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    • 37. 发明申请
    • Method and device for determining the thickness of material using high frequency
    • 使用高频确定材料厚度的方法和装置
    • US20070188169A1
    • 2007-08-16
    • US10588183
    • 2005-06-09
    • Michael MahlerUlli HoffmannReiner KrapfChristoph WielandFelix Wewers
    • Michael MahlerUlli HoffmannReiner KrapfChristoph WielandFelix Wewers
    • G01B7/06
    • G01B7/10
    • The present invention relates to a method for determining the thickness of material by penetrating the material, in particular a method for measuring the thickness of walls, ceilings and floors, with which a measurement signal (28) in the gigahertz frequency range emitted using a high-frequency transmitter (24) penetrates the material (10) to be investigated at least once and is detected by a high-frequency receiver (38). According to the present invention, it is provided that the thickness (d) of the material (10) is measured via at least two transit-time measurements of the measurement signal (28) performed at various positions (20, 22) of the high-frequency transmitter (24) and/or the high-frequency receiver (34). The present invention also relates to a device system (12; 40, 140, 240, 340) for carrying out the method described above.
    • 本发明涉及一种通过穿透材料来确定材料厚度的方法,特别是一种用于测量墙壁,天花板和地板的厚度的方法,利用该方法,使用高的数字发射千兆赫兹频率范围内的测量信号(28) - 频率发射器(24)至少一次穿透待研究的材料(10),并由高频接收器(38)检测。 根据本发明,通过在高位(20,22)的各个位置(20,22)处执行的测量信号(28)的至少两次渡越时间测量来测量材料(10)的厚度(d) 频率发射机(24)和/或高频接收机(34)。 本发明还涉及用于执行上述方法的装置系统(12; 40,140,​​240,340)。