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    • 23. 发明授权
    • Corner compensation method for fabricating MEMS and structure thereof
    • 用于制造MEMS的角补偿方法及其结构
    • US07180144B2
    • 2007-02-20
    • US11129145
    • 2005-05-13
    • Jerwei HsiehWeileun Fang
    • Jerwei HsiehWeileun Fang
    • H01L27/14B81B7/00
    • B81C1/00571
    • A corner-compensation method for fabricating MEMS (Micro-Electro-Mechanical System) is provided. The method includes steps of: (a) providing a substrate; (b) forming a conductive layer on the substrate; (c) sequentially forming a masking layer having structural openings and a photoresist layer on the conductive layer; (d) executing a photolithography for etching the photoresist layer and the masking layer to form at least one hole penetrating the photoresist layer and the masking layer; (e) etching the conductive layer and the substrate to extend the at least one hole to upper portions of the substrate; (f) removing the photoresist layer and etching the conductive layer and the substrate via the structural openings and the at least one hole respectively to form deep trench structures having different depths; (g) forming a peripheral compensation structure on a side-wall portion of the deep trench structure having the different depths; (h) removing portions of the peripheral compensation structure laterally and the substrate for exposing an uncompensated silicon structure; and (i) side etching the uncompensated silicon structure to be terminated by the peripheral compensation structure around the at least one hole.
    • 提供了一种用于制造MEMS(微机电系统)的角补偿方法。 该方法包括以下步骤:(a)提供衬底; (b)在所述基板上形成导电层; (c)在所述导电层上依次形成具有结构开口的掩模层和光致抗蚀剂层; (d)执行光刻用于蚀刻光致抗蚀剂层和掩模层以形成穿透光致抗蚀剂层和掩模层的至少一个孔; (e)蚀刻所述导电层和所述基底以将所述至少一个孔延伸到所述基底的上部; (f)去除光致抗蚀剂层并分别经由结构开口和至少一个孔蚀刻导电层和基板以形成具有不同深度的深沟槽结构; (g)在具有不同深度的深沟槽结构的侧壁部分上形成外围补偿结构; (h)横向去除外围补偿结构的部分和用于暴露未补偿的硅结构的衬底; 和(i)侧面蚀刻由所述至少一个孔周围的外围补偿结构终止的未补偿硅结构。