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    • 35. 发明授权
    • Compressive (PFET) and tensile (NFET) channel strain in nanowire FETs fabricated with a replacement gate process
    • 用替代栅极工艺制造的纳米线FET中的压电(PFET)和拉伸(NFET)沟道应变
    • US08492208B1
    • 2013-07-23
    • US13344352
    • 2012-01-05
    • Guy CohenMichael A. GuillornConal Eugene Murray
    • Guy CohenMichael A. GuillornConal Eugene Murray
    • H01L21/00H01L29/76
    • H01L29/775B82Y10/00B82Y40/00H01L29/66439
    • A method of fabricating a FET device is provided which includes the following steps. Nanowires/pads are formed in a SOI layer over a BOX layer, wherein the nanowires are suspended over the BOX. A HSQ layer is deposited that surrounds the nanowires. A portion(s) of the HSQ layer that surround the nanowires are cross-linked, wherein the cross-linking causes the portion(s) of the HSQ layer to shrink thereby inducing strain in the nanowires. One or more gates are formed that retain the strain induced in the nanowires. A FET device is also provided wherein each of the nanowires has a first region(s) that is deformed such that a lattice constant in the first region(s) is less than a relaxed lattice constant of the nanowires and a second region(s) that is deformed such that a lattice constant in the second region(s) is greater than the relaxed lattice constant of the nanowires.
    • 提供一种制造FET器件的方法,其包括以下步骤。 纳米线/焊盘形成在BOX层上的SOI层中,其中纳米线悬挂在BOX上。 沉积围绕纳米线的HSQ层。 围绕纳米线的HSQ层的一部分交联,其中交联导致HSQ层的一部分收缩,从而诱导纳米线中的应变。 形成一个或多个保持在纳米线中诱发的应变的栅极。 还提供了一种FET器件,其中每个纳米线具有变形的第一区域,使得第一区域中的晶格常数小于纳米线的松弛晶格常数和第二区域, 其变形使得第二区域中的晶格常数大于纳米线的松弛晶格常数。
    • 37. 发明授权
    • Top-down nanowire thinning processes
    • 自上而下的纳米线稀疏过程
    • US08546269B2
    • 2013-10-01
    • US12417936
    • 2009-04-03
    • Tymon BarwiczGuy CohenLidija SekaricJeffrey Sleight
    • Tymon BarwiczGuy CohenLidija SekaricJeffrey Sleight
    • H01L21/302H01L21/461H01L29/06
    • H01L21/02238B82Y10/00B82Y30/00H01L21/02255H01L21/30604H01L29/0665H01L29/0676H01L29/42392H01L29/775H01L29/78696
    • Techniques for fabricating nanowire-based devices are provided. In one aspect, a method for fabricating a semiconductor device is provided comprising the following steps. A wafer is provided having a silicon-on-insulator (SOI) layer over a buried oxide (BOX) layer. Nanowires and pads are etched into the SOI layer to form a ladder-like structure wherein the pads are attached at opposite ends of the nanowires. The BOX layer is undercut beneath the nanowires. The nanowires and pads are contacted with an oxidizing gas to oxidize the silicon in the nanowires and pads under conditions that produce a ratio of a silicon consumption rate by oxidation on the nanowires to a silicon consumption rate by oxidation on the pads of from about 0.75 to about 1.25. An aspect ratio of width to thickness among all of the nanowires may be unified prior to contacting the nanowires and pads with the oxidizing gas.
    • 提供了制造基于纳米线的器件的技术。 一方面,提供一种制造半导体器件的方法,包括以下步骤。 提供了在掩埋氧化物(BOX)层上方具有绝缘体上硅(SOI)层的晶片。 将纳米线和焊盘蚀刻到SOI层中以形成阶梯状结构,其中焊盘附着在纳米线的相对端。 BOX层在纳米线下面被切下。 纳米线和焊盘与氧化气体接触,以在通过氧化在纳米线上产生硅消耗速率与硅消耗速率之比的条件下,在纳米线和焊盘中氧化硅,焊盘上的氧化从约0.75降至 约1.25。 在使纳米线和焊盘与氧化气体接触之前,可以统一所有纳米线中的宽度与厚度的纵横比。
    • 39. 发明授权
    • Production scale fabrication method for high resolution AFM tips
    • 高分辨率AFM提示的生产规模制作方法
    • US08474061B2
    • 2013-06-25
    • US13608396
    • 2012-09-10
    • Guy CohenMark C. ReuterBrent A. WacaserMaha M. Khayyat
    • Guy CohenMark C. ReuterBrent A. WacaserMaha M. Khayyat
    • G01Q60/38B82Y40/00
    • G01Q70/12G01Q60/38
    • A method of fabricating high resolution atomic force microscopy (AFM) tips including a single semiconductor nanowire grown at an apex of a semiconductor pyramid of each AFM tip is provided. The semiconductor nanowire that is grown has a controllable diameter and a high aspect ratio, without significant tapering from the tip of the semiconductor nanowire to its base. The method includes providing an AFM probe including a semiconductor cantilever having a semiconductor pyramid extending upward from a surface of said semiconductor cantilever. The semiconductor pyramid has an apex. A patterned oxide layer is formed on the AFM probe. The patterned oxide layer has an opening that exposes the apex of the semiconductor pyramid. A single semiconductor nanowire is grown on the exposed apex of the semiconductor pyramid utilizing a non-oxidized Al seed material as a catalyst for nanowire growth.
    • 提供了一种制造高分辨率原子力显微镜(AFM)尖端的方法,其包括在每个AFM尖端的半导体金字塔的顶点处生长的单个半导体纳米线。 生长的半导体纳米线具有可控直径和高纵横比,而没有从半导体纳米线的尖端到其基底的显着锥形化。 该方法包括提供包括半导体悬臂的AFM探针,该半导体悬臂具有从所述半导体悬臂的表面向上延伸的半导体金字塔。 半导体金字塔有顶点。 在AFM探针上形成图案化的氧化物层。 图案化氧化物层具有暴露半导体金字塔的顶点的开口。 使用未氧化的Al种子材料作为纳米线生长的催化剂,在半导体金字塔的暴露的顶点上生长单个半导体纳米线。