专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

41. 发明授权

US10928194B2 Method of identifying a communication protocol to use with a host device by a probe 有权
公开(公告)号：US10928194B2
公开(公告)日：2021-02-23
申请号：US16097926
申请日：2017-05-03
申请人： Marposs Societa' Per Azioni
发明人： Davide Castaldini , Paolo Lombardo , Roberto Bruni
IPC分类号： G01B21/04 , H04L29/06
摘要： Method for self-recognition, by a probe, of a communication protocol to be used to communicate with a base station (7), the probe (4) being configured to emulate a plurality of communication protocols featuring respective activation procedures. Each activation procedure allows the base station to activate the probe to perform a checking cycle. According to the method, in consequence of a command given by a user by means of hardware interfaces (5,15,16) of the probe, the probe is set in a search state (100-105) where all the activation procedures are attempted and it is identified which of the activation procedures is completed positively. Then, the probe is switched to an operative state (201-205) based on the communication protocol featuring the identified activation procedure. Preferably, the activation procedure is identified after a predetermined number (N) of positive conclusions have occurred.

42. 发明授权

US10396487B2 Measuring and/or checking system including at least two units, and method to connect such units 有权
公开(公告)号：US10396487B2
公开(公告)日：2019-08-27
申请号：US15755825
申请日：2016-08-31
申请人： Marposs Societa′ Per Azioni
发明人： Antonio De Renzis , Michele Gulinelli , Manrico Quadrelli
IPC分类号： H01R43/01 , H01R13/502 , H01R4/2433 , H05K7/14 , H01R13/516 , H01R13/66 , H01R43/26
摘要： A measuring and/or control system (1), to control for example a machine tool, comprises at least a first and a second unit, each comprising electronic circuits and at least one socket. The systems further includes a multipolar cable (8) containing a plurality of wires (8A) and having a first and a second end, each provided with a multipolar connector (9) adapted to be coupled to a socket of the first unit and second unit. At least one of the multipolar connectors of the multipolar cable is a fast wiring multipolar connector (12) provided with a first body (12A) and a second body (12B), adapted to be plugged into the first body. The first body comprises a support with two opposite faces, a first group of electrical contacts fixed to one of the faces of the support and adapted to be coupled to one of the sockets of the first or second unit, and a second group of electrical contacts fixed to the other face of the support. The second body comprises a frame with a plurality of seats (12S), a plurality of perforating electrical contacts (12P) that are adapted to be coupled to the second group of contacts of the first group, are housed in the seats, and are configured to perforate an insulating sheath which covers the wires (8A) and to fasten and electrically connect the wires and the perforating electrical contacts to each other, and a plurality of movable elements (12D) coupled to the frame and adapted to cooperate, in the seats, with the wires housed in the multipolar cable (8) in order to fasten and electrically connect the wires (8A) and the perforating electrical contacts (12P) to each other.

43. 发明申请

US20180331457A1 MEASURING AND/OR CHECKING SYSTEM INCLUDING AT LEAST TWO UNITS, AND METHOD TO CONNECT SUCH UNITS 审中-公开
公开(公告)号：US20180331457A1
公开(公告)日：2018-11-15
申请号：US15755825
申请日：2016-08-31
申请人： Marposs Societa' Per Azioni
发明人： Antonio De Renzis , Michele Gulinelli , Manrico Quadrelli
IPC分类号： H01R13/502 , H01R13/516 , H01R4/2433 , H01R43/01 , H01R43/26 , H01R13/66 , H05K7/14
CPC分类号： H01R13/502 , H01R4/2433 , H01R13/516 , H01R13/6691 , H01R43/01 , H01R43/26 , H05K7/1468 , H05K7/1469 , H05K7/1472
摘要： A measuring and/or control system (1), to control for example a machine tool, comprises at least a first and a second unit, each comprising electronic circuits and at least one socket. The systems further includes a multipolar cable (8) containing a plurality of wires (8A) and having a first and a second end, each provided with a multipolar connector (9) adapted to be coupled to a socket of the first unit and second unit. At least one of the multipolar connectors of the multipolar cable is a fast wiring multipolar connector (12) provided with a first body (12A) and a second body (12B), adapted to be plugged into the first body. The first body comprises a support with two opposite faces, a first group of electrical contacts fixed to one of the faces of the support and adapted to be coupled to one of the sockets of the first or second unit, and a second group of electrical contacts fixed to the other face of the support. The second body comprises a frame with a plurality of seats (12S), a plurality of perforating electrical contacts (12P) that are adapted to be coupled to the second group of contacts of the first group, are housed in the seats, and are configured to perforate an insulating sheath which covers the wires (8A) and to fasten and electrically connect the wires and the perforating electrical contacts to each other, and a plurality of movable elements (12D) coupled to the frame and adapted to cooperate, in the seats, with the wires housed in the multipolar cable (8) in order to fasten and electrically connect the wires (8A) and the perforating electrical contacts (12P) to each other.

