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    • 36. 发明授权
    • Quantum well GaP/Si tandem photovoltaic cells
    • 量子阱GaP / Si串联光伏电池
    • US08101856B2
    • 2012-01-24
    • US12243995
    • 2008-10-02
    • Harold J. Hovel
    • Harold J. Hovel
    • H01L31/032
    • H01L31/0693B82Y20/00H01L31/0236H01L31/02363H01L31/035236H01L31/0547H01L31/0687Y02E10/52Y02E10/544
    • Two junction solar energy conversion devices, i.e. photovoltaic cells have a bottom silicon N+/P/P+ photovoltaic cell and an upper GaP N+/P/P+ photovoltaic cell containing quantum well layers which extend the wavelength range over which the GaP cell absorbs light. The quantum well layers are composed of materials other than Gallium Phosphide (GaP) and may be either pseudomorphic or metamorphic. Light trapping may be incorporated at the top surface of the GaP photovoltaic cell along with anti-reflective coatings, and light trapping may be incorporated on the bottom surface of the silicon cell. The bottom surface of the silicon photovoltaic cell is coated with a passivating dielectric layer and electrical contact to the silicon is made with conductive vias extending through the passivating layer.
    • 两结太阳能转换装置即光伏电池具有底部硅N + / P / P +光伏电池和包含量子阱层的上部GaP N + / P / P +光电池,其延伸GaP电池吸收光的波长范围。 量子阱层由除了磷化镓(GaP)以外的材料组成,并且可以是伪晶体或变质的。 光俘获可以与抗反射涂层一起并入GaP光伏电池的顶表面,并且可以在硅电池的底表面上引入光捕获。 硅光伏电池的底表面涂覆有钝化介电层,并且通过延伸穿过钝化层的导电通孔制成与硅的电接触。
    • 38. 发明申请
    • QUANTUM WELL GaP/Si TANDEM PHOTOVOLTAIC CELLS
    • QUANTUM WELL GaP / Si TANDEM光伏电池
    • US20100083997A1
    • 2010-04-08
    • US12243995
    • 2008-10-02
    • Harold J. Hovel
    • Harold J. Hovel
    • H01L31/042
    • H01L31/0693B82Y20/00H01L31/0236H01L31/02363H01L31/035236H01L31/0547H01L31/0687Y02E10/52Y02E10/544
    • Two junction solar energy conversion devices, i.e. photovoltaic cells have a bottom silicon N+/P/P+ photovoltaic cell and an upper GaP N+/P/P+ photovoltaic cell containing quantum well layers which extend the wavelength range over which the GaP cell absorbs light. The quantum well layers are composed of materials other than Gallium Phosphide (GaP) and may be either pseudomorphic or metamorphic. Light trapping may be incorporated at the top surface of the GaP photovoltaic cell along with anti-reflective coatings, and light trapping may be incorporated on the bottom surface of the silicon cell. The bottom surface of the silicon photovoltaic cell is coated with a passivating dielectric layer and electrical contact to the silicon is made with conductive vias extending through the passivating layer.
    • 两结太阳能转换装置即光伏电池具有底部硅N + / P / P +光伏电池和包含量子阱层的上部GaP N + / P / P +光电池,其延伸GaP电池吸收光的波长范围。 量子阱层由除了磷化镓(GaP)以外的材料组成,并且可以是伪晶体或变质的。 光俘获可以与抗反射涂层一起并入GaP光伏电池的顶表面,并且可以在硅电池的底表面上引入光捕获。 硅光伏电池的底表面涂覆有钝化介电层,并且通过延伸穿过钝化层的导电通孔制成与硅的电接触。
    • 40. 发明授权
    • Process for diffusing impurities into a semiconductor body vapor phase
diffusion of III-V semiconductor substrates
    • 将杂质扩散到III-V半导体衬底的半导体体气相扩散中的工艺
    • US4592793A
    • 1986-06-03
    • US712300
    • 1985-03-15
    • Harold J. HovelThermon E. McKoy
    • Harold J. HovelThermon E. McKoy
    • C30B31/06C30B29/40C30B31/02H01L21/223H01L21/225
    • H01L21/2233H01L21/2258Y10S252/951
    • A process for diffusing a dopant into a III-V type semiconductor body is disclosed which comprises:(a) placing in a heating chamber which is substantially devoid of any oxidizing substance a deposition substrate possessing a dopant-containing layer which has been vapor deposited upon a major surface thereof in contact with, or in the proximity of, an object substrate fabricated from a III-V type semiconductor material with the dopant-containing layer of the deposition substrate being substantially opposed to a major surface of the object substrate;(b) introducing into the heating chamber a source of Group V element corresponding to the Group V element of the object substrate, said source being capable of providing Group V element in the vapor phase at the diffusion temperature with the vapor pressure of the vapor phase Group V element being at or above the equilibrium vapor pressure of the Group V element present at the surface of the object substrate; and,(c) heating the deposition substrate and the object substrate to the diffusion temperature for a period of time sufficient to diffuse a predetermined amount of dopant into the object substrate to a predetermined depth therein.
    • 公开了一种将掺杂剂扩散到III-V型半导体本体中的方法,其包括:(a)放置在基本上没有任何氧化物质的加热室中,该沉积基底具有已经气相沉积的掺杂剂层 其主表面与由III-V型半导体材料制成的对象衬底接触或接近,其中沉积衬底的含掺杂剂层基本上与对象衬底的主表面相对; (b)将与对象基板的V族元素相对应的V族元素的源引入加热室,所述源能够在气相中以蒸气相的蒸气压提供气相中的V族元素 V族元素处于或高于存在于物体基板表面的V族元素的平衡蒸气压; 以及(c)将沉积基板和对象基板加热至扩散温度一段足以将预定量的掺杂剂扩散到目标基板中的时间段到其预定的深度。