专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

41. 发明申请

US20070133086A1 Method and apparatus for the examination of probes 有权
标题翻译：用于检测探针的方法和装置
公开(公告)号：US20070133086A1
公开(公告)日：2007-06-14
申请号：US11330384
申请日：2006-01-12
申请人： Stefan Wilhelm , Eva Simburger , Michael Kempe
发明人： Stefan Wilhelm , Eva Simburger , Michael Kempe
IPC分类号： G02B21/06
CPC分类号： G01N21/6458 , G02B21/0032 , G02B21/0076 , G02B21/008 , G02B21/16 , Y10S359/90
摘要： A method in which probes are examined by means a microscope. For an illuminated sample, spatially coherent light with at least one continuous wavelength range or a continuously tunable wavelength range is generated, and one or more wavelengths or wavelength ranges in the illumination light are selected in dependence on the prespecified method of examination. The probe is then illuminated with the illumination light with the selected wavelengths or wavelength ranges, the illumination light and the emission light coming from the probe are then subsequently separated, whereby the back radiated illumination light is suppressed in the detection beam before the detection and the emission light is detected. In such a method, the selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the separation of the detection light and the illumination light and the suppression of the illumination light in such a manner that a prespecified control variable (R) is optimized.
摘要翻译：通过显微镜检查探针的方法。对于照明样品，产生具有至少一个连续波长范围或连续可调波长范围的空间相干光，并且根据预先指定的检查方法来选择照明光中的一个或多个波长或波长范围。然后用所选择的波长或波长范围的照明光照射探针，随后分离照明光和来自探针的发射光，从而在检测之前在检测光束中抑制背面照射的照明光，并且检测出发光。在这种方法中，通过检测光和照明光的分离以及照明光的抑制来调节照明光的波长或波长范围的选择，使得预先指定的控制变量（ R）优化。

42. 发明授权

US07212337B2 Arrangement in the illumination beam path of a laser scanning microscope 有权
标题翻译：激光扫描显微镜的照明光束路径的布置
公开(公告)号：US07212337B2
公开(公告)日：2007-05-01
申请号：US10888098
申请日：2004-07-09
申请人： Ralph Lange , Stefan Wilhelm , Ulrich Meisel , Matthias Reich
发明人： Ralph Lange , Stefan Wilhelm , Ulrich Meisel , Matthias Reich
IPC分类号： G02B21/06
CPC分类号： G02B21/002
摘要： An arrangement in the illumination beam path of a laser scanning microscope, comprising a mirror which can be introduced into the beam path for coupling in at least one additional wavelength, and a method for the operation of a laser scanning microscope with a mirror which can be swiveled in rapidly for coupling at least one additional wavelength into the illumination beam path, wherein the swiveling process is synchronized with the illumination control by a control unit in such a way that at least one additional wavelength is coupled into the illumination beam path when the mirror is swiveled out.
摘要翻译：激光扫描显微镜的照明光束路径中的布置，包括可以被引入到光束路径中用于耦合到至少一个附加波长的反射镜，以及用于具有镜子的激光扫描显微镜的操作方法，所述反射镜可以是快速旋转以将至少一个附加波长耦合到照明光束路径中，其中旋转过程与控制单元的照明控制同步，使得当镜子耦合至少一个附加波长到照明光束路径时被旋转出来

43. 发明申请

US20060255237A1 Arrangement for the detection of illumination radiation in a laser scanning microscope 有权
公开(公告)号：US20060255237A1
公开(公告)日：2006-11-16
申请号：US11487936
申请日：2006-07-17
申请人： Thomas Mehner , Stefan Wilhelm , Ulrich Meisel , Mirko Liedtke
发明人： Thomas Mehner , Stefan Wilhelm , Ulrich Meisel , Mirko Liedtke
IPC分类号： G02B27/40
CPC分类号： G02B21/0032 , G02B21/008
摘要： An arrangement for the detection of the illumination radiation in a laser scanning microscope, wherein a portion of the illumination radiation is coupled out and detected at the main color splitter, wherein light transmitted through the main color splitter is advantageously detected and/or a portion of the illumination radiation is coupled out and detected before coupling into a light-conducting fiber and/or a portion of the illumination radiation is coupled out and detected at a beam splitter arranged downstream of a light-conducting fiber.

