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    • 36. 发明授权
    • Method of fabricating epitaxially deposited ohmic contacts using group II-V
I
    • 使用II-VI族半导体材料制造外延沉积的欧姆接触的方法
    • US5366927A
    • 1994-11-22
    • US128634
    • 1993-09-28
    • Jan F. Schetzina
    • Jan F. Schetzina
    • H01L21/443H01L33/00H01L33/28H01L33/40H01S5/02H01S5/042H01S5/183H01S5/327H01L21/20
    • H01L33/40B82Y20/00H01L21/443H01L33/0083H01L33/28H01S5/0421H01S5/0215H01S5/183H01S5/3095H01S5/3215H01S5/327H01S5/347Y10S148/064Y10S438/936
    • An ohmic contact to a p-type zinc selenide (ZnSe) layer in a Group II-VI semiconductor device, includes a zinc telluride selenide (ZnTe.sub.x Se.sub.1-x) layer on the zinc selenide layer, a mercury selenide (HgSe) layer on the zinc telluride selenide layer and a conductor (such as metal) layer on the mercury selenide layer. The zinc telluride selenide and mercury selenide layers between the p-type zinc selenide and the conductor layer provide an ohmic contact by eliminating the band offset between the wide bandgap zinc selenide and the conductor. Step graded, linear graded, and parabolic graded layers of zinc telluride selenide may be provided. An integrated heterostructure is formed by epitaxially depositing the ohmic contact on the Group II-VI device. A removable overcoat layer may be formed on the Group II-VI device to allow room temperature atmospheric pressure transfer of the device from a zinc based deposition chamber to a mercury based deposition chamber, for deposition of the ohmic contact. A large area emitter may be formed by limiting the thickness of the mercury selenide layer so that optical radiation passes therethrough. A high efficiency optical emitter may be provided by using zinc telluride selenide or zinc sulfur telluride selenide to form an isoelectronic trap which produces broad and intense light output in the blue/green region.
    • 与II-VI族半导体器件中的p型硒化锌(ZnSe)层的欧姆接触包括在硒化锌层上的碲化锌硒化锌(ZnTexSe1-x)层,锌上的汞硒化物(HgSe)层 硒化碲层和汞硒化物层上的导体(如金属)层。 p型硒化锌与导体层之间的碲化锌硒化物和硒化汞层通过消除宽带隙硒化锌与导体之间的带偏移而提供欧姆接触。 可以提供步骤分级,线性分级和碲化锌硒化物的抛物线分级层。 通过外延沉积II-VI族元件上的欧姆接触来形成集成的异质结构。 可以在II-VI族装置上形成可移除的外涂层,以使装置的室温大气压力从锌基沉积室转移到基于汞的沉积室,用于沉积欧姆接触。 可以通过限制硒化汞层的厚度使得光学辐射通过其中而形成大面积发射极。 可以通过使用碲化镉硒或碲化碲硒化物来形成高效光发射器,以形成在蓝/绿区域产生宽而强的光输出的等电子阱。
    • 37. 发明授权
    • Inverted integrated heterostructure of group II-VI semiconductor
materials including epitaxial ohmic contact and method of fabricating
same
    • 包括外延欧姆接触的II-VI族半导体材料的反向集成异质结构及其制造方法
    • US5351255A
    • 1994-09-27
    • US54040
    • 1993-04-28
    • Jan F. Schetzina
    • Jan F. Schetzina
    • H01L29/43H01L21/28H01L21/443H01L33/00H01L33/28H01L33/40H01S5/02H01S5/042H01S5/183H01S5/327H01S3/19
    • H01L33/40B82Y20/00H01L21/443H01L33/0083H01L33/28H01S5/0421H01S5/0215H01S5/183H01S5/3095H01S5/327H01S5/347
    • An inverted integrated heterostructure includes an optical emission heterostructure formed of Group II-VI compound semiconductor materials having first and second opposing faces and including a layer of p-type zinc selenide or an alloy thereof at the first face. A zinc mercury selenide or a zinc telluride selenide layer is formed on the layer of p-type zinc selenide or an alloy thereof, and a mercury selenide layer is formed on the zinc mercury selenide or zinc telluride selenide layer, opposite the optical emission heterostructure. An ohmic electrode is formed on the mercury selenide layer opposite the zinc mercury selenide or a zinc telluride selenide layer, and a transparent ohmic electrode is formed on the second face of the optical emission heterostructure for allowing optical emissions from the optical emission heterostructure to pass therethrough. The ohmic electrode is preferably an optically reflecting ohmic electrode for reflecting optical emissions from the optical emission heterostructure back into the optical emission heterostructure. A substrate is also preferably included on the ohmic electrode opposite the mercury selenide layer. The substrate is preferably an electrically and thermally conducting substrate. The integrated heterostructure may be formed by forming an optical emission heterostructure including an epitaxial ohmic contact on a first substrate, bonding the ohmic contact to a second substrate and then removing the first substrate.
