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21. 发明授权

US08159659B2 Optical device inspecting apparatus 有权
标题翻译：光学装置检查装置
公开(公告)号：US08159659B2
公开(公告)日：2012-04-17
申请号：US12515213
申请日：2007-11-09
申请人： Shigemi Osawa , Kazuma Komuro
发明人： Shigemi Osawa , Kazuma Komuro
IPC分类号： G01B9/00
CPC分类号： G01R1/07342 , G01M11/0214 , G01M11/0257 , G01N21/956 , G01R31/2641 , G01R31/308
摘要： [PROBLEMS] To provide an optical device inspecting apparatus which can be set to take many objects at one time more freely compared with conventional apparatuses, and furthermore, can accurately inspect even an optical device wherein an optical sensor is offset from a microlens. [MEANS FOR SOLVING PROBLEMS] Provided is an optical device inspecting apparatus having a probe card unit and a lens unit. The probe card unit is provided with a main substrate, a guide plate and a probe. Openings are made on the main substrate and the guide plate. The guide plate is fixed at a prescribed position from the main substrate, and is provided with a plurality of probe inserting holes. The probe is inserted into the probe inserting hole on the guide plate and fixed. The leading end portion of the probe protruding from the inserting hole has a shape of a cantilever. The lens unit using a pupil lens is arranged at the opening on the main substrate, and makes light applied to an inspecting object incline as the light goes further from the center of the optical system.
摘要翻译：本发明提供一种光学装置检查装置，与以往的装置相比，可以更自由地设置多个物体，另外，即使是光学传感器偏离微透镜的光学装置，也能够精确地检查。解决问题的手段提供一种具有探针卡单元和透镜单元的光学装置检查装置。探针卡单元设置有主基板，引导板和探针。在主基板和引导板上形成开口。引导板从主基板固定在规定位置，并且设置有多个探针插入孔。将探针插入导板上的探针插入孔中并固定。从插入孔突出的探针的前端部具有悬臂的形状。使用瞳孔透镜的透镜单元布置在主基板上的开口处，并且当光从光学系统的中心进一步延伸时，施加到检查对象的光倾斜。

22. 发明授权

US07843550B2 Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method 有权
标题翻译：投影光学系统检查方法和检查装置，以及投影光学系统制造方法
公开(公告)号：US07843550B2
公开(公告)日：2010-11-30
申请号：US11606909
申请日：2006-12-01
申请人： Mikihiko Ishii , Yutaka Ichihara , Takashi Gemma
发明人： Mikihiko Ishii , Yutaka Ichihara , Takashi Gemma
IPC分类号： G03B27/42 , G03B27/52
CPC分类号： G01M11/0271 , G01M11/0214 , G01M11/0257 , G03F7/70341 , G03F7/706
摘要： In the inspection apparatus of this projection optical system, a folding glass member, comprising a flat surface part and a reflecting spherical surface part opposing to the flat surface part, is disposed on the image plane side of the projection optical system so that the flat surface part opposes to the projection optical system. Further, in a state wherein a liquid is supplied between the projection optical system and the folding glass member, a measuring beam emitted from an interferometer unit enters the projection optical system; the measuring beam that transmitted through the projection optical system and the liquid, and entered the folding glass member is reflected by the reflecting spherical surface part, and once again passes through the liquid and the projection optical system; and the interference fringes obtained from the measuring beam and the reference beam generated within the interferometer unit are detected.
摘要翻译：在该投影光学系统的检查装置中，在投影光学系统的像面侧设置有包括平面部和与该平面部相对的反射球面部的折叠玻璃部件，部分反对投影光学系统。此外，在投影光学系统和折叠玻璃构件之间供应液体的状态下，从干涉仪单元发射的测量光束进入投影光学系统; 穿过投影光学系统和液体并进入折叠玻璃构件的测量光被反射球面部反射，再次通过液体和投影光学系统; 并且检测从测量光束获得的干涉条纹和在干涉仪单元内产生的参考光束。

