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    • 42. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08427280B2
    • 2013-04-23
    • US13177583
    • 2011-07-07
    • Yoshiyuki KurokawaTakayuki IkedaMasami EndoHiroki DemboDaisuke KawaeTakayuki Inoue
    • Yoshiyuki KurokawaTakayuki IkedaMasami EndoHiroki DemboDaisuke KawaeTakayuki Inoue
    • H04Q5/22
    • G06K19/07749
    • In a case where an ASK method is used for a communication method between a semiconductor device and a reader/writer, the amplitude of a radio signal is changed by data transmitted from the semiconductor device to the reader/writer when data is not transmitted from the reader/writer to the semiconductor device. Therefore, in some cases, the semiconductor device mistakes data transmitted from the semiconductor device itself for data transmitted from the reader/writer to the semiconductor device. The semiconductor device includes an antenna circuit, a transmission circuit, a reception circuit, and an arithmetic processing circuit. The antenna circuit transmits and receives a radio signal. The transmission circuit outputs to the reception circuit a signal showing whether or not the antenna circuit is transmitting the radio signal.
    • 在使用ASK方式进行半导体装置与读取器/写入器之间的通信方式的情况下,通过从半导体装置发送到读取器/写入器的数据,无线信号的振幅由数据不从 读取器/写入器到半导体器件。 因此,在某些情况下,半导体器件将从半导体器件本身发送的数据错误地从读取器/写入器发送到半导体器件的数据。 半导体器件包括天线电路,发送电路,接收电路和运算处理电路。 天线电路发送和接收无线电信号。 发送电路向接收电路输出表示天线电路是否正在发送无线信号的信号。
    • 47. 发明授权
    • Image acquiring apparatus, image acquiring method, and image acquiring program
    • 图像获取装置,图像获取方法和图像获取程序
    • US08126250B2
    • 2012-02-28
    • US11477802
    • 2006-06-30
    • Jeremy CookeTakayuki Inoue
    • Jeremy CookeTakayuki Inoue
    • G06K9/00
    • G02B21/367
    • A semi-automatic mode according to which an operator makes a necessary confirmation when an image pickup condition for a micro image is set with reference to a macro image is provided in controlling the acquisition of the macro image, the setting of the image pickup condition, and the acquisition of the micro image with respect to each of a plurality of samples S stored in a sample storage unit 11, and in the semi-automatic mode, the sample S whose macro image has been acquired by a macro image acquiring unit 20 is placed at a standby position without being moved directly to an image acquiring position for a micro image acquiring unit 30. According to this structure, image acquisition with respect to each of the samples S can be efficiently performed, and an operational burden imposed on the operator is reduced. Accordingly, it becomes possible to realize an image acquiring apparatus, an image acquiring method, and an image acquiring program each of which is capable of performing image acquisition with respect to each of the samples with high efficiency.
    • 提供一种半自动模式,当在宏观图像上设置用于微图像的图像拾取条件时,操作者进行必要的确认,以控制宏图像的获取,图像拾取条件的设置, 并且相对于存储在采样存储单元11中的多个采样S中的每一个采集微图像,并且在半自动模式中,宏图像获取单元20获取的宏图像的采样S是 放置在待机位置而不被直接移动到用于微图像获取单元30的图像获取位置。根据该结构,可以有效地执行关于每个样本S的图像获取,并且对操作者施加操作负担 降低了。 因此,可以实现能够以高效率对每个样本进行图像获取的图像获取装置,图像获取方法和图像获取程序。
    • 49. 发明申请
    • Semiconductor Device and Method for Manufacturing the Same
    • 半导体装置及其制造方法
    • US20100258802A1
    • 2010-10-14
    • US12754393
    • 2010-04-05
    • Hiromichi GODOTakayuki INOUE
    • Hiromichi GODOTakayuki INOUE
    • H01L29/786H01L21/336
    • H01L29/7869H01L27/1225
    • An object is to provide an n-channel transistor and a p-channel transistor having a preferred structure using an oxide semiconductor. A first source or drain electrode which is electrically connected to a first oxide semiconductor layer and is formed using a stacked-layer structure including a first conductive layer containing a first material and a second conductive layer containing a second material, and a second source or drain electrode which is electrically connected to a second oxide semiconductor layer and is formed using a stacked-layer structure including a third conductive layer containing the first material and a fourth conductive layer containing the second material are included. The first oxide semiconductor layer is in contact with the first conductive layer of the first source or drain electrode, and the second oxide semiconductor layer is in contact with the third and the fourth conductive layers of the second source or drain electrode.
    • 目的是提供使用氧化物半导体的具有优选结构的n沟道晶体管和p沟道晶体管。 第一源极或漏极,其电连接到第一氧化物半导体层,并且使用包括包含第一材料的第一导电层和包含第二材料的第二导电层的堆叠层结构形成,以及第二源极或漏极 电连接到第二氧化物半导体层并且使用包括包含第一材料的第三导电层和包含第二材料的第四导电层的层叠结构形成的电极。 第一氧化物半导体层与第一源极或漏极的第一导电层接触,并且第二氧化物半导体层与第二源极或漏极的第三导电层和第四导电层接触。