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    • 39. 发明授权
    • Dual-layer compliant polymeric nozzle
    • 双层合规聚合物喷嘴
    • US07045011B2
    • 2006-05-16
    • US10604257
    • 2003-07-07
    • David C. LongJason S. MillerRandall J. Werner
    • David C. LongJason S. MillerRandall J. Werner
    • B05B15/04
    • H05K3/1233H05K2203/0126
    • An integrated circuit screen printing nozzle that has a nozzle body, a first inner layer on the nozzle body, a second outer layer on the first layer, and an opening through the nozzle body, the first layer, and the second layer. The first and second layers can be an insert held within the body. The opening allows paste material to flow through the screen printing nozzle to the stencil mask. Also, the second outer layer includes a contact surface adapted to contact the stencil mask. One feature of the invention is that the first layer is softer (has a lower durometer) than the second layer. This allows the second layer to be more durable than the first layer and for the first layer to provide additional flexibility to the second layer. Therefore, the invention provides a nozzle that has the high durability characteristics of a hard outer surface with the compliance of a soft nozzle.
    • 一种集成电路丝网印刷喷嘴,其具有喷嘴体,所述喷嘴体上的第一内层,所述第一层上的第二外层,以及通过所述喷嘴体,所述第一层和所述第二层的开口。 第一和第二层可以是保持在体内的插入物。 该开口允许糊料材料通过丝网印刷喷嘴流到模板掩模。 此外,第二外层包括适于接触模板掩模的接触表面。 本发明的一个特征是第一层比第二层更软(具有较低的硬度)。 这允许第二层比第一层更耐用,并且第一层为第二层提供额外的灵活性。 因此,本发明提供了一种具有柔软喷嘴的柔软性的硬外表面的高耐久性特性的喷嘴。
    • 40. 发明授权
    • External verification of package processed linewidths and spacings in semiconductor packages
    • 封装加工线宽的外部验证和半导体封装中的间距
    • US06917194B2
    • 2005-07-12
    • US10604933
    • 2003-08-27
    • Thomas J. FleischmanDavid C. Long
    • Thomas J. FleischmanDavid C. Long
    • G01R31/02
    • G01R31/023
    • Disclose is a method that forms non-functional test structures in kerf regions outside functional wiring modules of the ceramic greensheets and across edges of the functional wiring modules, and an associated structure. In order to check or test the spacing and size of wires in functional wiring modules, the invention only needs to examine the non-functional test structures as exposed by cutting the multi-module greensheet along the laminate trim line or by dicing of the greensheet into individual modules. The non-functional wires have the same design spacing, size, and angles as wires in the functional wiring modules. Therefore, the non-functional test structures comprise representative wires of wires in the functional wiring modules.
    • Disclose是一种在陶瓷毛坯的功能接线模块和功能接线模块的边缘之间的切口区域中形成非功能测试结构的方法,以及相关联的结构。 为了检查或测试功能接线模块中导线的间距和尺寸,本发明仅需要检查通过沿着层叠装饰线切割多模块毛坯而暴露的非功能测试结构,或者通过将毛坯切割成 单个模块。 非功能导线与功能接线模块中的导线具有相同的设计间距,尺寸和角度。 因此,非功能测试结构包括功能布线模块中的代表性的导线。