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21. 发明申请

US20160041168A1 ARRAYED DETECTOR SYSTEM FOR MEASUREMENT OF INFLUENZA IMMUNE RESPONSE 审中-公开
公开(公告)号：US20160041168A1
公开(公告)日：2016-02-11
申请号：US14921746
申请日：2015-10-23
申请人： University of Rochester
发明人： Benjamin L. Miller , Tim R. Mosmann , David Topham , Charles R. Mace
IPC分类号： G01N33/569 , G01N21/552
CPC分类号： G01N33/56983 , C12N2760/16011 , G01N21/05 , G01N21/211 , G01N21/553 , G01N33/54373 , G01N2021/1725 , G01N2021/558 , G01N2021/5957 , G01N2333/11 , G01N2800/52
摘要： A sensor chip for detecting an immune response against an influenza virus, the sensor chip including a substrate having a surface and a plurality of hemagglutinin polypeptides bound to discrete locations on the surface of the substrate, each hemagglutinin polypeptide having a hemagglutinin epitope. Detection devices containing the sensor chip and methods of detecting influenza immune responses are also described herein.

22. 发明授权

US09091594B2 Chemical mapping using thermal microscopy at the micro and nano scales 有权
标题翻译：在微尺度和纳米尺度下使用热显微镜进行化学测绘
公开(公告)号：US09091594B2
公开(公告)日：2015-07-28
申请号：US13684535
申请日：2012-11-25
申请人： Robert Furstenberg , Chris Kendziora , Nabil D. Bassim , Robert Andrew McGill , Viet K. Nguyen
发明人： Robert Furstenberg , Chris Kendziora , Nabil D. Bassim , Robert Andrew McGill , Viet K. Nguyen
IPC分类号： G01J5/02 , G01J3/28 , G01J3/02 , G01J5/60 , G02B21/00 , G01N21/17 , G01N21/3563 , G01N21/41 , G01N21/45 , G01N21/39
CPC分类号： G01J3/2823 , G01J3/02 , G01J3/0202 , G01J3/443 , G01J3/45 , G01J5/60 , G01J2003/2826 , G01N21/171 , G01N21/3563 , G01N21/41 , G01N21/45 , G01N2021/1714 , G01N2021/1725 , G01N2021/1731 , G01N2021/393 , G02B21/0028 , G02B21/008
摘要： A non-destructive method for chemical imaging with ˜1 nm to 10 μm spatial resolution (depending on the type of heat source) without sample preparation and in a non-contact manner. In one embodiment, a sample undergoes photo-thermal heating using an IR laser and the resulting increase in thermal emissions is measured with either an IR detector or a laser probe having a visible laser reflected from the sample. In another embodiment, the infrared laser is replaced with a focused electron or ion source while the thermal emission is collected in the same manner as with the infrared heating. The achievable spatial resolution of this embodiment is in the 1-50 nm range.
摘要翻译：用于化学成像的非破坏性方法，具有〜1 nm至10μm的空间分辨率（取决于热源的类型），无需样品制备和非接触式。在一个实施例中，样品使用IR激光进行光热加热，并且用具有从样品反射的可见激光的IR检测器或激光探针测量所得到的热发射增加。在另一个实施例中，红外激光被聚焦的电子或离子源代替，同时以与红外线加热相同的方式收集热发射。该实施例的可实现的空间分辨率在1-50nm范围内。

