due to the uniformity of pinning position at both the metal/semiconductor interface and the grain boundaries.
    • 47. 发明授权
    • Electron source
    • 电子源
    • US4352117A
    • 1982-09-28
    • US155729
    • 1980-06-02
    • Jerome J. CuomoRussell W. DreyfusJerry M. Woodall
    • Jerome J. CuomoRussell W. DreyfusJerry M. Woodall
    • H01J1/30H01J1/308H01J1/34H01L27/14
    • H01J1/308
    • A high brightness, essentially monoenergetic electron source is constructed in solid state material by providing a semiconductor body with an electron confinement barrier over most of the surface, the barrier having a relatively small opening exposing the semiconductor body, in the relatively small opening a material is placed in contact with the semiconductor body that has a work function that is lower than the energy of excited electrons in the semiconductor. In this structure electrons from hole-electron pairs generated in the semiconductor are repelled and recombination is inhibited by the barrier except in the relatively small opening where they are injected into the surrounding environment through the lower work function material. The hole-electron pair generation may be by irradiation or by electrical injection. The electron source is useful for such applications as high brightness sources, digital communications, cathode ray tube electron sources and scanning electron microscopes.
    • 通过在绝大多数表面上提供具有电子约束势垒的半导体器件,在固态材料中构造高亮度,基本上单能量的电子源,该阻挡层具有暴露半导体本体的相对较小的开口, 与具有比半导体中激发的电子的能量低的功函数的半导体本体接触。 在这种结构中,在半导体中产生的空穴 - 电子对的电子被排斥,复合被屏障抑制,除了在相对小的开口中,它们通过较低的功函数材料注入到周围环境中。 可以通过照射或电喷射来产生空穴 - 电子对。 电子源可用于高亮度源,数字通信,阴极射线管电子源和扫描电子显微镜等应用。