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1. 发明授权

US11536943B2 Microscope and method for generating an image pieced together from a plurality of individual microscope images 有权
公开(公告)号：US11536943B2
公开(公告)日：2022-12-27
申请号：US17321568
申请日：2021-05-17
申请人： Carl Zeiss Microscopy GmbH
发明人： Nils Langholz
IPC分类号： G02B21/36 , G02B21/00 , G02B21/26 , G02B21/24 , G03B37/02 , G03B37/04 , G06T5/00
摘要： The present invention initially relates to a method for generating an image of a sample, said image being pieced together from a plurality of individual microscope images. A microscope is provided, for which a measurement value of a twist angle (δ) present between an image recording unit of the microscope and an object stage of the microscope and a measurement accuracy of this measurement value are known. There is a recording of a first individual microscope image of the sample using the microscope and a displacement of the image recording unit and the sample-supporting object stage relative to one another, whereupon a second individual microscope image (02) of the sample is recorded using the microscope. A search region is determined in the second or first individual microscope image, an overlap region between the individual microscope images being expected in said search region.

2. 发明授权

US11371831B2 Method for determining the thickness and refractive index of a layer using a shape feature during analysis 有权
$Method for determining the thickness and refractive index of a layer using a shape feature during analysis$
公开(公告)号：US11371831B2
公开(公告)日：2022-06-28
申请号：US17260356
申请日：2019-07-17
申请人： Carl Zeiss Microscopy GmbH
发明人： Nils Langholz , Jakob Haarstrich
IPC分类号： G01B11/06 , G01B9/04 , G01N21/41 , G02B21/00
摘要： The invention relates to a method for determining the thickness and refractive index of a layer (6) on a substrate (26). The layer (6) having a layer boundary surface (30) facing the substrate (26) and a layer top side (28) facing away from the substrate (26). In said method, the following steps are performed; imaging the layer (6), by confocal microscopy, along an optical axis (8), determining a point spread function resolved along the optical axis (8) al the layer boundary surface (30) and the layer lop side (28), determining an apparent thickness of the layer at a lateral point of the layer from the distance between two maxima of the point spread function, determining the widening of a maximum that the point spread function has at the layer boundary surface (30) relative to the width of the same maximum that the point spread function has at the layer top side (28), at the lateral point, and determining the thickness and refractive index of the layer (6) at the lateral point from the apparent thickness and the widening.

3. 发明申请

US20150077845A1 Device and method for microscopy 有权
标题翻译：显微镜的装置和方法
公开(公告)号：US20150077845A1
公开(公告)日：2015-03-19
申请号：US14389744
申请日：2013-04-05
申请人： Carl Zeiss Microscopy GmbH
发明人： Nils Langholz , Viktor Drescher , Helmut Lippert
IPC分类号： G02B21/06 , G02B21/00 , G02B21/36 , G02B26/08
CPC分类号： G02B21/06 , G02B21/0032 , G02B21/0044 , G02B21/0092 , G02B21/36 , G02B21/365 , G02B26/0833
摘要： The invention relates to a device for microscopy, with at least one light source for providing illumination light, with a detection unit for detecting light radiated back from a sample, with a microscopy optical unit for guiding illumination light onto the sample and for guiding light radiated back from the sample in the direction of the detection unit and with, arranged in an illumination beam path, an excitation mask (40) for providing structured illumination. The device is characterized in that the excitation mask is a spatially structured filter, which is transparent to light with a first physical property and which impresses spatial structure onto light with a second physical property that is different from the first physical property. The invention moreover relates to a method for microscopy.
摘要翻译：本发明涉及一种用于显微镜的装置，具有用于提供照明光的至少一个光源，具有用于检测从样品辐射回来的光的检测单元，用于将照明光引导到样品上并用于引导照射光的光学单元在检测单元的方向上从样品返回，并且布置在照明光束路径中，用于提供结构化照明的激励掩模（40）。该装置的特征在于，激发掩模是空间结构的滤光器，其对具有第一物理特性的光是透明的，并且将空间结构印在具有不同于第一物理性质的第二物理性质的光上。本发明还涉及一种显微镜方法。