44. 发明授权

US09879978B2 Method and apparatus for optically checking by interferometry the thickness of an object being machined 有权
公开(公告)号：US09879978B2
公开(公告)日：2018-01-30
申请号：US14905541
申请日：2014-07-24
申请人： MARPOSS SOCIETA' PER AZIONI
发明人： Stefano Pareschi
IPC分类号： G01B11/06 , G01B9/02 , B24B49/12 , B24B37/013 , H01L21/66
CPC分类号： G01B11/06 , B24B37/013 , B24B49/12 , G01B9/02021 , G01B9/02025 , G01B9/02044 , G01B9/0209 , G01B11/0675 , H01L22/12 , H01L22/26
摘要： A method for optically checking by interferometry the thickness of an object (2) being machined comprises a phase of direct checking wherein the spectrum of the result of interference between primary reflected radiations (R1) generated by reflection of incident radiations (I) on an external surface (16) and secondary reflected radiations (R2) generated by reflection on an internal surface of discontinuity (17) of the object is analyzed, and a preliminary phase wherein information relative to the variation of a virtual thickness (D) delimited and defined by a reference surface (18) and the external surface of the object, indicative of thickness variations of the object being machined. In the preliminary phase, the processing is based on the analysis of the spectrum of the result of interference between primary reflected radiations and reference reflected radiations (Rref) generated by the reflection of the incident radiations on the reference surface, that defines the length of a reference optical path. An apparatus that implements such method for optically checking includes an optical probe (6) that receives and detects the primary, secondary and reference reflected radiations, and a spectrometer (5) that analyzes the spectrum of the result of interference.

45. 发明授权

US09874430B2 Touch probe and relative circuits and methods for signal processing 有权
公开(公告)号：US09874430B2
公开(公告)日：2018-01-23
申请号：US14908788
申请日：2014-07-30
申请人： Marposs Societa' Per Azioni
发明人： Roberto Padovani , Daniele Dondi
IPC分类号： G01B7/00 , G01B7/012 , G01B21/04 , G01B5/012
CPC分类号： G01B7/012 , G01B5/012 , G01B21/047
摘要： A probe (100) comprises a frame (2), a movable armset (3) and a processing circuit (30; 30′) for processing signals. The processing circuit is able to individually detect the state of contacts (13) defined by the cooperation between mechanical elements of the armset and mechanical elements of the frame, that is the closing or opening of the contacts, and provide a signal indicative of a rest position of the probe when it detects no more than one open contact. A method for processing signals uses said circuit in order to provide a signal indicative of a rest position of the probe. The circuit and the method for processing signals are advantageously implemented for processing the output signals of a touch probe adapted to check dimensions or position of a workpiece in coordinate measuring machines and machine tools.

