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    • 32. 发明授权
    • Tunable clock distribution system
    • 可调时钟分配系统
    • US08928387B2
    • 2015-01-06
    • US13891328
    • 2013-05-10
    • Laurence H. Cooke
    • Laurence H. Cooke
    • H03K3/00H03K5/15
    • H03K5/15H03K5/131H03K5/133H03K5/15013H03K2005/00065H03K2005/00247
    • A memory-like structure composed of variable resistor elements for use in tuning respective branches and leaves of a clock distribution structure, which may be used to compensate for chip-by-chip and/or combinatorial logic path-by-path delay variations, which may be due, for example, to physical variations in deep submicron devices and interconnections, is presented. A single system clocked scan flip-flop with the capability to perform delay test measurements is also presented. Methods for measuring combinatorial logic path delays to determine the maximum clock frequency and delays to program the variable resistors, as well as methods for calibrating and measuring the programmed variable resistors, are also presented.
    • 由可变电阻器元件组成的存储器状结构,用于调整时钟分配结构的相应分支和叶片,其可用于补偿逐芯片和/或组合逻辑逐个路径延迟变化,其中 可能是因为例如深亚微米器件和互连中的物理变化。 还提供了具有执行延迟测试测量功能的单个系统时钟扫描触发器。 还提出了用于测量组合逻辑路径延迟以确定最大时钟频率和编程可变电阻器的延迟的方法,以及用于校准和测量编程的可变电阻器的方法。
    • 34. 发明申请
    • TUNABLE CLOCK DISTRIBUTION SYSTEM
    • 时钟分配系统
    • US20140333364A1
    • 2014-11-13
    • US13891328
    • 2013-05-10
    • Laurence H. Cooke
    • Laurence H. Cooke
    • H03K5/15
    • H03K5/15H03K5/131H03K5/133H03K5/15013H03K2005/00065H03K2005/00247
    • A memory-like structure composed of variable resistor elements for use in tuning respective branches and leaves of a clock distribution structure, which may be used to compensate for chip-by-chip and/or combinatorial logic path-by-path delay variations, which may be due, for example, to physical variations in deep submicron devices and interconnections, is presented. A single system clocked scan flip-flop with the capability to perform delay test measurements is also presented. Methods for measuring combinatorial logic path delays to determine the maximum clock frequency and delays to program the variable resistors, as well as methods for calibrating and measuring the programmed variable resistors, are also presented.
    • 由可变电阻器元件组成的存储器状结构,用于调整时钟分配结构的相应分支和叶片,其可用于补偿逐芯片和/或组合逻辑逐个路径延迟变化,其中 可能是因为例如深亚微米器件和互连中的物理变化。 还提供了具有执行延迟测试测量功能的单个系统时钟扫描触发器。 还提出了用于测量组合逻辑路径延迟以确定最大时钟频率和编程可变电阻器的延迟的方法,以及用于校准和测量编程的可变电阻器的方法。
    • 35. 发明授权
    • Use of hydrocarbon nanorings for data storage
    • 使用碳氢化合物纳米数据进行数据存储
    • US08743578B2
    • 2014-06-03
    • US13559842
    • 2012-07-27
    • Laurence H. Cooke
    • Laurence H. Cooke
    • G11C19/08H01F10/24H01L51/00H01L51/05
    • H01F10/24G11C11/14H01L51/0048H01L51/0508
    • Hydro-carbon nanorings may be used in storage. Sufficiently cooled, an externally hydrogen doped carbon nanoring may be used to create a radial dipole field to contain streams of electrons. Similarly, an internally hydrogen doped carbon nanoring may be used to create a radial dipole field to contain streams of positrons. When matched streams of positrons and electrons are sufficiently compressed they may form Cooper pairs with magnetic moments aligned to the movement of the stream. Matched adjacent Cooper pairs of electrons and positrons may contain information within their magnetic moments, and as such, may transmit and store information with little or no energy loss.
    • 水碳纳米管可用于储存。 足够冷却,可以使用外部氢掺杂的碳纳米来产生径向偶极场以包含电子流。 类似地,内部氢掺杂的碳纳米可用于产生径向偶极场以包含正电子流。 当正电子和电子的匹配流被充分压缩时,它们可以形成具有与流的运动对准的磁矩的Cooper对。 匹配的Cooper对电子和正电子可能包含其磁矩内的信息,因此,可以很少或没有能量损失传输和存储信息。
    • 39. 发明授权
    • Variable clocked scan test improvements
    • 可变时钟扫描测试改进
    • US07890899B2
    • 2011-02-15
    • US12046336
    • 2008-03-11
    • Laurence H. CookeBulent I. Dervisoglu
    • Laurence H. CookeBulent I. Dervisoglu
    • G06F17/50
    • G01R31/318552
    • Addition of specific test logic may improve the level of test vector compression achieved from existing variable scan test logic. Methods for determining the compressed vectors' states, given the desired uncompressed vectors' values may be used, and techniques for selectively enabling test or other features on a chip by inserting the proper code or codes into the chip may further be used. Techniques may be used to incorporate and apply various types of reset operations to multiple strings of variable scan test logic, as may methods to minimize the test vector compression computation time.
    • 添加特定的测试逻辑可以提高从现有的可变扫描测试逻辑实现的测试向量压缩的水平。 可以使用给定期望的未压缩向量值来确定压缩向量状态的方法,并且还可以使用用于通过将适当的代码或代码插入到芯片中来选择性地启用芯片上的测试或其他特征的技术。 技术可以用于将各种类型的复位操作并入并应用于多个可变扫描测试逻辑串,作为使测试向量压缩计算时间最小化的方法。
    • 40. 发明授权
    • Hashing and serial decoding techniques
    • 散列和串行解码技术
    • US07818538B2
    • 2010-10-19
    • US12199024
    • 2008-08-27
    • Laurence H. Cooke
    • Laurence H. Cooke
    • G06F12/00
    • G06F9/345
    • A serial decoding technique may employ one or more circular shift register strings in which an input to an element of a shift register string may be gated by either an address input or the inverse of the address input. An output word line of the decoder may be driven by a respective shift register stage in the case of a single shift register string, or by a logical combination of shift register stages from respective shift register strings in the case of multiple shift register strings.
    • 串行解码技术可以采用一个或多个循环移位寄存器串,其中移位寄存器串的元素的输入可以通过地址输入或地址输入的反相来选通。 在单个移位寄存器串的情况下,解码器的输出字线可以由相应的移位寄存器级驱动,或者在多个移​​位寄存器串的情况下由各移位寄存器串的移位寄存器级的逻辑组合来驱动。