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31. 发明授权

US11867894B2 Method for SIM microscopy 有权
公开(公告)号：US11867894B2
公开(公告)日：2024-01-09
申请号：US17470456
申请日：2021-09-09
申请人： Carl Zeiss Microscopy GmbH
发明人： Ingo Kleppe , Yauheni Novikau , Ralf Netz
IPC分类号： G02B21/36 , G01N21/64 , G02B21/06
CPC分类号： G02B21/367 , G01N21/6458 , G02B21/06
摘要： A method for performing SIM microscopy on a sample, includes: generating n raw images of the sample, in each case by illuminating the sample using the same SIM illumination pattern albeit with an individual positioning for each raw image, wherein p orders of diffraction are assigned to the SIM illumination pattern, and generating an image of the sample from the n raw images. An image reconstruction is carried out using the orders of diffraction, wherein t highest orders of diffraction are suppressed during the image reconstruction and n=p−t applies.

32. 发明授权

US11573412B2 High-resolution scanning microscopy with discrimination between at least two wave-length ranges 有权
公开(公告)号：US11573412B2
公开(公告)日：2023-02-07
申请号：US16621883
申请日：2018-06-21
申请人： Carl Zeiss Microscopy GmbH
发明人： Ingo Kleppe , Ralf Netz
IPC分类号： G02B21/00
摘要： In high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescence radiation in such a way that the illumination radiation is focused at a point in or on the sample to form a diffraction-limited illumination spot. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a structure of the diffraction image. The sample is scanned by means of different scanning positions with an increment of less than half the diameter of the illumination spot. An image of the sample is generated from the data of the surface detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging. For the purposes of distinguishing between at least two predetermined wavelength regions in the fluorescence radiation from the sample, a corresponding number of diffraction structures are generated on the surface detector for the at least two predetermined wavelength ranges, said diffraction structures differing but having a common center of symmetry. The diffraction structures are evaluated when generating the image of the sample.

33. 发明授权

US11372223B2 High-resolution scanning microscopy 有权
公开(公告)号：US11372223B2
公开(公告)日：2022-06-28
申请号：US16357869
申请日：2019-03-19
申请人： CARL ZEISS MICROSCOPY GmbH
发明人： Ingo Kleppe , Yauheni Novikau , Christoph Nieten , Ralf Netz
IPC分类号： G02B21/00 , G02B15/14 , G02B21/36 , G02B6/08 , H04N7/18
摘要： A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.

34. 发明申请

US20210191097A1 METHOD AND DEVICE FOR ILLUMINATING A SAMPLE PLANE 有权
公开(公告)号：US20210191097A1
公开(公告)日：2021-06-24
申请号：US17247210
申请日：2020-12-03
申请人： CARL ZEISS MICROSCOPY GMBH
发明人： Jörg Siebenmorgen , Ralf Netz
IPC分类号： G02B21/08 , G02B21/16 , G02B27/42
摘要： An illumination apparatus for illuminating a sample plane and a sample that is optionally arranged therein along an illumination beam path includes: a first light source (for outputting light of at least one first wavelength (λphoto), a second light source for outputting light of at least one second wavelength (λexc), and a diffraction grating in the illumination beam path between the first and second light sources and the sample plane. Light of the first wavelength (λphoto) is not diffracted by the diffraction grating, and light of the second wavelength (λexc) is diffracted due to the effect of the diffraction grating. The illumination apparatus can be used in a microscope.

35. 发明授权

US10983322B2 Single plane illumination microscope 有权
公开(公告)号：US10983322B2
公开(公告)日：2021-04-20
申请号：US16342387
申请日：2017-10-20
申请人： Carl Zeiss Microscopy GmbH
发明人： Thomas Kalkbrenner , Ralf Netz , Helmut Lippert , Joerg Siebenmorgen
IPC分类号： G02B21/00 , G02B21/32
摘要： A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface. At least one corrective element in the illumination beam path and/or the detection beam path allows those aberrations to be reduced which are created when light to be detected or light for illuminating the sample penetrates interfaces of the barrier layer system at an angle. The microscope has means, which are independent of the generation of the light sheet, for applying, via at least one manipulation beam path, light intensity to the sample in substantially point-shaped regions of the light sheet plane or in a given volume that at least temporarily encompasses the light sheet plane.