46. 发明授权

US08601704B2 Measuring and checking apparatus 有权
标题翻译：测量和检查装置
公开(公告)号：US08601704B2
公开(公告)日：2013-12-10
申请号：US13254341
申请日：2010-03-25
申请人： Mauriziò Dalla Casa
发明人： Mauriziò Dalla Casa
IPC分类号： G01B3/46 , G01B5/12
CPC分类号： G01B3/46 , G01B5/12 , G01B2210/58
摘要： A plug gauge (1) includes a support and protection frame with a handle (2) that defines a longitudinal axis and houses a position transducer (25) and electronic devices for wirelessly transmitting electrical signals indicative of a dimension to be checked. The gauge also comprises a probe (6) including a mechanical armset (7) provided with at least one movable feeler (10), and a transmission mechanism with a stem (17) transmitting movements of the feeler to the position transducer housed in the handle. The probe is connected to the handle by means of a quick coupling mechanism (5) with deformable locking portions (52), the radial arrangement of which is controlled by a clamping element (60).
摘要翻译：塞规（1）包括具有限定纵向轴线的手柄（2）的支撑和保护框架，并且容纳位置传感器（25）和用于无线地传送指示要检查的尺寸的电信号的电子设备。仪表还包括探针（6），其包括设置有至少一个可移动触针（10）的机械臂组（7），以及具有杆（17）的传动机构，所述杆（17）将探测器的运动传递到容纳在手柄中的位置传感器。探针通过具有可变形锁定部分（52）的快速联接机构（5）连接到手柄，其径向布置由夹紧元件（60）控制。

47. 发明申请

US20130045663A1 METHOD AND APPARATUS FOR OPTICALLY MEASURING BY INTERFEROMETRY THE THICKNESS OF AN OBJECT 有权
标题翻译：通过干涉测量物体的厚度进行光学测量的方法和装置
公开(公告)号：US20130045663A1
公开(公告)日：2013-02-21
申请号：US13643518
申请日：2011-05-17
申请人： Dino Galletti , Domenico Malpezzi
发明人： Dino Galletti , Domenico Malpezzi
IPC分类号： B24B49/12 , G01B11/06 , H01L21/463
CPC分类号： B24B7/228 , B24B37/013 , B24B49/12 , G01B11/0675 , G01B11/0683
摘要： Methods and apparatuses are used for optically measuring by interferometry the thickness (T) of an object (2) such as a slice of semiconductor material. Readings of the object thickness by optical interferometry are carried out, rough thickness values (RTW) are obtained and frequencies, indicating how often the rough thickness values occur, are evaluated. A limited set of adjacent rough thickness values whose frequency integration or summation represents an absolute maximum is identified, and the actual value of the thickness of the object is determined as a function of the rough thickness values belonging to said limited set of values. The rough thickness values can be divided up into classes (C) with corresponding frequencies (F), and in this case, a preponderant group (Gmax) of thickness classes is identified as the above-mentioned limited set of adjacent rough thickness. A lower reject threshold (Rmin) and a higher reject threshold (Rmax) that define a searching interval including the actual value of the object thickness are also determined, and all the rough thickness values that are outside the searching interval are eliminated from further processing. When measuring the object during a surface machining, the reject thresholds are progressively and automatically updated as a function of a gradual thickness reduction that the object undergoes.
摘要翻译：方法和装置用于通过干涉测量诸如半导体材料片的物体（2）的厚度（T）进行光学测量。通过光学干涉测量读取物体厚度，获得粗糙厚度值（RTW），并且评估表示粗糙厚度值出现频率的频率。识别频率积分或求和表示绝对最大值的有限的相邻粗糙厚度值集，并且确定物体的厚度的实际值作为属于所述有限值集合的粗糙厚度值的函数。粗糙度值可以分为具有相应频率（F）的类别（C），在这种情况下，厚度等级的优势组（Gmax）被识别为上述有限的相邻粗糙厚度集合。还确定定义包括对象厚度的实际值的搜索间隔的较低拒绝阈值（Rmin）和较高拒绝阈值（Rmax），并且从进一步处理中消除在搜索间隔之外的所有粗糙厚度值。当在表面加工期间测量物体时，拒绝阈值将随着物体经历的逐渐减小厚度而逐渐自动更新。

