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    • 42. 发明授权
    • Semiconductor programmable device
    • 半导体可编程器件
    • US08098080B2
    • 2012-01-17
    • US12919356
    • 2008-12-24
    • Kazutami Arimoto
    • Kazutami Arimoto
    • G06F7/38H01L25/00
    • H03K19/17756H03K19/1733
    • An ePLX unit includes a logic unit having an SRAM and a MUX, and a switch unit having an SRAM and a TG for establishing wiring connection in the logic unit. When a composite module is set in the first mode, an Add/Flag control unit uses the SRAMs as a data field and a flag field, respectively, to autonomously control the read address of each of the data field and the flag field in accordance with a control flag stored in the flag field. Furthermore, when the composite module is set in the second mode, the Add/Flag control unit writes configuration information into each of the SRAMs to reconfigure a logic circuit. Consequently, the granularity of the circuit configuration can be rendered variable, which allows improvement in flexibility when configuring a function.
    • ePLX单元包括具有SRAM和MUX的逻辑单元,以及具有用于在逻辑单元中建立布线连接的SRAM和TG的开关单元。 当复合模块被设置为第一模式时,加法/标志控制单元分别使用SRAM作为数据字段和标志字段,以依照下述方式自主地控制每个数据字段和标志字段的读取地址 存储在标志字段中的控制标志。 此外,当复合模块被设置为第二模式时,加法/标志控制单元将配置信息写入每个SRAM以重新配置逻辑电路。 因此,电路配置的粒度可以变化,这允许在配置功能时提高灵活性。
    • 43. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07910975B2
    • 2011-03-22
    • US10593275
    • 2005-06-03
    • Fukashi MorishitaKazutami Arimoto
    • Fukashi MorishitaKazutami Arimoto
    • H01L29/788H01L27/01H01L27/12
    • G11C11/405G11C2211/4016H01L27/108H01L27/10802
    • The present invention aims at providing a semiconductor memory device that can be manufactured by a MOS process and can realize a stable operation. A storage transistor has impurity diffusion regions, a channel formation region, a charge accumulation node, a gate oxide film, and a gate electrode. The gate electrode is connected to a gate line and the impurity diffusion region is connected to a source line. The storage transistor creates a state where holes are accumulated in the charge accumulation node and a state where the holes are not accumulated in the charge accumulation node to thereby store data “1” and data “0”, respectively. An access transistor has impurity diffusion regions, a channel formation region, a gate oxide film, and a gate electrode. The impurity diffusion region is connected to a bit line.
    • 本发明的目的在于提供一种可以通过MOS工艺制造并可实现稳定操作的半导体存储器件。 存储晶体管具有杂质扩散区域,沟道形成区域,电荷累积节点,栅极氧化膜和栅电极。 栅电极连接到栅极线,杂质扩散区连接到源极线。 存储晶体管产生在电荷累积节点中积累空穴的状态和空穴未积累在电荷累积节点中的状态,从而分别存储数据“1”和数据“0”。 存取晶体管具有杂质扩散区,沟道形成区,栅极氧化膜和栅电极。 杂质扩散区域连接到位线。
    • 45. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07480168B2
    • 2009-01-20
    • US11819583
    • 2007-06-28
    • Kazutami ArimotoHiroki Shimano
    • Kazutami ArimotoHiroki Shimano
    • G11C11/24
    • G11C7/18G11C8/14G11C11/4085G11C11/4087G11C11/4097G11C2211/4013H01L27/0207H01L27/108H01L27/1085H01L27/10873H01L27/10882
    • Conductive lines constituting word lines of memory cells and conductive lines constituting memory cell plate electrodes are formed in the same interconnecting layer in a memory device including a plurality of memory cells each including a capacitor for storing data in an electrical charge form. By forming the capacitors of the memory cells into a planar capacitor configuration, a step due to the capacitors is removed. Thus a dynamic semiconductor memory device can be formed through CMOS process, and a dynamic semiconductor memory device suitable for merging with logic is achieved. Data of 1 bit is stored by two memory cells, and data can be reliably stored even if the capacitance value of the memory cell is reduced due to the planar type capacitor.