23. 发明授权

US07648237B2 Device for installing suction jig for eyeglass lens and method for determining suction jig installation position 失效
标题翻译：用于安装眼镜镜片的吸尘装置的装置和用于确定抽吸夹具安装位置的方法
公开(公告)号：US07648237B2
公开(公告)日：2010-01-19
申请号：US10594318
申请日：2005-03-24
申请人： Tsutomu Kigawa , Kazuo Kitamura , Nobuo Kochi , Takahiro Watanabe , Yoshimasa Ogawa
发明人： Tsutomu Kigawa , Kazuo Kitamura , Nobuo Kochi , Takahiro Watanabe , Yoshimasa Ogawa
IPC分类号： G02C13/00
CPC分类号： G01M11/0214 , B24B9/146 , B24B13/005 , B24B49/12 , G01M11/0207
摘要： An automatic suction device for an eyeglass lens and a method for determining suction jig installation position, capable of recognizing that a frame exchange lens holder is being installed on a placement table, making transition to installation work of a frame exchange mode, and avoiding an erroneous contact between the frame exchange frame and a lens holding frame. The kind of holding means placed on the placement table is determined from an image of the inside of an opening (141), which image is taken by a CCD camera (105), and the installation position of a suction jig (121) at an eyeglass lens (L) placed on a frame exchange lens holder (300) is obtained.
摘要翻译：一种用于眼镜镜片的自动抽吸装置和一种用于确定抽吸夹具安装位置的方法，其能够识别框架更换镜头保持器正在安装在放置台上，转变为框架更换模式的安装工作，并避免错误框架更换框架与透镜保持架之间的接触。放置在放置台上的保持装置的种类根据由CCD照相机（105）拍摄的开口（141）的内部的图像和吸入夹具（121）的安装位置获得放置在框架更换镜架（300）上的眼镜镜片（L）。

24. 发明申请

US20090323081A1 Jig for measuring an object shape and method for measuring a three-dimensional shape 有权
标题翻译：用于测量物体形状的夹具和用于测量三维形状的方法
公开(公告)号：US20090323081A1
公开(公告)日：2009-12-31
申请号：US12457032
申请日：2009-05-29
申请人： Kotaro Hirano , Hirofumi Kakiuchi , Yoshiyuki Omori
发明人： Kotaro Hirano , Hirofumi Kakiuchi , Yoshiyuki Omori
IPC分类号： G01B11/24
CPC分类号： G01B5/0004 , G01M11/0214 , G01M11/025
摘要： A jig for measuring an object shape includes a plate having a first surface and a second surface opposed to the first plate and two reference balls fixed to the plate, each ball surface being exposed on both the first and second surfaces. A reference plane is fixed to the plate, the reference plane having a first plane and a second plane that are parallel to each other, the first and second planes being exposed on the first and second surfaces of the plate, respectively. An object-holding portion is fixed to the plate, the object-holding portion having a hole passing through the plate, the object-holding portion being able to hold an object in the hole with the front and back surfaces of the object being exposed on the first and second surfaces of the plate, respectively.
摘要翻译：用于测量物体形状的夹具包括具有第一表面和与第一板相对的第二表面的板和固定到板的两个参考球，每个球表面都暴露在第一表面和第二表面上。参考平面固定到板上，参考平面具有彼此平行的第一平面和第二平面，第一和第二平面分别暴露在板的第一和第二表面上。物体保持部固定在板上，物体保持部分具有穿过板的孔，物体保持部分能够将物体保持在孔中，使物体的前后表面暴露在孔上分别是板的第一和第二表面。

25. 发明申请

US20090268181A1 MEASUREMENT METHOD AND EXPOSURE APPARATUS 有权
标题翻译：测量方法和曝光装置
公开(公告)号：US20090268181A1
公开(公告)日：2009-10-29
申请号：US12419931
申请日：2009-04-07
申请人： Taro Tezuka , Yoshiyuki Kuramoto
发明人： Taro Tezuka , Yoshiyuki Kuramoto
IPC分类号： G03B27/42 , G01B11/02 , G03B27/54
CPC分类号： G01B11/002 , G01M11/0214 , G01M11/0257 , G03F7/706
摘要： A method of measuring an optical characteristic of an optical system using a measurement apparatus, comprises determining a position of each of object points by arranging, on a side of the object plane, an object point measurement device array, and sequentially inserting the object point measurement devices in an optical path, determining a position of each of image points by arranging, on a side of the image plane, an image point measurement device array, and sequentially inserting the image point measurement devices in the optical path, calculating an error attributed to the measurement apparatus based on the positions of object points and the positions of the image points, obtaining a measured value by measurement to obtain information representing the optical characteristic of the optical system using the measurement apparatus, and correcting the measured value based on the error.
摘要翻译：一种使用测量装置测量光学系统的光学特性的方法包括：通过在对象平面的一侧布置物点测量装置阵列，并依次插入物体点测量来确定每个物体点的位置在光路中的装置，通过在图像平面的一侧布置图像点测量装置阵列，并且将图像点测量装置顺序地插入光路中来计算每个图像点的位置，计算归因于基于物点的位置和图像点的位置的测量装置，通过测量获得测量值以获得表示使用测量装置的光学系统的光学特性的信息，并且基于误差校正测量值。

