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31. 发明授权

US08867847B2 Method for fast, robust, multi-dimensional pattern recognition 有权
标题翻译：快速，健壮，多维模式识别的方法
公开(公告)号：US08867847B2
公开(公告)日：2014-10-21
申请号：US13656167
申请日：2012-10-19
申请人： William M. Silver , E. John McGarry , Sanjay Nichani , Adam Wagman
发明人： William M. Silver , E. John McGarry , Sanjay Nichani , Adam Wagman
IPC分类号： G06K9/46
CPC分类号： G06K9/6201 , G06K9/481 , G06K9/6204
摘要： A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.
摘要翻译：一种用于基于探针的模式匹配的方法和系统，包括用于模式模型的合成训练的装置。该装置包括用于获得图案的图像的传感器和用于从传感器接收图案的图像并运行程序的处理器。在由程序执行的步骤中，识别图像中的图案的边界。沿着图案的边界的选定点放置多个正探针，并且识别图案的边界的至少一个直线段。边界的至少一个直线段被延伸以提供假想的直线段，并且多个负探针被放置在沿着假想直线段的选定点处，其中每个负探头具有负重。

32. 发明授权

US08254695B1 Method for fast, robust, multi-dimensional pattern recognition 有权
公开(公告)号：US08254695B1
公开(公告)日：2012-08-28
申请号：US11026003
申请日：2004-12-31
申请人： William M. Silver , E. John McGarry , Sanjay Nichani , Adam Wagman
发明人： William M. Silver , E. John McGarry , Sanjay Nichani , Adam Wagman
IPC分类号： G06K9/62 , G06K9/00
CPC分类号： G06K9/6201 , G06K9/481 , G06K9/6204
摘要： Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.

33. 发明申请

US20100049341A1 METHOD OF CONFIGURING A MACHINE VISION APPLICATION PROGRAM FOR EXECUTION ON A MULTI-PROCESSOR COMPUTER 有权
标题翻译：配置执行多处理器计算机的机器视觉应用程序的方法
公开(公告)号：US20100049341A1
公开(公告)日：2010-02-25
申请号：US12194055
申请日：2008-08-19
申请人： Jason Adam Davis , Adam Wagman
发明人： Jason Adam Davis , Adam Wagman
IPC分类号： G05B15/00
CPC分类号： G06T7/0004 , G05B19/0421 , G05B2219/37208 , G06F8/314 , G06F9/5066 , G06F2209/5017 , G06F2209/504 , G06T1/20 , Y02P90/265
摘要： A machine vision system includes a computer with one or more processors and software that has a plurality of tool routines each performing a different image analysis function. A machine vision application program is created by selecting certain ones of the plurality of tool routines to analyze the image. A maximum number of processors on the computer is designated as available for executing a machine vision application, wherein the maximum number may be less than the total number of processors on the computer. When the machine vision application program operates execution of each tool routine is limited to using simultaneously no more than the maximum number of processors.
摘要翻译：机器视觉系统包括具有一个或多个处理器的计算机和具有多个工具程序的软件，每个工具程序执行不同的图像分析功能。通过选择多个工具例程中的某些来分析图像来创建机器视觉应用程序。计算机上的最大处理器数量被指定为可用于执行机器视觉应用，其中最大数量可以小于计算机上的处理器总数。当机器视觉应用程序操作每个工具程序的执行被限制为同时使用不超过最大数量的处理器。

34. 发明授权

US07088862B1 Fast high-accuracy multi-dimensional pattern inspection 失效
公开(公告)号：US07088862B1
公开(公告)日：2006-08-08
申请号：US10705297
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/40
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

35. 发明授权

US07065262B1 Fast high-accuracy multi-dimensional pattern inspection 有权
公开(公告)号：US07065262B1
公开(公告)日：2006-06-20
申请号：US10705563
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/36
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

36. 发明授权

US07058225B1 Fast high-accuracy multi-dimensional pattern inspection 有权
公开(公告)号：US07058225B1
公开(公告)日：2006-06-06
申请号：US10705454
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/62 , G06K9/48
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

37. 发明授权

US06975764B1 Fast high-accuracy multi-dimensional pattern inspection 有权
标题翻译：快速高精度多维图案检查
公开(公告)号：US06975764B1
公开(公告)日：2005-12-13
申请号：US10657522
申请日：2003-09-08
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06T7/00 , G06K9/62 , G06K9/46 , G06K9/48
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.
摘要翻译：提供了一种用于识别存储的图案和匹配图像子集之间的差异的方法和装置，其中图案位置，取向和尺寸的变化不会引起错误的差异。本发明还是一种用于分析相对于模型图案的对象图像以便检测对象图像中的缺陷的系统。该系统包括从模型模式中提取模式特征; 使用所述模式特征生成向量值函数以提供模式字段; 从对象图像提取图像特征; 使用所述图案字段和将图像特征与图案特征相关联的n维变换来评估每个图像特征，以便确定至少一个相关联的特征特征; 以及使用至少一个特征特征来识别所述对象图像中的至少一个缺陷。本发明可以找到至少两种不同种类的缺陷：缺失特征和额外特征。本发明提供了通过使用表示待发现和检查的对象的理想示例的存储模式并且可以被转换，旋转和按任意精度缩放的模式检查，其比任何已知的现有技术方法更快和更准确比数字图像重采样更快，并且没有像素网格量化误差。此外，由于本发明不使用数字图像再采样，因此不存在可能限制检查性能的图案和图像之间的误差的像素量化误差。

38. 发明授权

US06959112B1 Method for finding a pattern which may fall partially outside an image 失效
标题翻译：用于查找可能部分地落在图像之外的图案的方法
公开(公告)号：US06959112B1
公开(公告)日：2005-10-25
申请号：US09895369
申请日：2001-06-29
申请人： Adam Wagman
发明人： Adam Wagman
IPC分类号： G06K9/00 , G06K9/48 , G06K9/62 , G06K9/64 , G06T7/00
CPC分类号： G06K9/6203 , G06T7/75
摘要： A method is provided for finding a whole pattern in an image, where at least a portion of the whole pattern falls outside the boundary of the image. The method includes, for each candidate pose of a search model of the whole pattern that results in a transformed search model that may extend beyond the boundary of the image, applying a match-quality metric to only a subset of search model features and corresponding image features, the subset being uniquely determined by the pose. The features which do not overlap the image at that pose of the model are completely excluded from the metric computation. All the relevant available information is used, using no arbitrarily hypothesized information. The higher-level strategy of the search procedure is free to consider poses where the model extends partially outside the image, and the results of each metric computation will be the most true value possible.
摘要翻译：提供了一种用于在图像中找到整个图案的方法，其中整个图案的至少一部分落在图像的边界之外。该方法包括对于整个图案的搜索模型的每个候选姿势，其导致可以延伸超出图像边界的变换搜索模型，仅将匹配质量度量应用于搜索模型特征和对应图像的子集特征，该子集由姿态唯一地确定。在模型的姿态不与图像重叠的特征被完全排除在度量计算之外。使用所有相关的可用信息，不使用任意假设的信息。搜索过程的更高层次的策略可以自由考虑模型部分在图像外部延伸的姿势，并且每个度量计算的结果将是最可能的真实值。

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