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    • 31. 发明授权
    • Pre-charge circuit with a bipolar transistor
    • 带双极晶体管的预充电电路
    • US4950925A
    • 1990-08-21
    • US246196
    • 1988-09-19
    • Toshio DoiTakehisa HayashiKenichi Ishibashi
    • Toshio DoiTakehisa HayashiKenichi Ishibashi
    • H03K17/567H03K19/017H03K19/08H03K19/0944H03K19/096
    • H03K19/01721H03K19/01742H03K19/09448
    • An output signal of a logic portion is inputted to the gate of FET inside an output buffer portion to inverse the signal polarity by this FET and is outputted through a bipolar transistor effecting an emitter follower operation or the like. An FET controlled by a clock signal is disposed between the base of the bipolar transistor and the ground and an FET which is turned ON during a pre-charge operation and when the bipolar transistor is OFF during logic calculation is disposed between the emitter and the ground so as to short-circuit the emitter and the ground during the pre-charge operation. In this manner, higher operation speed, higher integration density and high operation margin can be accomplished without losing the characteristic features of a Bi-CMOS dynamic logic circuit in its high operation speed and low power dissipation.
    • 逻辑部分的输出信号被输入到输出缓冲器部分内的FET的栅极,以通过该FET反转信号极性,并通过实现射极跟随器操作等的双极晶体管输出。 由时钟信号控制的FET设置在双极晶体管的基极和地之间,在预充电操作期间被接通的FET和在逻辑运算期间当双极晶体管截止时被布置在发射极和地之间 以便在预充电操作期间短路发射极和地。 以这种方式,可以实现更高的操作速度,更高的集成密度和高的操作裕度,而不会在其高操作速度和低功耗中丧失Bi-CMOS动态逻辑电路的特征。
    • 35. 发明授权
    • Data transfer apparatus fetching reception data at maximum margin of
timing
    • 数据传送装置以最大的定时边缘取出接收数据
    • US5794020A
    • 1998-08-11
    • US663982
    • 1996-06-14
    • Akira TanakaToshio DoiKenichi IshibashiTakehisa HayashiAkira Yamagiwa
    • Akira TanakaToshio DoiKenichi IshibashiTakehisa HayashiAkira Yamagiwa
    • H04L7/00G06F1/12H04L7/02H04L7/033H04L7/08
    • H04L7/0337H04L7/0008H04L7/0041
    • A first variable delay circuit delays the reception data from the transmitting unit which is outputted from an input buffer and generates the delayed data to a data unidentifying time detecting portion. First and second latches have latch timings at regular intervals before and after a latch timing of a third latch for receiving and outputting by second and third variable delay circuits, respectively. In an adjusting operation, delay amounts of the second and third variable delay circuits are fixed to a value which is sufficiently smaller than a transfer period, a delay amount of the variable delay circuit is increased, a judging circuit detects a preceding edge of the reception data, subsequently, the delay amounts of the second and third variable delay circuits are sequentially increased while maintaining to the same value, and a following edge of the reception data is detected. In this instance, the timing of the third latch is set to the optimum point of the maximum margin. In a normal operation, the judging circuit detects a deviation from the optimum point and the delay amount of the first variable delay circuit is finely adjusted in accordance with the detection, thereby maintaining the latch timing of the reception data at the optimum point.
    • 第一可变延迟电路延迟从输入缓冲器输出的发送单元的接收数据,并将延迟的数据生成到数据未识别时间检测部分。 第一和第二锁存器分别在第三锁存器的锁存定时之前和之后以规则的间隔分别具有第二和第三可变延迟电路接收和输出的锁存定时。 在调整操作中,第二和第三可变延迟电路的延迟量被固定为足够小于传送周期的值,可变延迟电路的延迟量增加,判断电路检测到接收的前一边缘 数据,随后,第二和第三可变延迟电路的延迟量依次增加同时保持相同的值,并且检测接收数据的后沿。 在这种情况下,第三锁存器的定时被设置为最大裕量的最佳点。 在正常操作中,判断电路检测到与最佳点的偏差,并且根据检测精细地调整第一可变延迟电路的延迟量,从而将接收数据的锁存定时保持在最佳点。
    • 38. 发明授权
    • Semiconductor integrated circuit device
    • 半导体集成电路器件
    • US5043990A
    • 1991-08-27
    • US279034
    • 1988-12-02
    • Toshio DoiTakehisa HayashiKenichi Ishibashi
    • Toshio DoiTakehisa HayashiKenichi Ishibashi
    • G06F7/00G06F11/10G06F11/16
    • G06F11/1641G06F11/10G06F7/57
    • A semiconductor integrated circuit device is provided which includes a logic circuit utilizing an error detection code. The device has a first circuit train including a series connection of plural stages of operation circuits for receiving input data, performing predetermined operations while the input data propagates through the operation circuits and providing output data; a second circuit train including a series connection of plural stages of error detection code correction circuits for receiving error detection code input corresponding to the input data, applying corrections to the error detection code in correspondence to the operations in the operation circuits in the first circuit train, and outputting an error detection code corresponding to the output data; and at least one error detection circuit for performing a comparison and check of the output of the operation circuit in the first circuit train and the output of a corresponding error detection code correction circuit in the second circuit train. Also, the semiconductor integrated circuit device of this invention comprises a logic circuit incorporating therein an error detection function by doubling the circuits which comprise a logic circuit using the error detection code, doubled operation circuits having the same function and inputted with the same signal, and a comparison circuit for mutually comparing the outputs of the doubled operation circuits.