48. 发明申请

US20110314685A1 MEASURING AND CHECKING APPARATUS 有权
标题翻译：测量和检查装置
公开(公告)号：US20110314685A1
公开(公告)日：2011-12-29
申请号：US13254341
申请日：2010-03-25
申请人： Maurizio Dalla Casa
发明人： Maurizio Dalla Casa
IPC分类号： G01B3/46
CPC分类号： G01B3/46 , G01B5/12 , G01B2210/58
摘要： A plug gauge (1) includes a support and protection frame with a handle (2) that defines a longitudinal axis and houses a position transducer (25) and electronic devices for wirelessly transmitting electrical signals indicative of a dimension to be checked. The gauge also comprises a probe (6) including a mechanical armset (7) provided with at least one movable feeler (10), and a transmission mechanism with a stem (17) transmitting movements of the feeler to the position transducer housed in the handle. The probe is connected to the handle by means of a quick coupling mechanism (5) with deformable locking portions (52), the radial arrangement of which is controlled by a clamping element (60).
摘要翻译：塞规（1）包括具有限定纵向轴线的手柄（2）的支撑和保护框架，并且容纳位置传感器（25）和用于无线地传送指示要检查的尺寸的电信号的电子设备。仪表还包括探针（6），其包括设置有至少一个可移动触针（10）的机械臂组（7），以及具有杆（17）的传动机构，所述杆（17）将探测器的运动传递到容纳在手柄中的位置传感器。探针通过具有可变形锁定部分（52）的快速联接机构（5）连接到手柄，其径向布置由夹紧元件（60）控制。

49. 发明授权

US07775101B2 Dynamic gear inspection system 有权
标题翻译：动态齿轮检测系统
公开(公告)号：US07775101B2
公开(公告)日：2010-08-17
申请号：US11833553
申请日：2007-08-03
申请人： Roberto Baruchello
发明人： Roberto Baruchello
IPC分类号： G01M13/02 , G01M13/00
CPC分类号： G01M13/021
摘要： A universal dynamic gear quality and consistency verification inspection system and method is provided. The system and method provides a dynamic gear verification inspection station including a Double Flank master gear and a probe for inspecting gear features and an electronic plug having pre-reference pads and mechanical rests for supporting and locating the part to be inspected. The probes are provided to verify all angles and functional parameters relayed to appropriate software for evaluation and record maintenance. A probe may also be provided for face checking.
摘要翻译：提供了通用的动态齿轮质量和一致性验证检查系统和方法。该系统和方法提供了一个动态齿轮验证检查站，包括一个双叶片主齿轮和用于检查齿轮特征的探针，以及一个具有预参考焊盘和机械支架的电子插头，用于支撑和定位待检测部件。提供探头以验证所有角度和功能参数都被传递到适当的软件进行评估和记录维护。还可以提供用于面部检查的探针。

50. 发明授权

US07355727B2 Method and system for checking the position of a mechanical part with a light beam 有权
标题翻译：用光束检查机械部件的位置的方法和系统
公开(公告)号：US07355727B2
公开(公告)日：2008-04-08
申请号：US10567831
申请日：2004-09-13
申请人： Andrea Turrini
发明人： Andrea Turrini
IPC分类号： G01B11/14
CPC分类号： B23Q17/24 , B23Q17/22
摘要： A method and a system for checking the position of a mechanical part (2), for example a tool of a lathe, along a checking direction (X), employs an optoelectronic device (1) with a laser beam (7) and a sensor (8) for detecting the interruption of the beam. Mutual displacements between the part to be checked and the optoelectronic device within a checking area (13) are controlled according to a sequence including linear inspection movements (30) along a direction (Z) perpendicular to the checking direction and at inspection positions (Pi;P1-P4). The inspection positions are spaced apart along the checking direction at progressively decreasing mutual distances (D), according to a sequence that converges to the searched position (PN).
摘要翻译：沿着检查方向（X）检查机械部件（2）（例如车床的工具）的位置的方法和系统使用具有激光束（7）和传感器（7）的光电子器件（1）（8），用于检测光束的中断。根据包括沿着与检查方向垂直的方向（Z）的线性检测运动（30）的顺序以及检查位置（Pi; 3），检查检查区域和检查区域（13）内的光电子器件之间的相互位移被控制。 P 1 -P 4）。根据收敛到搜索位置（PN）的顺序，检查位置沿着检查方向以逐渐减小的相互距离（D）间隔开。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式