4. 发明申请

US20150054937A1 Light microscope and method for image recording using a light microscope 审中-公开
标题翻译：光学显微镜和使用光学显微镜进行图像记录的方法
公开(公告)号：US20150054937A1
公开(公告)日：2015-02-26
申请号：US14390165
申请日：2013-05-16
申请人： Carl Zeiss Microscopy GmbH
发明人： Helmut Lippert , Ralf Netz , Tiemo Anhut , Nils Langholz , Matthias Langhorst
IPC分类号： G02B21/00 , G02B21/18 , G01B9/02 , G02B21/36 , G01B9/04 , G02B21/08 , G02B21/14
CPC分类号： G02B21/008 , G01B9/02042 , G01B9/04 , G01B2210/50 , G01N2021/6419 , G01N2021/6421 , G01N2021/6463 , G02B21/0028 , G02B21/0032 , G02B21/0036 , G02B21/0044 , G02B21/006 , G02B21/0064 , G02B21/0068 , G02B21/0092 , G02B21/08 , G02B21/14 , G02B21/18 , G02B21/24 , G02B21/367
摘要： The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.
摘要翻译：本发明涉及一种光学显微镜，其包括用于在样品方向上发射照明光的多色光源，用于将照明光聚焦到样品上的聚焦装置，其中用于产生深度分辨率的聚焦装置具有纵向色差，以及检测装置，其包括用于检测来自样品的样本光的检测器元件的二维阵列。根据本发明，光学显微镜的特征在于，为了检测样品光的共焦部分和非共焦部分，从样品到检测装置的光束路径没有用于完全掩蔽非共焦部分的元件。此外，本发明涉及一种使用光学显微镜进行图像记录的方法。

5. 发明公开

US20240319487A1 MICROSCOPE AND METHOD FOR AUTOFOCUSING 审中-公开
公开(公告)号：US20240319487A1
公开(公告)日：2024-09-26
申请号：US18598162
申请日：2024-03-07
申请人： Carl Zeiss Microscopy GmbH
发明人： Nils Langholz , Markus Sticker , Thomas Nobis
IPC分类号： G02B21/36 , G02B21/04
CPC分类号： G02B21/367 , G02B21/04 , G02B21/361
摘要： According to a method for autofocusing on a microscopic sample, measurement light having a local structure is generated. The measurement light is coupled into the microscope beam path, whereby the measurement light is incident on, and reflected by, the sample. The measurement light reflected by the sample is output from the microscope beam path and split among a plurality of component beam paths which pass over optical paths of different lengths to image the reflected measurement light, whereby a plurality of measurement images assigned to different focus positions on the microscope beam path are obtained. At least the measurement image which comes closest to an ideal image of the local structure of the measurement light is selected. Depending on the focus position assigned to the selected measurement image, a focus position to be used on the microscope beam path for the purpose of microscopic imaging of the sample is set.

6. 发明授权

US10768405B2 Microscope having an objective-exchanging device 有权
公开(公告)号：US10768405B2
公开(公告)日：2020-09-08
申请号：US15772024
申请日：2016-10-25
申请人： CARL ZEISS MICROSCOPY GMBH
发明人： Peter Schacht , Hubert Wahl , Nils Langholz , Tobias Hackel
IPC分类号： G02B21/24
摘要： The invention relates to a microscope (12) having an objective interchange apparatus (22) comprising a holder (21) for receiving a number of objectives (1) at respective holder positions (21.n) and an objective receptacle (11) which is configured for receiving an objective (1) and is arranged in an optical beam path (13) of the microscope (12). The microscope (12) is characterized by an objective delivery device (20) which is configured for transporting in each case a selected objective (1) having an objective retainer (3) between its holder position (21.n), which is delivered to a transfer position (ÜP), and the objective receptacle (11), wherein the objective receptacle (11) remains in the optical beam path (13) during the transport of the objective (1). The objective retainer (3) has an outer centering diameter (10) as a reference surface, which diameter is guided against a lateral reference surface located in the objective receptacle (11) such that a reproducible positioning perpendicular to an optical axis (4) of the microscope (12) may be achieved.

