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    • 41. 发明授权
    • Method of cooling and lubricating a tool and/or workpiece and a working
spindle for carrying out the method
    • 冷却和润滑工具和/或工件的方法以及用于执行该方法的工作主轴
    • US06050756A
    • 2000-04-18
    • US51896
    • 1998-04-17
    • Reinhard BuchholzGunther SpathWolfgang Horn
    • Reinhard BuchholzGunther SpathWolfgang Horn
    • B23Q1/00B24B41/04B24B53/095B24B55/02B23Q11/10B23B27/10
    • B24B41/04B23Q11/1015B23Q11/1046B24B53/095B24B55/02Y10T408/03Y10T408/45Y10T408/455Y10T409/303752Y10T409/303976Y10T409/304032
    • The invention relates to a method of cooling and lubricating a metal-cutting rotating tool with a geometrically defined cutting element and/or the workpiece in the cutting zone. A coolant-lubricant and a carrier gas are fed separately into a tool shaft, brought together inside the rotating working spindle as close as possible to the cutting zone and directed via integral feed ducts onto the cutting element and/or cutting zone. Also disclosed is a device for applying this method. The coolant-lubricant and carrier gas are each introduced into a coolant reservoir completely or partially filled with a porous filler where they are mixed; the mixture is then fed directly into the cutting zone. Immediately behind the working spindle is a reservoir chamber filled completely or partially with a porous filler and comprising a substantially cylindrical closed casing with a coaxial feed aperture for the coolant-lubricant on one end face, radial feed apertures in the casing for the carrier gas and with an outlet aperture smaller than the casing diameter for the coolant-lubricant-carrier gas mixture in the end face of the casing opposite the feed aperture for the coolant-lubricant.
    • PCT No.PCT / EP96 / 04323 Sec。 371日期:1998年4月17日 102(e)1998年4月17日PCT PCT 1996年10月4日PCT公布。 公开号WO97 / 14530 日期1997年04月24日本发明涉及一种在切割区域中冷却和润滑具有几何限定的切割元件和/或工件的金属切割旋转工具的方法。 冷却剂润滑剂和载体气体被单独地供给到工具轴中,使其在旋转的工作主轴内部尽可能靠近切割区并且通过整体进料管道引导到切割元件和/或切割区上。 还公开了一种应用该方法的装置。 冷却剂润滑剂和载体气体都被全部或部分填充有多孔填料的冷却剂储存器中,在这些混合物中混合; 然后将混合物直接进料到切割区域中。 在工作主轴后面的是储存室,其完全或部分地填充有多孔填料并且包括基本上圆柱形的封闭壳体,其具有用于在一个端面上的冷却剂润滑剂的同轴进料孔,用于载气的壳体中的径向进料孔, 其出口孔径小于壳体的与冷却剂润滑剂的进料孔相对的端面中的冷却剂润滑剂载体气体混合物的壳体直径。
    • 42. 发明授权
    • Device for finish machining of bearing bores at crankcases
    • 曲轴箱轴承孔精加工装置
    • US6012880A
    • 2000-01-11
    • US203933
    • 1998-12-02
    • Wolfgang HornArmin WunderlichKlaus Faber
    • Wolfgang HornArmin WunderlichKlaus Faber
    • B23B29/02B24B33/02B23B41/12
    • B23B29/02B24B33/02Y10S408/708Y10T408/85843Y10T408/8588
    • A precise finish machining of bearing bores (25) at crankcases (26) is made feasible by way of a device with tow skid-guided spindle boxes (1, 2), the drivable spindles of which are in flush alignment. One spindle is designed as a working spindle (3) carrying a radially adjustable tool (11), while the other spindle is designed as a guide spindle (4) engaging with a guide pin (6) into a front-end bore (5) of the working spindle (3). The guide pin (6) is succeeded by a cone (7) on which the adjustable tool (11) is supported, and where a measuring key (14) is located between the cone (7) and the base (12) of the bore (5), the measuring signal from said measuring key serving for control of the distance between both spindle boxes (1, 2) and thus for control of the radial excursion of the tool (11).
