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    • 31. 发明申请
    • Integrated Semiconductor Memory and Methods for Testing and Operating the Same
    • 集成半导体存储器及其测试和操作方法
    • US20070234162A1
    • 2007-10-04
    • US11677330
    • 2007-02-21
    • Roland Barth
    • Roland Barth
    • G06F11/00G01R31/28
    • G11C29/56G11C29/44G11C29/50012G11C29/50016G11C29/56012G11C2029/4402G11C2029/5006
    • In the context of functional tests a check is made to ascertain whether an integrated semiconductor memory satisfies specified operating parameters. In this case, operating parameters, such as the externally applied operating frequency or the externally applied operating voltage, are varied within specific limits. Integrated semiconductor memories which function without errors within a wide variation range of the operating parameters are classified as having high quality. Integrated semiconductor memories which, by contrast, function without any errors only in narrower tolerance ranges of the operating parameters are classified as having lower quality. During production of an integrated semiconductor memory, a data bit is stored in a memory circuit, the state of the data bit specifying whether the integrated semiconductor memory is of higher or lower quality. During operation of the integrated semiconductor memory, the quality of the semiconductor memory can be established by read-out of the memory circuit.
    • 在功能测试的上下文中,检查集成半导体存储器是否满足指定的操作参数。 在这种情况下,诸如外部施加的工作频率或外部施加的工作电压的操作参数在特定限度内变化。 在操作参数的宽变化范围内无差错地运行的集成半导体存储器被分类为具有高质量。 相比之下,仅在操作参数的较窄公差范围内没有任何错误地起作用的集成半导体存储器被分类为具有较低的质量。 在集成半导体存储器的制造期间,将数据位存储在存储器电路中,数据位的状态指定集成半导体存储器是高质量还是低质量。 在集成半导体存储器的操作期间,可以通过读出存储器电路来建立半导体存储器的质量。
    • 32. 发明授权
    • Arrangements for coherence topographic ray tracing on the eye
    • 在眼睛上进行相干地形光线跟踪的安排
    • US06788421B2
    • 2004-09-07
    • US10167130
    • 2002-06-10
    • Adolf Friedrich FercherRoland Barth
    • Adolf Friedrich FercherRoland Barth
    • G01B902
    • A61B3/113A61B3/107G01B9/02029G01B9/02077G01B9/02091
    • Topographic measurement of eye structures based on short coherence interferometry is the subject of the invention. The problem occurring in this connection is that longitudinal and transverse eye movements during signal registration lead to errors in the measured structure. The influences of longitudinal eye movements are compensated in that the reference beam, independent from the measurement beam, is directed to the corneal vertex and is reflected at the latter. The influences of longitudinal eye movements are minimized in that the transverse position of the eye is monitored by means of a direction-dependent registration of the light reflected at the corneal vertex by means of a diode array or a four-quadrant diode and transverse misalignment is detected and compensated.
    • 基于短相干干涉测量的眼睛结构的地形测量是本发明的主题。 在这方面出现的问题是在信号配准期间的纵向和横向眼睛运动导致测量结构中的误差。 补偿了纵向眼动的影响,因为独立于测量光束的参考光束被引导到角膜顶点并被反射。 通过借助于二极管阵列或四象限二极管在角膜顶点处反射的光的方向依赖对准来监测眼睛的横向位置,并且横向不对准是纵向眼睛运动的影响最小化 检测和补偿。