44. 发明申请

US20060012864A1 Raster scanning light microscope with line pattern scanning and applications 审中-公开
标题翻译：光栅扫描光学显微镜与线图扫描和应用
公开(公告)号：US20060012864A1
公开(公告)日：2006-01-19
申请号：US10967316
申请日：2004-10-19
申请人： Joerg-Michael Funk , Ralf Wolleschensky , Bernhard Zimmermann , Stefan Wilhelm , Ralf Engelmann
发明人： Joerg-Michael Funk , Ralf Wolleschensky , Bernhard Zimmermann , Stefan Wilhelm , Ralf Engelmann
IPC分类号： G02B21/06
CPC分类号： G02B21/002 , G02B21/0032
摘要： Raster Scanning Light Microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
摘要翻译：光栅扫描光显微镜，其具有至少一个照明模块的线图案扫描，其中实现将激光可变分割成最少两个照明通道的手段，并且在相同或不同的区域发生样品的联合照明的样品。

45. 发明申请

US20060011857A1 Raster scanning light microscope with line pattern scanning and applications 审中-公开
公开(公告)号：US20060011857A1
公开(公告)日：2006-01-19
申请号：US10967325
申请日：2004-10-19
申请人： Joerg-Michael Funk , Ralf Wolleschensky , Bernhard Zimmermann , Stefan Wilhelm , Ralf Engelmann
发明人： Joerg-Michael Funk , Ralf Wolleschensky , Bernhard Zimmermann , Stefan Wilhelm , Ralf Engelmann
IPC分类号： G01N21/64
CPC分类号： G02B21/0032
摘要： Raster Scanning Light Microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.

46. 发明申请

US20060011824A1 Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point 失效
标题翻译：用光斑显微镜观察至少一个样品区域的过程，该光栅显微镜具有点状形式的光分布
公开(公告)号：US20060011824A1
公开(公告)日：2006-01-19
申请号：US10967636
申请日：2004-10-19
申请人： Ralf Engelmann , Joerg-Michael Funk , Joerg Steinert , Bernhard Zimmermann , Stefan Wilhelm , Joerg Engel , Ulrich Meisel
发明人： Ralf Engelmann , Joerg-Michael Funk , Joerg Steinert , Bernhard Zimmermann , Stefan Wilhelm , Joerg Engel , Ulrich Meisel
IPC分类号： H01J40/14 , H01J7/24
CPC分类号： G02B21/002 , G02B21/0044 , G02B21/0064 , G02B21/008 , G02B21/248
摘要： Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.
摘要翻译：用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样本区域的过程，其中照明光平行照射样本在多个点或区域处，同时检测多个点或区域，其中相对于相对运动的平面成一角度，优选垂直于其，第二扫描装置被移动，并且通过第一和第二扫描装置被耦合，并且通过样品的照射来完成三维采样运动，其中第二扫描装置以这样的方式耦合到第一扫描装置的运动，使得直线和/或曲线和/或平面和/或扫描沿着第一扫描线的至少一个扫描方向延伸的曲面 g装置以及沿着第二扫描装置的扫描方向。

47. 发明申请

US20060011804A1 Process for the observation of at least one sample region with a light raster microscope with linear sampling 有权
标题翻译：用线性采样的光栅显微镜观察至少一个样品区域的方法
公开(公告)号：US20060011804A1
公开(公告)日：2006-01-19
申请号：US10967341
申请日：2004-10-19
申请人： Ralf Engelmann , Joerg-Michael Funk , Joerg Steinert , Bernhard Zimmermann , Stefan Wilhelm , Joerg Engel , Ulrich Meisel
发明人： Ralf Engelmann , Joerg-Michael Funk , Joerg Steinert , Bernhard Zimmermann , Stefan Wilhelm , Joerg Engel , Ulrich Meisel
IPC分类号： G02B27/40
CPC分类号： G02B21/008 , G02B21/0036 , Y10S359/90
摘要： Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.
摘要翻译：用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样品区的方法，其中几个照亮的样品点位于一条线上并且与空间分辨检测器同时检测器，其中相对于相对运动的平面，优选地与其垂直的平面移动第二扫描装置，并且通过耦合的第一和第二扫描装置的运动和三维采样运动通过样品的照射来完成，其中第二扫描装置以扫描直线和/或曲线和/或平面和/或曲面扫描的方式与第一扫描装置的运动耦合其沿着第一扫描装置的至少一个扫描方向以及沿着第一扫描装置的至少一个扫描方向延伸第二扫描装置的扫描方向。

