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    • 34. 发明授权
    • Forced ion migration for chalcogenide phase change memory device
    • 硫属化物相变存储器件强制离子迁移
    • US08295081B2
    • 2012-10-23
    • US13085265
    • 2011-04-12
    • Kristy A. Campbell
    • Kristy A. Campbell
    • G11C11/00
    • H01L45/06H01L45/1233H01L45/143H01L45/144H01L45/1625H01L45/1641H01L45/1683Y10S977/754
    • Non-volatile memory devices with two stacked layers of chalcogenide materials comprising the active memory device have been investigated for their potential as phase-change memories. The devices tested included GeTe/SnTe, Ge2Se3/SnTe, and Ge2Se3/SnSe stacks. All devices exhibited resistance switching behavior. The polarity of the applied voltage with respect to the SnTe or SnSe layer was critical to the memory switching properties, due to the electric field induced movement of either Sn or Te into the Ge-chalcogenide layer. One embodiment of the invention is a device comprising a stack of chalcogenide-containing layers which exhibit phase-change switching only after a reverse polarity voltage potential is applied across the stack causing ion movement into an adjacent layer and thus “activating” the device to act as a phase-change random access memory device or a reconfigurable electronics device when the applied voltage potential is returned to the normal polarity. Another embodiment of the invention is a device that is capable of exhibiting more than two data states.
    • 已经研究了包括有源存储器件的具有两层叠层的硫族化物材料的非易失性存储器件作为相变存储器的潜力。 测试的器件包括GeTe / SnTe,Ge2Se3 / SnTe和Ge2Se3 / SnSe堆叠。 所有器件表现出电阻切换行为。 由于电场引起的Sn或Te向Ge-硫族化物层的移动,相对于SnTe或SnSe层的施加电压的极性对于存储器开关特性至关重要。 本发明的一个实施方案是包含含硫族化物的层的堆叠的装置,其仅在反向极性电压电位施加到堆叠之后才显示相变开关,导致离子移动到相邻层中,并且因此激活装置以充当 相变随机存取存储器件或可重新配置的电子器件,当所施加的电压电位恢复到正常极性时。 本发明的另一实施例是能够呈现多于两个数据状态的装置。
    • 36. 发明申请
    • CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE
    • 基于CANTILEVER的光学接口力显微镜
    • US20120047610A1
    • 2012-02-23
    • US13286059
    • 2011-10-31
    • Byung I. Kim
    • Byung I. Kim
    • G01Q20/02G01Q20/00
    • G01Q20/02B82Y35/00G01Q30/14G01Q60/32G01Q60/36G01Q60/38G01Q70/10
    • A method and an apparatus for detecting a normal force component and a friction force component between a probe and a sample substance using an interfacial force microscope is disclosed herein. According to one embodiment, a method of measuring normal and friction forces with an interfacial force microscope includes positioning a sample substance on a piezotube and in proximity to a probe suspended from a cantilever such that a molecular force between the sample substance and the probe causes the cantilever to deflect. The method may include converting the deflection of the cantilever into an electrical signal comprising a normal force and a friction force component, and measuring the normal and friction force components.
    • 本文公开了一种用于使用界面力显微镜检测探针和样品物质之间的法向力分量和摩擦力分量的方法和装置。 根据一个实施例,使用界面力显微镜测量正常和摩擦力的方法包括将样品物质定位在压电管上并且靠近悬臂悬臂的探针,使得样品物质和探针之间的分子力导致 悬臂偏转。 该方法可以包括将悬臂的偏转转换成包括法向力和摩擦力分量的电信号,以及测量正常和摩擦力分量。