23. 发明申请

US20140240710A1 PUMP PROBE MEASURING DEVICE 有权
标题翻译：泵探头测量装置
公开(公告)号：US20140240710A1
公开(公告)日：2014-08-28
申请号：US14236771
申请日：2012-07-31
申请人： Hidemi Shigekawa , Osamu Takeuchi
发明人： Hidemi Shigekawa , Osamu Takeuchi
IPC分类号： G01N21/55
CPC分类号： G01N21/55 , B82Y35/00 , G01N21/1717 , G01N21/636 , G01N2021/1719 , G01N2021/1725 , G01N2021/1789 , G01N2021/1791 , G01N2201/0697 , G01Q60/12 , H01J37/244 , H01J37/26 , H01J2237/24507 , H01J2237/24564 , H01J2237/2818
摘要： A pump probe measuring device (1) comprises: an ultrashort optical pulse laser generator (2) for generating a first ultrashort optical pulse train which is a pump light (3a), second and third ultrashort optical pulse trains (3b), (3c) which are probe lights; an optical shutter unit (6) to which the second and the third ultrashort pulse trains (3b), (3c) are introduced; and a detecting unit (20) including an irradiation optical system (8) for directing the pump light (3a), the first probe light (3b) and the second probe light (3c) to a sample (7), a sensor (11) for detecting a probe signal from the sample (7), and a phase-sensitive detecting means (12) connected to the sensor (11). An optical shutter control unit (10) periodically modulates the delay time of the first probe light (3b) and that of the second probe light (3c) with respect to the pump light (3a), and the modulated first and second probe lights (3a), (3b) illuminate the sample (7) alternately to detect the probe signals from the sample (7) by the phase-sensitive detecting means (12) in synchronization with the periodic modulation signal of the delay time.
摘要翻译：泵探头测量装置（1）包括：超短光脉冲激光发生器（2），用于产生作为泵浦光（3a）的第一超短脉冲串，第二和第三超短脉冲序列（3b），（3c）探针灯; 引入第二和第三超短脉冲串（3b），（3c）的光学快门单元（6）; 以及检测单元（20），包括用于将泵浦光（3a），第一探测光（3b）和第二探测光（3c）引导到样品（7）的照射光学系统（8），传感器（11）），用于检测来自所述样品（7）的探针信号;以及相敏检测装置（12），连接到所述传感器（11）。光学快门控制单元（10）相对于泵浦光（3a）周期性地调制第一探测光（3b）和第二探测光（3c）的延迟时间，以及调制的第一和第二探测光（ 3a），（3b）交替地照射样品（7），以与延迟时间的周期性调制信号同步地由相敏检测装置（12）检测来自采样（7）的探测信号。

24. 发明申请

US20130169952A1 Method for Spore Detection 有权
标题翻译：孢子检测方法
公开(公告)号：US20130169952A1
公开(公告)日：2013-07-04
申请号：US13404396
申请日：2012-02-24
申请人： Lou Reinisch , Steven Churchwell
发明人： Lou Reinisch , Steven Churchwell
IPC分类号： G01N21/64 , G01N21/55 , G01N21/41 , G01N21/59
CPC分类号： G01N21/64 , C12Q1/04 , G01N21/41 , G01N21/55 , G01N21/59 , G01N21/94 , G01N2021/1725
摘要： A method of detecting the presence of bacterial spores in a sample comprises non-destructively to the spores carrying out the steps of assessing the absorption, reflectance, and/or index of refraction (IOR) of the sample, subjecting the sample to UV radiation, and reassessing the absorption, reflectance, and/or index of refraction (IOR) of the sample to determine the presence or absence of spores. A detector is also disclosed.
摘要翻译：检测样品中细菌孢子的存在的方法包括非破坏性地对孢子进行评估样品的吸收，反射率和/或折射率（IOR），对样品进行紫外线辐射，并重新评估样品的吸收，反射率和/或折射率（IOR）以确定孢子的存在或不存在。还公开了一种检测器。

25. 发明授权

US08384904B2 Method and apparatus for determining the junction depth of a semiconductor region 有权
标题翻译：用于确定半导体区域的结深度的方法和装置
公开(公告)号：US08384904B2
公开(公告)日：2013-02-26
申请号：US12726173
申请日：2010-03-17
申请人： Janusz Bogdanowicz
发明人： Janusz Bogdanowicz
IPC分类号： G01N21/55
CPC分类号： G01N21/1717 , G01N2021/1725 , H01L22/12
摘要： A method of determining a value of a depth of a semiconductor junction of a substrate using a photomodulated optical reflectance measurement technique is disclosed. In one aspect, the method includes obtaining a substrate which has at least a first region including the semiconductor junction. The method further includes obtaining a reference region. the method further includes performing at least one sequence of: a) selecting a set of measurement parameters for the photomodulated optical reflectance measurement, b) measuring on the at least a first region a first optical signal representative of the substrate with the semiconductor junction using the selected set of parameters, c) measuring on the reference region a second optical signal using the selected set of parameters, and d) determining the ratio of the first optical signal to the second optical signal, and thereafter extracting from the ratio the depth of the semiconductor junction.
摘要翻译：公开了使用光调制光反射测量技术确定衬底的半导体结的深度的值的方法。一方面，该方法包括获得至少包括半导体结的第一区域的衬底。该方法还包括获得参考区域。该方法还包括执行以下至少一个序列：a）选择用于光调制光反射测量的一组测量参数，b）在至少第一区域上测量表示具有半导体结的衬底的第一光信号，选择的参数集合，c）使用所选择的参数集在参考区域上测量第二光学信号，以及d）确定第一光学信号与第二光学信号的比率，然后从比率中提取第二光学信号的深度半导体结。

