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31. 发明授权

US5049813A Testing of integrated circuit devices on loaded printed circuit boards 失效
标题翻译：集成电路器件在加载印刷电路板上的测试
公开(公告)号：US5049813A
公开(公告)日：1991-09-17
申请号：US427932
申请日：1989-10-25
申请人： David R. Van Loan , Charles J. Johnston , Mark A. Swart
发明人： David R. Van Loan , Charles J. Johnston , Mark A. Swart
IPC分类号： G01R1/04 , G01R31/316 , G01R31/00
CPC分类号： G01R1/0425 , G01R31/316
摘要： Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.
摘要翻译：安装在加载印刷电路板（PCB）上的集成电路（IC）封装由转换器模块测试，首先在每个封装上放置相应的模块。每个模块具有一排弹簧触点，用于可释放地接触与IC封装相对侧相对应的电引线。模块的上表面具有内部连接到模块上的相应触点的导电测试焊盘阵列。测试垫与测试单元中的一组弹簧探针相匹配。模块可以是具有金属板弹簧触点的模制塑料壳体，或者其可以包括具有包括柔性弹簧状金属化塑料指状物的单独触头的复合柔性电路材料。测试模块上的触点可以直接可释放地接合IC封装上的引线，或者它们可以接触与IC封装上引线相邻的PCB上分开的导电引线。在测试期间，弹簧探头接触测试模块上的测试焊盘，并通过从弹簧探头通过模块到邻近IC封装的引线的电气连接建立电路连续性。这些模块将紧邻IC封装的引线的密集在线间距转换为模块上测试焊盘的过大的在线间距。在另一个实施例中，翻译器模块连接到耦合到测试系统电子装置的柔性电路电缆。翻译器模块在测试期间手动放置在每个IC封装上。在另一实施例中，集成电路封装包含内置的测试验证器系统，使得可以使用标准测试探针来测试封装而不使用单独的转换器模块。

32. 发明授权

US5032787A Electrical test probe having rotational control of the probe shaft 失效
标题翻译：电测试探针具有探头轴的旋转控制
公开(公告)号：US5032787A
公开(公告)日：1991-07-16
申请号：US431477
申请日：1989-11-03
申请人： Charles J. Johnston , Mark A. Swart
发明人： Charles J. Johnston , Mark A. Swart
IPC分类号： G01R1/067
CPC分类号： H01R11/18 , G01R1/06722 , H01R13/2421
摘要： A test probe assembly includes a barrel having a hollow interior and a plunger which slides axially in the barrel. The plunger has an outer portion extending through an open end of the barrel, terminating in a contact tip outside the barrel for contact with a test point. In one embodiment, the plunger also has a hollow, elongated receptacle extending through the barrel. The receptacle has a geometric-shaped pilot hole, preferably square, spaced from the open end of the barrel. An elongated fixed guide member in the barrel extends through the pilot hole. The guide member extends through the interior of the barrel away from the pilot hole. The guide member has an outer surface of preferably square-shaped configuration engaging the pilot hole. A spring inside the barrel extends along the guide member and is biased against the internal end of the receptacle inside the barrel. Axial travel of the plunger into the barrel is against the bias of the spring. The square-shaped outer surface of the guide member, engaging the square pilot hole, controls rotational motion of the plunger as it travels along the guide member against the bias of the spring. In one embodiment, a helical configuration in the outer surface of the guide member engages the pilot hole so that axial travel of the receptacle causes the plunger to rotate about its axis, in order to provide good frictional contact between the plunger tip and the test point on a unit under test. In another embodiment, the cooperating square-shaped engaging portions of the guide member and the pilot hole provide controlled linear and non-rotational travel of the plunger relative to the barrel.

33. 发明授权

US4983909A Repetitive-switching 失效
标题翻译：重复切换
公开(公告)号：US4983909A
公开(公告)日：1991-01-08
申请号：US442289
申请日：1989-11-28
申请人： Mark A. Swart , Charles J. Johnston
发明人： Mark A. Swart , Charles J. Johnston
IPC分类号： G01R1/067
CPC分类号： G01R1/06722
摘要： A breakaway switch probe comprises an outer barrel, a movable plunger in one end portion of the barrel, a terminal projecting from the other end of the barrel, and a breakaway clip mounted on the barrel and normally engaging a contact surface on the plunger for retaining the plunger in its at-rest position, substantially immovable in the barrel and out of contact with a switch point on the terminal. The plunger is normally retained in its at-rest position spaced from the switch point so that absence of contact between the plunger and the switch point produces an electrical open-circuit condition in electrical test circuitry connected to the probe. An external test force of less than the preset level applied to the plunger in opposition to the resistance force of the breakaway clip will not move the plunger from its at-rest position, thereby retaining the open-circuit test indication. The breakaway clip is movable away from its engagement with the contact surface of the plunger when the external test force applied to it exceeds the threshold level, and the movement of the breakaway clip away from the plunger contact surface releases the plunger for travel in the barrel toward and into contact with the switch point to produce a closed-circuit condition in the electrical test circuit connected to the switch probe.