36. 发明申请

US20200310095A1 Microscopy Method Using Temporal Focus Modulation, and Microscope 审中-公开
公开(公告)号：US20200310095A1
公开(公告)日：2020-10-01
申请号：US16310870
申请日：2017-06-21
申请人： CARL ZEISS MICROSCOPY GMBH
发明人： Ralf Netz , Thomas KALKBRENNER , Tiemo ANHUT
IPC分类号： G02B21/00 , G01N21/64
摘要： A microscopy method, and related microscope, including producing illumination radiation and directing it at a focus. The illumination radiation is switched temporally between at least two modes, such that focus modulation is effected at which temporally varying and mutually different mode fields of the illumination radiation are produced in the focus. The focus is guided at least over regions of a sample to be examined, wherein detection radiation in the sample is or may be brought about by the illumination radiation in the focus at least at a point of origin. The detection radiation is captured in a manner assigned to the at least one point of origin. In addition to the illumination radiation, at least one disexcitation beam of rays of disexcitation radiation is directed at the focus. The disexcitation radiation prevents the detection radiation from being brought about in the region that is illuminated by the disexcitation radiation.

37. 发明授权

US10663749B2 Light microscope and optical assembly to provide structured illuminating light to examine samples 有权
公开(公告)号：US10663749B2
公开(公告)日：2020-05-26
申请号：US14436641
申请日：2013-10-09
申请人： Carl Zeiss Microscopy GmbH
发明人： Daniel Schwedt , Tiemo Anhut , Ralf Netz
IPC分类号： G02B27/58 , G02B21/00 , G02B26/08 , G02F1/01 , G02F1/11
摘要： An optical assembly that is designed for positioning in a beam path of a light microscope having means for providing structured illuminating light in a sample plane of the light microscope, so that structured illuminating light can be generated in different orientations. The optical assembly has an adjustable deflector in order to deflect an incident light bundle onto one of several beam paths in a selectable manner. Beam splitting devices are located in the beam paths in order to split the light bundle of the respective beam paths into partial light bundles, which are spatially separated from each other. Beam guides are provided for each of the partial light bundles, and guide the partial light bundles to a pupil plane. The beam guides are arranged in such a way that the partial light bundles that belong to the same beam path form a light spot pattern in the pupil plane; and that the light spot patterns of different beam paths in the pupil plane are different from each other.

38. 发明授权

US10261300B2 Light microscope and method for image recording using a light microscope 有权
公开(公告)号：US10261300B2
公开(公告)日：2019-04-16
申请号：US14390165
申请日：2013-05-16
申请人： Carl Zeiss Microscopy GmbH
发明人： Helmut Lippert , Ralf Netz , Tiemo Anhut , Nils Langholz , Matthias Langhorst
IPC分类号： G01B9/02 , G01B9/04 , G01N21/64 , G02B21/00 , G02B21/08 , G02B21/14 , G02B21/18 , G02B21/24 , G02B21/36
摘要： The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.

39. 发明授权

US09671600B2 Light microscope and microscopy method 有权
公开(公告)号：US09671600B2
公开(公告)日：2017-06-06
申请号：US14762930
申请日：2014-01-23
申请人： Carl Zeiss Microscopy GmbH
发明人： Wolfgang Bathe , Ralf Netz
IPC分类号： G02B21/00 , G02B27/58
CPC分类号： G02B21/0072 , G02B21/0032 , G02B21/0044 , G02B21/0076 , G02B21/008 , G02B21/025 , G02B27/58
摘要： A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement. Sample light can be imaged in a non-inverting manner and with an imaging scale of less than one. The invention is additionally directed to a corresponding microscopy method.

40. 发明授权

US09632296B2 High-resolution scanning microscopy 有权
公开(公告)号：US09632296B2
公开(公告)日：2017-04-25
申请号：US14373602
申请日：2013-02-27
申请人： Carl Zeiss Microscopy GmbH
发明人： Ralf Wolleschensky , Ingo Kleppe , Ralf Netz , Christoph Nieten
IPC分类号： G02B21/00 , G02B21/36 , G02B21/06 , G02B27/58 , G02B6/06
CPC分类号： G02B21/361 , G02B6/06 , G02B6/08 , G02B21/002 , G02B21/0032 , G02B21/0072 , G02B21/0076 , G02B21/008 , G02B21/06 , G02B21/367 , G02B27/58
摘要： In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than the single image, and —a non-imaging redistribution element, which is disposed upstream of the detector array and distributes the radiation from the detection plane in a non-imaging manner among the pixels of the detector array.

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