    • 提供一种半导体集成电路器件,其包括利用错误检测码的逻辑电路。 该装置具有第一电路列,其包括用于接收输入数据的多级操作电路的串联连接,当输入数据通过操作电路传播并提供输出数据时执行预定操作; 包括多级错误检测码校正电路的串联连接的第二电路列,用于接收对应于输入数据的错误检测码输入,对应于第一电路列中的操作电路中的操作对错误检测码进行校正 并且输出与所述输出数据相对应的错误检测码; 以及至少一个误差检测电路,用于对第一电路列中的运算电路的输出和第二电路列中相应的检错码校正电路的输出进行比较和检查。 此外,本发明的半导体集成电路器件包括一个逻辑电路,其中结合有误差检测功能,通过使用误差检测码将包括逻辑电路的电路加倍,具有相同功能的双倍运算电路并输入相同的信号,以及 比较电路,用于相互比较双重运算电路的输出。
    • 39. 发明授权
    • BICMOS output interface circuit for level-shifting ECL to CMOS
    • BICMOS输出接口电路,用于将ECL电平转换为CMOS
    • US4849660A
    • 1989-07-18
    • US201961
    • 1988-06-03
    • Takehisa HayashiKenichi IshibashiToshio Doi
    • Takehisa HayashiKenichi IshibashiToshio Doi
    • H03K19/0175H03K19/0944
    • H03K19/017518H03K19/09448
    • An output interface circuit comprises a CMOS circuit including a pair of complementary MOS transistors and receiving an input signal at the gates of the paired MOS transistors, a bipolar transistor having its base connected to the output of the CMOS circuit and its emitter from which an output signal is delivered, and a control circuit connected between the paired MOS transistors and operable, upon the fall of the output signal, to cut off a current flowing through any one of the paired MOS transistors so as to control the low level at the output of the CMOS circuit such that the low level does not fall before a potential level by which the low level of the output signal is permitted to be at a desirable predetermined potential level. Specifically, the CMOS circuit includes a pair of complementary MOS transistors comprised of a P-type MOS transistor and an N-type MOS transistor and receives an input signal of CMOS level to operate in inverter fashion. The bipolar transistor connected to the output of the CMOS circuit operates as an emitter follower to deliver an output signal of ECL level. Upon the fall of the output signal, the control circuit operates to cut off a current flowing through the N-type MOS transistor so as to control the low level at the output of the CMOS circuit such that the low level does not fall below a level which is about 0.5 to 0.8 volts higher than the low level of the output signal (ECL level) of the bipolar transistor.
    • 输出接口电路包括CMOS电路,其包括一对互补MOS晶体管,并在所述成对MOS晶体管的栅极处接收输入信号;双极晶体管,其基极连接到CMOS电路的输出端及其发射极, 信号被输送,以及控制电路,连接在成对的MOS晶体管之间,并且在输出信号的下降时可以切断流过成对的MOS晶体管中的任何一个的电流,以便控制在输出端的低电平 CMOS电路使得低电平不会落在允许输出信号的低电平处于期望的预定电位电平的电位电平之前。 具体地说,CMOS电路包括由P型MOS晶体管和N型MOS晶体管组成的一对互补MOS晶体管,并接收CMOS电平的输入信号以逆变器方式工作。 连接到CMOS电路的输出的双极晶体管用作射极跟随器来传送ECL电平的输出信号。 在输出信号的下降时,控制电路工作以切断流过N型MOS晶体管的电流,以便控制CMOS电路的输出处的低电平,使得低电平不低于电平 其比双极晶体管的输出信号(ECL电平)的低电平高约0.5至0.8伏。