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    • 36. 发明授权
    • Refractive index measurment apparatus and refractive index measurment method
    • 折射率测量装置和折射率测量方法
    • US09212991B2
    • 2015-12-15
    • US13817439
    • 2011-08-04
    • Yuka SaitoNobuyuki Hashimoto
    • Yuka SaitoNobuyuki Hashimoto
    • G01N21/41G01N21/03
    • G01N21/41G01N21/03
    • A refractive index measurement apparatus includes a light source, a measurement cell including a sample as an object of refractive index measurement and diffracting light incident from the light source, a detector that detects the amount of diffracted light in at least one diffraction order other than zero order of diffracted light exiting from the measurement cell, and a control unit that determines refractive index of the sample based on the measured value of the amount of diffracted light by the detector. The measurement cell includes two substrates disposed so as to be opposed to each other and a diffraction grating disposed between the two substrates, and the diffraction grating has a plurality of members whose width decreases stepwise as approaching from one of the substrates to the other of the substrates, the sample being filled in the space between the substrates not occupied by the diffraction grating.
    • 折射率测量装置包括光源,测量单元,其包括作为折射率测量对象的样本和衍射从光源入射的光;检测器,其以除零以外的至少一个衍射级检测衍射光量 从测量单元出射的衍射光的次序,以及基于检测器的衍射光的测量值来确定样品的折射率的控制单元。 测量单元包括彼此相对布置的两个基板和设置在两个基板之间的衍射光栅,并且衍射光栅具有多个部件,其宽度从接近基板之一逐渐减小到另一个基板 衬底,样品被填充在未被衍射光栅占据的衬底之间的空间中。
    • 37. 发明申请
    • REFRACTIVE INDEX MEASURMENT APPARATUS AND REFRACTIVE INDEX MEASURMENT METHOD
    • 折射指数测量装置和折射指数测量方法
    • US20130155394A1
    • 2013-06-20
    • US13817439
    • 2011-08-04
    • Yuka SaitoNobuyuki Hashimoto
    • Yuka SaitoNobuyuki Hashimoto
    • G01N21/41
    • G01N21/41G01N21/03
    • A refractive index measurement apparatus 1 includes a light source 10, a measurement cell (12, 22) including a sample (125, 226) as an object of refractive index measurement and diffracting light incident from the light source, a detector 13 that detects the amount of diffracted light in at least one diffraction order other than zero order of diffracted light exiting from the measurement cell, and a control unit 15 that determines refractive index of the sample corresponding to measured value of the amount of diffracted light detected in at least one diffraction order by the detector. The measurement cell includes a first substrate (121, 221) and a second substrate (121, 221) disposed so as to be opposed to each other and a diffraction grating (123, 225) disposed between the first substrate and the second substrate, and the diffraction grating has a plurality of members whose width in the direction parallel to a surface of the first substrate decreases stepwise as approaching from the first substrate to the second substrate, the sample (125, 226) as the object of refractive index measurement being filled in the space between the first substrate and the second substrate not occupied by the diffraction grating.
    • 折射率测量装置1包括光源10,测量单元(12,22),其包括作为折射率测量对象的样品(125,226)并衍射从光源入射的光;检测器13,其检测 以从除去从测量单元出射的衍射光的零级以外的至少一个衍射级别的衍射光量的控制单元15,其确定与至少一个中检测到的衍射光的测量值相对应的样品的折射率 由检测器衍射。 测量单元包括第一基板(121,221)和彼此相对设置的第二基板(121,221)以及设置在第一基板和第二基板之间的衍射光栅(123,225),以及 衍射光栅具有多个构件,其在与第一基板的表面平行的方向上的宽度在从第一基板接近第二基板时逐步减小,作为折射率测量对象的样品(125,226)被填充 在第一基板和未被衍射光栅占据的第二基板之间的空间中。