7. 发明授权

US10436571B2 Confocal microscope for determination of a layer thickness and microscopy method for determination of a layer thickness 有权
公开(公告)号：US10436571B2
公开(公告)日：2019-10-08
申请号：US16042383
申请日：2018-07-23
申请人： Carl Zeiss Microscopy GmbH
发明人： Matthias Vaupel , Nils Langholz
IPC分类号： G01B11/06 , G01B9/02 , G02B21/00
摘要： A confocal microscope for determination of a layer thickness comprises: a focus adjusting device configured to adjust a relative displacement between a focus position of the illumination light and a specimen position along an optical axis, wherein measurement signals belonging to different settings of the focus adjusting device can be recorded; an evaluation device for determining a specimen layer thickness as follows: determine intensity band positions of two intensity bands in a measurement graph recorded by a light measuring device, the measurement graph indicating a light intensity in dependence of the focus position; determine a layer thickness on the basis of a positional difference between the intensity band positions; and determine the layer thickness using a mathematical model which describes for overlapping intensity bands a dependence of the intensity band positions on a light wavelength and the layer thickness, considering interference of the illumination light at the layer.

8. 发明授权

US09410794B2 Light microscope and microscopy method for examining a microscopic specimen 有权
公开(公告)号：US09410794B2
公开(公告)日：2016-08-09
申请号：US14499344
申请日：2014-09-29
申请人： Carl Zeiss Microscopy GmbH
发明人： Helmut Lippert , Nils Langholz
IPC分类号： G01B11/02 , G01B9/04 , G01B11/06 , G01B11/24
CPC分类号： G01B11/02 , G01B9/04 , G01B11/0608 , G01B11/24 , G01B2210/52
摘要： Examination of a microscopic specimen is described. Height information for a respective plurality of lateral regions of the specimen is obtained from each of multiple specimen recordings, in which the height information of each specimen recording is limited to a respective height measurement range and the height measurement ranges of different specimen recordings are different. An overall image is calculated from the specimen recordings, in which overall image height information of the different specimen recordings is combined. Specimen recordings are recorded at such heights that: the height measurement ranges of different specimen recordings overlap each other, common lateral regions are identified in two respective specimen recordings for which lateral regions height information could be obtained in both specimen recordings, and a link of the height information of different specimen recordings is determined on the basis of the height information of different specimen recordings for at least one common lateral region.

9. 发明授权

US11238575B2 Microscopic imaging method using a correction factor 有权
公开(公告)号：US11238575B2
公开(公告)日：2022-02-01
申请号：US16445802
申请日：2019-06-19
申请人： Carl Zeiss Microscopy GmbH
发明人： Viktor Drescher , Nils Langholz
IPC分类号： G06T5/50 , H04N5/225 , H04N5/232 , G02B21/00 , G06T5/00 , H04N5/32 , G06T7/00
摘要： A microscopic imaging method, includes illuminating a specimen with illumination radiation and capturing detection radiation along a detection axis. The detection radiation is caused by the illumination radiation, at a first time as a wide-field signal and at a second time as a composite signal. The composite signal is formed by a superposition of a confocal image and a wide-field image; extracting the confocal image by subtracting the wide-field signal from the composite signal, wherein a correction factor is used. A current correction factor is ascertained for each executed imaging and/or for each imaged specimen (1) and the confocal image is extracted using the respective current correction factor.

10. 发明授权

US10261300B2 Light microscope and method for image recording using a light microscope 有权
公开(公告)号：US10261300B2
公开(公告)日：2019-04-16
申请号：US14390165
申请日：2013-05-16
申请人： Carl Zeiss Microscopy GmbH
发明人： Helmut Lippert , Ralf Netz , Tiemo Anhut , Nils Langholz , Matthias Langhorst
IPC分类号： G01B9/02 , G01B9/04 , G01N21/64 , G02B21/00 , G02B21/08 , G02B21/14 , G02B21/18 , G02B21/24 , G02B21/36
摘要： The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.

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