26. 发明授权

US08120776B1 Measuring characteristics of ultra-shallow junctions 失效
标题翻译：超浅结点的测量特性
公开(公告)号：US08120776B1
公开(公告)日：2012-02-21
申请号：US12545015
申请日：2009-08-20
申请人： Alex Salnik , Lena Nicolaides
发明人： Alex Salnik , Lena Nicolaides
IPC分类号： G01N21/55
CPC分类号： G01N21/1717 , G01N2021/1725
摘要： Carrier activation and end-of-range defect density of ultra-shallow junctions in integrated circuits are determined using modulated optical reflectance signals, DC reflectances of pump or probe laser beams, and in-phase and quadrature signal processing. A method for determining characteristics of an ultra-shallow junction includes periodically exciting a region of the substrate using a pump laser beam, and reflecting a probe laser beam from the excited region. A modulated optical reflectance signal is measured along with DC reflectance of the probe laser beam. The modulated optical reflectance signal and DC reflectance are compared with reference signals generated from calibration substrates to determine carrier activation and end-of-range defect density in the junction.
摘要翻译：使用调制的光反射信号，泵浦或探针激光束的直流反射以及同相和正交信号处理来确定集成电路中超浅结的载流子激活和终端缺陷密度。用于确定超浅结的特性的方法包括使用泵浦激光束周期性地激励基板的区域，并且反射来自激发区域的探测激光束。测量调制的光反射信号与探测激光束的直流反射率一起测量。将调制的光反射信号和DC反射率与从校准基板产生的参考信号进行比较，以确定接合处的载流子激活和端部范围缺陷密度。

27. 发明申请

US20110250669A1 METHOD AND APPARATUS FOR SELECTIVELY TARGETING SPECIFIC CELLS WITHIN A CELL POPULATION 有权
标题翻译：在细胞群体中选择性特异性细胞的方法和装置
公开(公告)号：US20110250669A1
公开(公告)日：2011-10-13
申请号：US12986792
申请日：2011-01-07
申请人： Bernhard O. Palsson , Manfred R. Koller , Timothy M. Eisfeld , Robert A. O'Neal
发明人： Bernhard O. Palsson , Manfred R. Koller , Timothy M. Eisfeld , Robert A. O'Neal
IPC分类号： C12N13/00 , C12M1/00
CPC分类号： C12N13/00 , C12M35/02 , C12M41/46 , C12N5/0087 , C12N5/0093 , C12N15/1034 , G01N15/1434 , G01N21/6428 , G01N21/645 , G01N21/6456 , G01N33/5005 , G01N33/5091 , G01N33/56966 , G01N2021/1725 , Y10S128/922
摘要： This invention provides a method and apparatus for selectively identifying, and targeting with an energy beam, specific cells within a cell population, for the purpose of inducing a response in the targeted cells. Using the present invention, every detectable cell in a population can be identified and affected, without substantially affecting non-targeted cells within the mixture.
摘要翻译：本发明提供了一种用于选择性地识别和靶向细胞群体内的特定细胞的能量束的方法和装置，以便在目标细胞中诱导反应。使用本发明，可以鉴定和影响群体中的每个可检测细胞，而基本上不影响混合物内的非靶细胞。

28. 发明申请

US20100281981A1 CHARACTERIZATION WITH PICOSECOND ULTRASONICS OF METAL PORTIONS OF SAMPLES POTENTIALLY SUBJECT TO EROSION 有权
标题翻译：表征可能潜在腐蚀的样品金属部分的PICOSECOND超声波
公开(公告)号：US20100281981A1
公开(公告)日：2010-11-11
申请号：US12449837
申请日：2008-02-28
申请人： Guray Tas , Sean P. Leary , Dario Alliata , Jana Clerico , Priya Mukundhan , Zhongning Dai
发明人： Guray Tas , Sean P. Leary , Dario Alliata , Jana Clerico , Priya Mukundhan , Zhongning Dai
IPC分类号： G01H17/00
CPC分类号： G01N21/1717 , G01N21/95684 , G01N29/2418 , G01N2021/1725 , G01N2021/8416 , G01N2021/95638
摘要： A method for evaluating a manufacturing process is described. The method includes generating an optical pump beam pulse and directing the optical pump beam pulse to a surface of a sample. A probe pulse is generated and directed the probe pulse to the surface of the sample. A probe pulse response signal is detected. A change in the probe pulse varying in response to the acoustic signal forms the probe pulse response signal. An evaluation of one or more manufacturing process steps used to create the sample is made based upon the probe pulse response signal. Additionally the method may be used for process control of a CMP process. Apparatus are also described.
摘要翻译：对制造工序的评价方法进行说明。该方法包括产生光泵浦波束脉冲并将光泵浦波束脉冲引导到样品的表面。产生探针脉冲并将探针脉冲引导到样品的表面。探测脉冲响应信号。响应于声信号变化的探针脉冲的变化形成探针脉冲响应信号。基于探针脉冲响应信号进行用于产生样品的一个或多个制造工艺步骤的评估。另外，该方法可以用于CMP过程的过程控制。还描述了装置。

