会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 31. 发明授权
    • On-chip temperature detection device
    • 片上温度检测装置
    • US07279954B2
    • 2007-10-09
    • US10961258
    • 2004-10-12
    • Kraisorn ThrongnumchaiYoshio Simoida
    • Kraisorn ThrongnumchaiYoshio Simoida
    • H03K3/42
    • G01K7/42G01K7/01
    • An on-chip temperature detection device includes: a bipolar type power transistor; a mirror transistor in which a collector current, which is proportional to a collector current of the power transistor, flows; a current detection section that detects the collector current of the mirror transistor; a voltage detection section that detects a voltage between a base and an emitter of the power transistor; and a calculation section that calculates a chip temperature of the power transistor, based upon the collector current of the mirror transistor detected by the current detection section, and upon the voltage between the base and the emitter of the power transistor detected by the voltage detection section.
    • 片上温度检测装置包括:双极型功率晶体管; 其中集成电流与功率晶体管的集电极电流成比例的反射镜晶体管; 电流检测部,其检测所述反射镜晶体管的集电极电流; 电压检测部,其检测所述功率晶体管的基极和发射极之间的电压; 以及计算部,其基于由电流检测部检测出的反射镜晶体管的集电极电流,以及由电压检测部检测到的功率晶体管的基极与发射极之间的电压,计算功率晶体管的芯片温度 。
    • 32. 发明申请
    • Solid-state image-sensing device
    • 固态摄像装置
    • US20060233008A1
    • 2006-10-19
    • US11393429
    • 2006-03-30
    • Tomokazu KakumotoKraisorn Throngnumchai
    • Tomokazu KakumotoKraisorn Throngnumchai
    • G11C19/08
    • H04N5/35518H01L27/14609H01L27/148H04N5/3651
    • In a solid-state image-sensing device of the invention, for acquisition of sensed-image data, a photoelectric converter disconnecting switch is turned on to make a forcible reset switch perform resetting, then the voltage at the end of a logarithmic conversion MOS transistor that is not connected to the photoelectric converter disconnecting switch is so controlled that the logarithmic conversion MOS transistor is reset according to the threshold voltage thereof, and then an output commensurate with the amount of light incident on the photoelectric converter is delivered; for acquisition of noise data, the photoelectric converter disconnecting switch is turned on to make the forcible reset switch perform resetting, then the photoelectric converter disconnecting switch is turned off, then the voltage at the end of the logarithmic conversion MOS transistor that is not connected to the photoelectric converter disconnecting switch is so controlled that the logarithmic conversion MOS transistor is reset according to the threshold voltage thereof, and then an output unrelated to the amount of light incident on the photoelectric converter is delivered. With this sequence of operations, variations in sensitivity among individual pixels can be corrected for without irradiation with uniform light.
    • 在本发明的固态图像感测装置中,为了获取感测图像数据,光电转换器断开开关导通,使得强制复位开关执行复位,然后在对数转换MOS晶体管末端的电压 不连接到光电转换器断开开关的控制使得对数转换MOS晶体管根据其阈值电压被复位,然后输出与入射在光电转换器上的光量相当的输出; 为了获取噪声数据,光电转换器断开开关导通,强制复位开关进行复位,光电转换器断开开关被断开,而对数转换MOS晶体管末端的电压未连接到 光电转换器断开开关受到控制,使得对数转换MOS晶体管根据其阈值电压被复位,然后输出与入射在光电转换器上的光量无关的输出。 通过这种操作顺序,可以校正各个像素之间的灵敏度变化,而不用均匀的光照射。
    • 34. 发明授权
    • MOS type power semiconductor switching device capable of protecting load
shortcircuit problem under low heat dissipation
    • MOS型功率半导体开关器件能够在低散热下保护负载短路问题
    • US5473276A
    • 1995-12-05
    • US405455
    • 1995-03-16
    • Kraisorn Throngnumchai
    • Kraisorn Throngnumchai
    • H01L27/04H01L21/822H01L23/62H03K17/08H03K17/082H03K17/12H01L29/78G05F1/56
    • H01L23/62H03K17/0822H01L2924/0002H03K2017/0806
    • In an MOS type power switching device, no leak current flows during an OFF-state, and a high current driveability is realized during a normal load condition. Furthermore, a drive current is reduced during a short-circuited load condition. The MOS (metal-oxide semiconductor) type power switching device with a drain terminal, a source terminal and a gate terminal, includes: a MOS type power switching element whose drain is connected to the drain terminal and whose source is connected to the source terminal; a MOS type semiconductor device whose drain is connected to the drain of the MOS type power switching element and whose gate is connected to the gate terminal together with a gate of the MOS type power switching element; a bipolar semiconductor controlling element whose collector is connected to the gate terminal together with both of the gates of the MOS type power switching element and of the MOS type semiconductor element, and whose emitter is connected to the source terminal together with the source of the MOS type power switching element; and a current limiting element connected between a source of the MOS type semiconductor device and a base of the bipolar type controlling element in such a manner that when no gate biasing voltage is applied to the gate terminal, at least MOS type semiconductor device is turned OFF, whereby no current flows from the drain terminal to the source terminal through any current paths. This current limiting element is a resistor.
    • 在MOS型电力开关装置中,在OFF状态下不产生泄漏电流,在正常负载状态下实现高电流驱动性。 此外,在短路负载条件期间驱动电流减小。 具有漏极端子,源极端子和栅极端子的MOS(金属氧化物半导体)型电力开关器件包括:MOS型功率开关元件,其漏极连接到漏极端子,其源极连接到源极端子 ; MOS型半导体器件,其漏极连接到MOS型功率开关元件的漏极,其栅极与MOS型功率开关元件的栅极连接到栅极端子; 双极半导体控制元件,其集电极与MOS型功率开关元件和MOS型半导体元件的栅极连接到栅极端子,并且其发射极与MOS源极连接到源极端子 型功率开关元件; 以及限流元件,连接在MOS型半导体器件的源极和双极型控制元件的基极之间,使得当栅极极化电压没有施加到栅极端子时,至少MOS型半导体器件被关断 ,从而没有电流通过任何电流路径从漏极端子流到源极端子。 该限流元件是电阻器。
    • 40. 发明授权
    • On-chip temperature detection device
    • 片上温度检测装置
    • US06812722B2
    • 2004-11-02
    • US10091305
    • 2002-03-06
    • Kraisorn ThrongnumchaiYoshio Simoida
    • Kraisorn ThrongnumchaiYoshio Simoida
    • G01R3126
    • G01K7/42G01K7/01
    • An on-chip temperature detection device includes: a bipolar type power transistor; a mirror transistor in which a collector current, which is proportional to a collector current of the power transistor, flows; a current detection section that detects the collector current of the mirror transistor; a voltage detection section that detects a voltage between a base and an emitter of the power transistor; and a calculation section that calculates a chip temperature of the power transistor, based upon the collector current of the mirror transistor detected by the current detection section, and upon the voltage between the base and the emitter of the power transistor detected by the voltage detection section.
    • 片上温度检测装置包括:双极型功率晶体管; 其中集成电流与功率晶体管的集电极电流成比例的反射镜晶体管; 电流检测部,其检测所述反射镜晶体管的集电极电流; 电压检测部,其检测所述功率晶体管的基极和发射极之间的电压; 以及计算部,其基于由电流检测部检测出的反射镜晶体管的集电极电流,以及由电压检测部检测到的功率晶体管的基极与发射极之间的电压,计算功率晶体管的芯片温度 。