34. 发明授权

US08907694B2 Wiring board for testing loaded printed circuit board 有权
标题翻译：印刷电路板测试接线板
公开(公告)号：US08907694B2
公开(公告)日：2014-12-09
申请号：US12959765
申请日：2010-12-03
申请人： Mark A. Swart , Kenneth R. Snyder
发明人： Mark A. Swart , Kenneth R. Snyder
IPC分类号： G01R31/00 , G01R31/28 , G01R31/319
CPC分类号： G01R1/07378 , G01R31/2801 , G01R31/2844 , G01R31/31905 , Y10T29/49126
摘要： A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin electrically connected to the external analyzer.
摘要翻译：一种用于在测试电路板上的测试点位置之间传输测试信号的接线板以及具有柔性触点的外部分析仪，所述外部分析器与位于导电表面电路层上的焊盘进行电接触，所述焊盘具有延伸到具有孔的第二焊盘接收与外部分析仪电连接的接口引脚。

35. 发明授权

US08710856B2 Terminal for flat test probe 有权
标题翻译：端子用于平面测试探头
公开(公告)号：US08710856B2
公开(公告)日：2014-04-29
申请号：US12968023
申请日：2010-12-14
申请人： Mark A. Swart , Kenneth R. Snyder
发明人： Mark A. Swart , Kenneth R. Snyder
IPC分类号： G01R1/067
CPC分类号： G01R1/06722 , G01R1/07371 , H01R13/2421 , H01R2201/20
摘要： A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.
摘要翻译：用于具有锥形凸轮表面的平坦测试探针的终端，其在终端的尾部上提供引入角度，其延伸到锐利的后角以接合容器内的棘爪或突起。锥形凸轮表面和形状后角允许探针以最小的力插入到容器中，以将平面测试探针保持在容器内。

36. 发明授权

US08324919B2 Scrub inducing compliant electrical contact 有权
标题翻译：擦洗引起符合电气接触
公开(公告)号：US08324919B2
公开(公告)日：2012-12-04
申请号：US12629790
申请日：2009-12-02
申请人： Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
发明人： Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
IPC分类号： G01R31/00
CPC分类号： G01R1/06722 , G01R1/06733 , G01R3/00 , H01R12/714 , H01R13/2421 , H01R13/2428 , H01R2201/20
摘要： The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.
摘要翻译：接触组件具有接触构件，其接触尖端位于测试插座或探针板中的孔内，其中接触尖端或探针板或测试插座中的孔具有凸轮表面，以提供接触尖端跨越表面的横向运动在接触构件的压缩期间测试位置以在测试位置的表面上诱导洗涤。

37. 发明申请

US20110148451A1 WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD 有权
标题翻译：用于测试负载印刷电路板的接线板
公开(公告)号：US20110148451A1
公开(公告)日：2011-06-23
申请号：US12959765
申请日：2010-12-03
申请人： Mark A. Swart , Kenneth R. Snyder
发明人： Mark A. Swart , Kenneth R. Snyder
IPC分类号： G01R1/067 , G01R31/00
CPC分类号： G01R1/07378 , G01R31/2801 , G01R31/2844 , G01R31/31905 , Y10T29/49126
摘要： A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin electrically connected to the external analyzer.
摘要翻译：一种用于在测试电路板上的测试点位置之间传输测试信号的接线板以及具有柔性触点的外部分析仪，所述外部分析器与位于导电表面电路层上的焊盘进行电接触，所述焊盘具有延伸到具有孔的第二焊盘接收与外部分析仪电连接的接口引脚。

38. 发明申请

US20100244875A1 SCRUB INDUCING COMPLIANT ELECTRICAL CONTACT 有权
标题翻译： SCRUB诱导合规电气接触
公开(公告)号：US20100244875A1
公开(公告)日：2010-09-30
申请号：US12629790
申请日：2009-12-02
申请人： Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
发明人： Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
IPC分类号： G01R1/067
CPC分类号： G01R1/06722 , G01R1/06733 , G01R3/00 , H01R12/714 , H01R13/2421 , H01R13/2428 , H01R2201/20
摘要： The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.
摘要翻译：接触组件具有接触构件，其接触尖端位于测试插座或探针板中的孔内，其中接触尖端或探针板或测试插座中的孔具有凸轮表面，以提供接触尖端跨越表面的横向运动在接触构件的压缩期间测试位置以在测试位置的表面上诱导洗涤。

39. 发明申请

US20100197176A1 FLAT PLUNGER ROUND BARREL TEST PROBE 有权
标题翻译：平底锅圆环测试探头
公开(公告)号：US20100197176A1
公开(公告)日：2010-08-05
申请号：US12683346
申请日：2010-01-06
申请人： Mark A. Swart , Steve B. Sargeant , Charles J. Johnston
发明人： Mark A. Swart , Steve B. Sargeant , Charles J. Johnston
IPC分类号： H01R4/48
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.
摘要翻译：使用扁平柱塞的弹簧探针和具有位于筒内的压缩弹簧的圆筒和用于柱塞与筒体内部之间内部接触的擦拭器。

40. 发明授权

US06329830B1 Screen display for automated verification and repair station 失效
标题翻译：自动验证和维修站的屏幕显示
公开(公告)号：US06329830B1
公开(公告)日：2001-12-11
申请号：US09300033
申请日：1999-04-27
申请人： Doug Tackett , Mark A. Swart
发明人： Doug Tackett , Mark A. Swart
IPC分类号： G01R3102
CPC分类号： G01R31/309 , G01R31/2805 , G01R31/2808
摘要： A flying prober having at least one prober head for contacting test sites on a unit under test which is programed for measuring isolations and continuities of test sites through the prober head. The prober heads include a camera and a test probe wherein the camera views and verifies contact between the test probe and the test sites. A display screen illustrates at least a real time camera view of the unit under test and a computer generated detail view of the unit under test for comparison.
摘要翻译：一个飞行探测器，至少有一个探测头，用于接触被测单元上的测试点，该测试位置用于通过探测头来测量测试场所的隔离和连续性。探测器头包括摄像机和测试探头，其中相机查看并验证测试探针与测试位置之间的接触。显示屏幕示出了被测单元的至少实时相机视图和被测单元的计算机生成的详细视图以进行比较。

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