26. 发明申请

US20090027661A1 Systems and Methods for Testing Intraocular Lenses 有权
标题翻译：用于测量眼内镜片的系统和方法
公开(公告)号：US20090027661A1
公开(公告)日：2009-01-29
申请号：US12178454
申请日：2008-07-23
申请人： Steven Choi , Terah Whiting Smiley , Gregory Vinton Matthews
发明人： Steven Choi , Terah Whiting Smiley , Gregory Vinton Matthews
IPC分类号： G01M11/02 , G01M11/08
CPC分类号： G01M11/0214 , A61F2/16 , A61F2/1624 , A61F2240/008
摘要： Systems and their methods of use for testing intraocular lenses outside of the lens capsule. In some embodiments the systems measure an accommodative response based on a force applied to the intraocular lens.
摘要翻译：用于在晶状体囊外面测试眼内透镜的系统及其使用方法。在一些实施例中，系统基于施加到眼内透镜的力来测量调节响应。

27. 发明授权

US07167251B1 Method of processing an optical substrate 有权
标题翻译：光学基板的处理方法
公开(公告)号：US07167251B1
公开(公告)日：2007-01-23
申请号：US11230455
申请日：2005-09-21
申请人： Wilhelm Ulrich , Bernd Doerband , Rudolf Tannert
发明人： Wilhelm Ulrich , Bernd Doerband , Rudolf Tannert
IPC分类号： G01B11/02
CPC分类号： G01B9/02024 , G01B9/02018 , G01B9/02039 , G01M11/0214 , G01M11/025 , G01M11/0271 , G01N21/93 , G01N2021/8416 , G01N2021/9511
摘要： A method of processing an optical substrate having a convex surface comprises an interferometric measurement using a beam of diverging measuring light traversing the substrate and reflected from a concave mirror.
摘要翻译：一种处理具有凸面的光学基片的方法包括使用穿过基底并从凹面镜反射的发散测量光束的干涉测量。

28. 发明申请

US20060209294A1 Method of measuring decentering of lens 失效
标题翻译：测量透镜偏心的方法
公开(公告)号：US20060209294A1
公开(公告)日：2006-09-21
申请号：US11378699
申请日：2006-03-17
申请人： Yasunori Murata
发明人： Yasunori Murata
IPC分类号： G01B9/00
CPC分类号： G01M11/0221 , G01M11/0214 , G01M11/025
摘要： Disclosed is a measuring method which can measure the decentering of an axis by the measurement of a two-dimensional curved surface profile. This method has a first step of measuring a profile of a examined surface by a probe from a first reference position which is a position separate by a predetermined amount from a predetermined position on the examined surface of a subject lens, a second step of measuring the profile of the examined surface by scanning the examined surface by the probe from the second reference position which is a position separate by a predetermined amount from said predetermined position in a route opposite to the scanning direction of said first step after a rotation of the subject lens; and the step of obtaining the decentering amount of the examined surface by the use of the measurement results obtained at the first and second steps.
摘要翻译：公开了一种可以通过测量二维曲面轮廓来测量轴的偏心的测量方法。该方法具有第一步骤，通过探针从第一参考位置测量被检查表面的轮廓，第一参考位置是与被检体镜片的被检查表面上的预定位置分开预定量的位置，第二步骤，通过从第二基准位置扫描被检查表面的被检查表面的轮廓，该第二参考位置是在被摄体透镜旋转之后，在与第一台阶的扫描方向相反的路线中与所述预定位置分开预定量的位置 ; 以及通过使用在第一和第二步骤获得的测量结果来获得检查表面的偏心量的步骤。