    • 反向集成异质结构包括由具有第一和第二相对面的II-VI族化合物半导体材料形成的光发射异质结构,并且在第一面上包括一层p型硒化锌或其合金。 在p型硒化锌层或其合金层上形成硒化锌锌或碲化锌镉层,并在与汞发光异质结构相反的硒化锌汞化镓或碲化锌硒化物层上形成汞硒化物层。 在与汞锌硒化物相对的汞硒化物层或硒化碲化锌层上形成欧姆电极,并且在发光异质结构的第二面上形成透明欧姆电极,以允许来自光发射异质结构的光发射通过 。 欧姆电极优选是用于将来自光发射异质结构的光发射反射回光发射异质结构的光反射欧姆电极。 在与硒化汞层相对的欧姆电极上也优选包含衬底。 衬底优选为导电和导热衬底。 可以通过在第一衬底上形成包括外延欧姆接触的光发射异质结构,将欧姆接触接合到第二衬底,然后去除第一衬底来形成集成异质结构。
    • 38. 发明授权
    • Integrated heterostructure of Group II-VI semiconductor materials
including epitaxial ohmic contact and method of fabricating same
    • 包括外延欧姆接触的II-VI族半导体材料的集成异质结构及其制造方法
    • US5294833A
    • 1994-03-15
    • US934190
    • 1992-08-21
    • Jan F. Schetzina
    • Jan F. Schetzina
    • H01L21/443H01L33/00H01L33/28H01L33/40H01S5/02H01S5/042H01S5/183H01S5/327H01L29/161H01L29/205H01L29/225
    • H01L33/40B82Y20/00H01L21/443H01L33/0083H01L33/28H01S5/0421H01S5/0215H01S5/183H01S5/3095H01S5/3215H01S5/327H01S5/347Y10S148/064Y10S438/936
    • An ohmic contact to a p-type zinc selenide (ZnSe) layer in a Group II-VI semiconductor device, includes a zinc telluride selenide (ZnTe.sub.x Se.sub.1-x) layer on the zinc selenide layer, a mercury selenide (HgSe) layer on the zinc telluride selenide layer and a conductor (such as metal) layer on the mercury selenide layer. The zinc telluride selenide and mercury selenide layers between the p-type zinc selenide and the conductor layer provide an ohmic contact by eliminating the band offset between the wide bandgap zinc selenide and the conductor. Step graded, linear graded, and parabolic graded layers of zinc telluride selenide may be provided. An integrated heterostructure is formed by epitaxially depositing the ohmic contact on the Group II-VI device. A removable overcoat layer may be formed on the Group II-VI device to allow room temperature atmospheric pressure transfer of the device from a zinc based deposition chamber to a mercury based deposition chamber, for deposition of the ohmic contact. A large area emitter may be formed by limiting the thickness of the mercury selenide layer so that optical radiation passes therethrough. A high efficiency optical emitter may be provided by using zinc telluride selenide or zinc sulfur telluride selenide to form an isoelectronic trap which produces broad and intense light output in the blue/green region.
    • 与II-VI族半导体器件中的p型硒化锌(ZnSe)层的欧姆接触包括在硒化锌层上的碲化锌硒化锌(ZnTexSe1-x)层,锌上的汞硒化物(HgSe)层 硒化碲层和汞硒化物层上的导体(如金属)层。 p型硒化锌与导体层之间的碲化锌硒化物和硒化汞层通过消除宽带隙硒化锌与导体之间的带偏移而提供欧姆接触。 可以提供步骤分级,线性分级和碲化锌硒化物的抛物线分级层。 通过外延沉积II-VI族元件上的欧姆接触来形成集成的异质结构。 可以在II-VI族装置上形成可移除的外涂层,以使装置的室温大气压力从锌基沉积室转移到基于汞的沉积室,用于沉积欧姆接触。 可以通过限制硒化汞层的厚度使得光学辐射通过其中而形成大面积发射极。 可以通过使用碲化镉硒或碲化碲硒化物来形成高效光发射器,以形成在蓝/绿区域产生宽而强的光输出的等电子阱。