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    • 32. 发明申请
    • LDMOS Transistor
    • LDMOS晶体管
    • US20070020863A1
    • 2007-01-25
    • US11531883
    • 2006-09-14
    • Gordon MaCarsten Ahrens
    • Gordon MaCarsten Ahrens
    • H01L21/336
    • H01L29/41766H01L23/481H01L29/41725H01L29/4175H01L29/42372H01L29/456H01L29/66659H01L29/7835H01L2924/0002H01L2924/00
    • A semiconductor device comprises a semiconductor substrate, an insulating layer on top of the substrate, a lateral field effect transistor comprising a drain region and a source region arranged in the substrate and a gate arranged above the substrate within the insulating layer, a drain runner arranged on top of the insulator layer above the drain region, a source runner arranged on top of the insulator layer above the source region, a gate runner arranged on top of the insulator layer outside an area defined by the drain runner and the source runner, a first coupling structure comprising a via for coupling the drain runner with the drain region, and a second coupling structure comprising a via for coupling the source runner with the source region.
    • 半导体器件包括半导体衬底,在衬底顶部的绝缘层,包括漏极区域和布置在衬底中的源极区域的横向场效应晶体管和布置在绝缘层内的衬底上方的栅极,排出流道布置 位于漏极区域上方的绝缘体层的顶部,源极流路,其设​​置在源极区域上方的绝缘体层的顶部;栅极流道,布置在由漏极流道和源极流路限定的区域之外的绝缘体层顶部; 第一耦合结构包括用于将漏极流道与漏极区域耦合的通孔,以及包括用于将源极流体与源极区域耦合的通路的第二耦合结构。
    • 39. 发明授权
    • Method for producing a protective structure
    • 保护结构的制造方法
    • US07888232B2
    • 2011-02-15
    • US12120401
    • 2008-05-14
    • Andre SchmennDamian SojkaCarsten Ahrens
    • Andre SchmennDamian SojkaCarsten Ahrens
    • H01L21/76
    • H01L27/0255H01L21/22H01L21/265H01L29/66121H01L29/868
    • A protective structure is produced by providing a semiconductor substrate with a doping of a first conductivity type. A semiconductor layer with a doping of a second conductivity type is applied at a surface of the semiconductor substrate. A buried layer with doping of a second conductivity type is formed in a first region of the semiconductor layer, wherein the buried layer is produced at the junction between the semiconductor layer and semiconductor substrate. A first dopant zone with a doping of a first conductivity type is formed in the first region of the semiconductor layer above the buried layer. A second dopant zone with a doping of a second conductivity type is formed in a second region of the semiconductor layer. An electrical insulation is formed between the first region and the second region of the semiconductor layer. A common connection device is formed for the first dopant zone and the second dopant zone.
    • 通过提供具有第一导电类型的掺杂的半导体衬底来制造保护结构。 在半导体衬底的表面上施加具有第二导电类型的掺杂的半导体层。 在半导体层的第一区域中形成具有第二导电类型的掺杂的掩埋层,其中在半导体层和半导体衬底之间的接合处产生掩埋层。 在掩埋层上方的半导体层的第一区域中形成具有第一导电类型掺杂的第一掺杂区。 在半导体层的第二区域中形成具有第二导电类型掺杂的第二掺杂区。 在半导体层的第一区域和第二区域之间形成电绝缘。 形成用于第一掺杂区和第二掺杂区的公共连接装置。