    • 在曲轴箱(26)处的轴承孔(25)的精确精加工通过具有牵引滑动导向主轴箱(1,2)的装置可行,其可驱动主轴齐平。 一个主轴被设计为承载径向调节工具(11)的工作主轴(3),而另一主轴被设计为与导向销(6)接合到前端孔(5)中的导向主轴(4) 的工作主轴(3)。 引导销(6)由其上支撑有可调节工具(11)的锥体(7),其中测量键(14)位于孔(7)和孔体(12)之间, (5),来自所述测量键的测量信号用于控制两个主轴箱(1,2)之间的距离,从而用于控制工具(11)的径向偏移。
    • 44. 发明申请
    • METHOD AND APPARATUS FOR SCHEDULING A USE OF TEST RESOURCES OF A TEST ARRANGEMENT FOR THE EXECUTION OF TEST GROUPS
    • 调度使用测试资源测试资源执行测试组的方法和装置
    • US20130006567A1
    • 2013-01-03
    • US13516696
    • 2009-12-15
    • Wolfgang Horn
    • Wolfgang Horn
    • G01R31/00
    • G01R31/31907
    • A method for scheduling a use of test resources comprises obtaining an assignment of a test resource to each test group of a test flow. The test flow comprises an initial execution order. The method comprises checking for a resource conflict between an assignment of a test resource to a given test group in a test flow and an assignment of other test resources to other test groups and test flows. The other test groups are scheduled for a temporally overlapping execution with the given test group. The method comprises manipulating the test flow execution order of the test groups. The resource conflict is eliminated by performing a swap between a test group associated with the resource conflict in a test flow with a higher priority compared to a time-interval-insertion in combination with a movement, and moving the test group associated with the resource conflict to an inserted time interval.
    • 调度测试资源的使用的方法包括获得测试资源的分配给测试流的每个测试组。 测试流程包括初始执行顺序。 该方法包括检查在测试流中给定测试组的测试资源的分配与其他测试资源与其他测试组和测试流的分配之间的资源冲突。 其他测试组被安排与给定的测试组进行暂时重叠的执行。 该方法包括操纵测试组的测试流执行顺序。 通过在与移动相结合的与时间间隔插入相比具有较高优先级的测试流中与资源冲突相关联的测试组之间进行交换来消除资源冲突,以及移动与资源冲突相关联的测试组 到插入的时间间隔。
    • 48. 发明授权
    • Component arrangement and method for determining the temperature in a semiconductor component
    • 用于确定半导体部件中的温度的部件布置和方法
    • US07448797B2
    • 2008-11-11
    • US11655749
    • 2007-01-19
    • Wolfgang Horn
    • Wolfgang Horn
    • G01K7/00
    • H02H6/00G01K7/015G01K7/425G01K2003/145H01L2924/0002H02H5/044H01L2924/00
    • A component arrangement is disclosed herein comprising a temperature sensor integrated in a semiconductor body, said temperature sensor being designed to generate a first temperature signal dependent on a temperature in the semiconductor body; a control device comprising a control amplifier, which has a first and a second input and an output, and comprising a low-pass filter having an input and an output, the input of the low-pass filter being coupled to the output of the control amplifier, the first input of the control amplifier being coupled to the temperature sensor and the second input of the control amplifier being coupled to the output of the low-pass filter; and an output, which is coupled to the output of the control amplifier and at which a second temperature signal is available. A method for determining the temperature in a semiconductor component is also disclosed herein.
    • 本文公开了一种组件布置,其包括集成在半导体本体中的温度传感器,所述温度传感器被设计为产生取决于半导体本体中的温度的第一温度信号; 控制装置,包括具有第一和第二输入和输出的控制放大器,并且包括具有输入和输出的低通滤波器,所述低通滤波器的输入耦合到所述控制器的输出端 放大器,控制放大器的第一输入耦合到温度传感器,并且控制放大器的第二输入端耦合到低通滤波器的输出; 以及输出,其耦合到控制放大器的输出并且第二温度信号可用于该输出。 本文还公开了一种用于确定半导体部件中的温度的方法。
    • 50. 发明授权
    • Circuit arrangement and method for load diagnosis of a semiconductor switch
    • 半导体开关负载诊断的电路布置和方法
    • US07151462B2
    • 2006-12-19
    • US10909017
    • 2004-07-30
    • Wolfgang Horn
    • Wolfgang Horn
    • G08B21/00
    • H03K17/18H03K17/0822
    • The present invention relates to a circuit arrangement and a method for load diagnosis of a switch having a first and a second load connecting terminal. A first and a second current source arrangement are provided, which can in each case be connected to one of the load connecting terminals of the switch and which supply, depending on potential conditions at the said load connecting terminals, currents in a first and second current direction or oppositely to the said first and second current direction to the load connecting terminals. Furthermore, an evaluation circuit is provided, which evaluates the currents flowing to the first and second load connecting terminals and provides a load state signal depending on the said currents.
    • 本发明涉及具有第一和第二负载连接端子的开关的负载诊断的电路装置和方法。 提供了第一和第二电流源装置,其可以在每种情况下连接到开关的负载连接端子之一,并且根据所述负载连接端子处的潜在条件来供应第一和第二电流中的电流 方向或与所述第一和第二电流方向相反地连接到负载连接端子。 此外,提供评估电路,其评估流到第一和第二负载连接端子的电流,并根据所述电流提供负载状态信号。