29. 发明申请

US20100238449A1 METHOD AND APPARATUS FOR DETERMINING THE JUNCTION DEPTH OF A SEMICONDUCTOR REGION 有权
标题翻译：用于确定半导体区域的连接深度的方法和装置
公开(公告)号：US20100238449A1
公开(公告)日：2010-09-23
申请号：US12726173
申请日：2010-03-17
申请人： Janusz Bogdanowicz
发明人： Janusz Bogdanowicz
IPC分类号： G01N21/55
CPC分类号： G01N21/1717 , G01N2021/1725 , H01L22/12
摘要： A method of determining a value of a depth of a semiconductor junction of a substrate using a photomodulated optical reflectance measurement technique is disclosed. In one aspect, the method includes obtaining a substrate which has at least a first region including the semiconductor junction. The method further includes obtaining a reference region. the method further includes performing at least one sequence of: a) selecting a set of measurement parameters for the photomodulated optical reflectance measurement, b) measuring on the at least a first region a first optical signal representative of the substrate with the semiconductor junction using the selected set of parameters, c) measuring on the reference region a second optical signal using the selected set of parameters, and d) determining the ratio of the first optical signal to the second optical signal, and thereafter extracting from the ratio the depth of the semiconductor junction.
摘要翻译：公开了使用光调制光反射测量技术确定衬底的半导体结的深度的值的方法。一方面，该方法包括获得至少包括半导体结的第一区域的衬底。该方法还包括获得参考区域。该方法还包括执行以下至少一个序列：a）选择用于光调制光反射测量的一组测量参数，b）在至少第一区域上测量表示具有半导体结的衬底的第一光信号，选择的参数集合，c）使用所选择的参数集在参考区域上测量第二光学信号，以及d）确定第一光学信号与第二光学信号的比率，然后从比率中提取第二光学信号的深度半导体结。

30. 发明授权

US07760364B1 Systems and methods for near-field heterodyne spectroscopy 失效
标题翻译：近场外差光谱的系统和方法
公开(公告)号：US07760364B1
公开(公告)日：2010-07-20
申请号：US12256324
申请日：2008-10-22
申请人： Guorong V. Zhuang , John Fielden , Christopher F. Bevis
发明人： Guorong V. Zhuang , John Fielden , Christopher F. Bevis
IPC分类号： G01B9/02
CPC分类号： G01N21/1717 , G01N2021/1725 , G01Q60/22
摘要： In a near-field heterodyne spectroscopy system, a near-field generation device receives the output of a pump beam source and is also made to vibrate or move at a frequency f to generate a modulated near-field beam having a near-field component. The outputs of the pump beam source and a probe beam source (optional) as well as the modulated near-field beam are directed to the same point on a sample. At least one of the outputs of the pump beam source and probe beam source is modulated at a frequency Ω. Thus, the reflected beam that results from the interaction with the region illuminated by the modulated near-field beam is modulated at frequencies Ω+f and Ω−f. Because the excitation is near-field, the electric field in the sample is evanescent and ensures a shallow probing depth as well as smaller lateral dimensions beyond diffraction limit.
摘要翻译：在近场外差光谱系统中，近场产生装置接收泵浦光束源的输出，并且还使其以频率f振动或移动以产生具有近场分量的调制近场光束。泵浦光束源和探测光束源（可选）以及调制的近场光束的输出被引导到样品上的相同点。泵浦光源和探测光束源的输出中的至少一个以频率＆OHgr进行调制。因此，由与被调制的近场光束照射的区域的相互作用产生的反射光束被调制在频率ωgr+ f和＆omegr; -f。因为激发是近场的，所以样品中的电场是消逝的，并且确保了较深的探测深度以及超过衍射极限的较小的横向尺寸。

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