    • 构成存储单元板的导体线的导电线和构成存储单元板电极的导线被形成在包括多个存储单元的存储器件的同一互连层中,每个存储单元均包括用于以电荷形式存储数据的电容器。 通过将存储单元的电容器形成为平面电容器配置,由于电容器而导致的步骤被去除。 因此,可以通过CMOS工艺形成动态半导体存储器件,并且实现适合于与逻辑并入的动态半导体存储器件。 1位的数据由两个存储单元存储,即使由于平面型电容器而使存储单元的电容值减小,也可以可靠地存储数据。
    • 47. 发明授权
    • Semiconductor memory device with row selection control circuit
    • 具有行选择控制电路的半导体存储器件
    • US06909658B2
    • 2005-06-21
    • US10842465
    • 2004-05-11
    • Kazutami ArimotoHiroki Shimano
    • Kazutami ArimotoHiroki Shimano
    • G11C11/403G11C11/406G11C7/00
    • G11C11/40615G11C11/406G11C2207/104
    • A self refresh timer is set constantly to an operation state to render a refresh request signal FAY active periodically. When contention occurs between the refresh request signal FAY and an externally applied read or write command, a row selection related circuit/command generation related circuit controls a row related control signal so that a refresh operation is carried out after, for example, the read or write operation ends. A submemory array SMA is divided more small than that of the conventional case, and the refresh cycle ends in a shorter period of time. Therefore, a read operation and a refresh operation can be completed within a read cycle time. A DRAM core that can be employed with control as simple as that of an SRAM can be realized.
    • 将自刷新定时器持续设置为使周期性地刷新请求信号FAY活动的操作状态。 当在刷新请求信号FAY和外部施加的读取/写入命令之间发生争用时,行选择相关电路/命令生成相关电路控制与行相关的控制信号,使得在例如读取或写入命令之后执行刷新操作 写操作结束。 子存储阵列SMA被划分为比常规情况更小的刷新周期,并且刷新周期在更短的时间段内结束。 因此,可以在读周期时间内完成读操作和刷新操作。 可以实现可以使用与SRAM的控制一样简单的DRAM内核。
    • 48. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06781915B2
    • 2004-08-24
    • US10274872
    • 2002-10-22
    • Kazutami ArimotoHiroki Shimano
    • Kazutami ArimotoHiroki Shimano
    • G11C800
    • G11C7/18G11C11/405G11C11/4097G11C2211/4013H01L27/108H01L27/10897
    • Memory cells are arranged such that one-bit data is stored by two-bit memory cells. The cell plate electrode of the memory cell capacitor and the gate electrode of the memory cell transistor are formed in the same manufacturing step. The amplitude of an isolation control signal applied to a bit line isolation gate connecting the bit line and the sense amplifier is restricted, and the word line is driven according to a negative voltage non-boosted word line scheme. A well region where a memory block is formed and a well region where the isolation gate is formed are separately provided, and separate bias voltages are applied thereto. Thus, a DRAM (dynamic random access memory)-based logic merged memory is implemented without degrading dielectric breakdown characteristics of the gate insulating film.
    • 存储单元被布置成使得一位数据由两位存储器单元存储。 存储单元电容器的单元板电极和存储单元晶体管的栅极形成在相同的制造步骤中。 施加到连接位线和读出放大器的位线隔离栅的隔离控制信号的幅度受到限制,并且字线根据负电压非升压字线方案被驱动。 形成存储块的阱区和形成隔离栅的阱区分开设置,并且分别施加偏置电压。 因此,实现基于DRAM(动态随机存取存储器)的逻辑合并存储器而不降低栅极绝缘膜的绝缘击穿特性。