48. 发明申请

US20050035281A1 Arrangement for the detection of illumination radiation in a laser scanning microscope 审中-公开
标题翻译：在激光扫描显微镜中检测照射辐射的布置
公开(公告)号：US20050035281A1
公开(公告)日：2005-02-17
申请号：US10888260
申请日：2004-07-09
申请人： Thomas Mehner , Stefan Wilhelm , Ulrich Meisel , Mirko Liedtke
发明人： Thomas Mehner , Stefan Wilhelm , Ulrich Meisel , Mirko Liedtke
IPC分类号： G02B21/06 , G02B21/00 , H01J3/14 , G02F1/01 , H01J5/16
CPC分类号： G02B21/0032 , G02B21/008
摘要： An arrangement for the detection of the illumination radiation in a laser scanning microscope, wherein a portion of the illumination radiation is coupled out and detected at the main color splitter, wherein light transmitted through the main color splitter is advantageously detected and/or a portion of the illumination radiation is coupled out and detected before coupling into a light-conducting fiber and/or a portion of the illumination radiation is coupled out and detected at a beam splitter arranged downstream of a light-conducting fiber.
摘要翻译：一种用于在激光扫描显微镜中检测照射辐射的装置，其中照射辐射的一部分耦合到主分色器并在主分色器处被检测，其中有利地检测透过主分色器的光和/或部分照射辐射在耦合到导光纤维之前被耦合出来并被检测，并且/或者一部分照射辐射被耦合出来，并在布置在导光纤维下游的分束器处被检测。

49. 发明授权

US06848825B1 Laser scanning microscope with AOTF 有权
标题翻译：激光扫描显微镜与AOTF
公开(公告)号：US06848825B1
公开(公告)日：2005-02-01
申请号：US09238859
申请日：1999-01-28
申请人： Ulrich Simon , Stefan Wilhelm
发明人： Ulrich Simon , Stefan Wilhelm
IPC分类号： G01K11/22 , G01B11/00 , G01N21/27 , G02B21/00
CPC分类号： G02B21/002
摘要： A laser scanning microscope with an AOTF in the laser input-coupling beam comprises a temperature gauge provided in the environment of the AOTF or in the vicinity thereof or connected therewith. A laser scanning microscope with an AOTF in the laser input-coupling beam path comprises that the AOTF and/or its environment are/is heated or cooled.
摘要翻译：在激光输入耦合光束中具有AOTF的激光扫描显微镜包括设置在AOTF环境中或其附近或与其相连的温度计。在激光输入耦合光束路径中具有AOTF的激光扫描显微镜包括AOTF和/或其环境被加热或冷却。

50. 发明授权

US06665068B1 Arrangement for wavelength-dependent adjustment of light beam 失效
标题翻译：光束波长依赖调整的布置
公开(公告)号：US06665068B1
公开(公告)日：2003-12-16
申请号：US09687124
申请日：2000-10-13
申请人： Guenter Schoeppe , Stefan Wilhelm
发明人： Guenter Schoeppe , Stefan Wilhelm
IPC分类号： G01J302
CPC分类号： G02B27/283
摘要： An arrangement for wavelength-dependent adjustment of light beam, preferably laser radiation of different wavelengths, preferably in a laser scanning microscope, wherein the light beam is split by a dispersive element and reaches a concave mirror, and an adjustable device for at least partially cutting out individual wavelengths or wavelength ranges of the incident and/or reflected beam is located in front of the concave mirror.
摘要翻译：优选在激光扫描显微镜中的光束的波长依赖性调节的优选激光辐射的布置，其中光束被分散元件分裂并到达凹面镜，以及用于至少部分切割的可调整装置入射和/或反射光束的各个波长或波长范围位于凹面镜的前面。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式