29. 发明授权

US07022065B2 Endoscope test device 失效
标题翻译：内窥镜测试装置
公开(公告)号：US07022065B2
公开(公告)日：2006-04-04
申请号：US10910074
申请日：2004-08-03
申请人： Dennis C. Leiner , Michael Bush
发明人： Dennis C. Leiner , Michael Bush
IPC分类号： A61B1/00
CPC分类号： G01M11/0264 , A61B1/00057 , G01M11/00 , G01M11/0214 , H04N17/002 , H04N2005/2255
摘要： The invention uses optics and precision mechanisms to quantitatively assess the performance of medical endoscopes. By viewing standardized optical targets under well-controlled conditions, the optical quality of endoscopes can be easily determined in much the same fashion as getting one's eyes tested at the optometrist. The actual design, however, is much more complicated than your optometrist's eye chart and different types of endoscopes from different manufacturers require customization of the target geometry, the viewing distance, and the viewing angle. Also, there are several optical characteristics beyond image sharpness that need to be assessed, requiring other unique test geometries, including contrast, distortion, and vignetting. Clinically significant measurements are performed with simplicity and cost-effectiveness through the use of relatively inexpensive optical components and an embedded processor and graphical display system.
摘要翻译：本发明使用光学和精密机构来定量评估医用内窥镜的性能。通过在良好控制的条件下观察标准化的光学目标，可以以与验光师测试眼睛大致相同的方式容易地确定内窥镜的光学质量。然而，实际设计比您的验光师眼图复杂得多，不同制造商的不同类型的内窥镜需要定制目标几何，观看距离和视角。此外，除了图像清晰度之外，还需要对其进行评估，需要其他独特的测试几何，包括对比度，失真和渐晕等几种光学特性。通过使用相对便宜的光学元件和嵌入式处理器和图形显示系统，以简单和成本效益来进行临床重要的测量。

30. 发明申请

US20050225774A1 Method for measuring and manufacturing an optical element and optical apparatus 审中-公开
标题翻译：光学元件和光学装置的测量和制造方法
公开(公告)号：US20050225774A1
公开(公告)日：2005-10-13
申请号：US11098546
申请日：2005-04-05
申请人： Rolf Freimann , Susanne Beder , Guenther Seitz , Frank Schillke , Bernd Doerband , Heinz Martin , Franz Krug
发明人： Rolf Freimann , Susanne Beder , Guenther Seitz , Frank Schillke , Bernd Doerband , Heinz Martin , Franz Krug
IPC分类号： G01B9/02 , G01M11/02 , G02B13/18 , G02B27/62
CPC分类号： G01M11/0214 , G01M11/025 , G01M11/0271 , G02B13/18 , G02B27/62
摘要： A method of processing an optical element comprises testing the optical surface of the optical element using an interferometer optics for generating a beam of measuring light; wherein the interferometer optics has a plurality of optical elements which are configured and arranged such that the measuring light is substantially orthogonally incident on a reflecting surface, at each location thereof; and wherein the method further comprises: measuring at least one property of the interferometer optics, disposing the optical surface of the optical element at a measuring position relative to the interferometer optics within the beam of measuring light, and performing at least one interferometric measurement; determining deviations of the optical surface of the first optical element from a target shape thereof, based on the interferometric measurement and the at least one measured property of the interferometer optics.
摘要翻译：一种处理光学元件的方法包括使用用于产生测量光束的干涉仪光学器件来测试光学元件的光学表面; 其中所述干涉仪光学元件具有多个光学元件，所述多个光学元件被配置和布置成使得所述测量光在其每个位置处基本正交入射在反射表面上; 并且其中所述方法还包括：测量所述干涉仪光学器件的至少一个属性，将所述光学元件的光学表面相对于所述测量光束内的所述干涉仪光学器件设置在测量位置处，并且执行至少一个干涉测量; 基于干涉测量和干涉仪光学器件的至少一个测量特性，确定第一光学元件的光学表面与其目标形状的偏差。

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