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    • 23. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE AND DATA ERROR DETECTION AND CORRECTION METHOD OF THE SAME
    • 半导体存储器件及其数据错误检测及校正方法
    • US20080109700A1
    • 2008-05-08
    • US11773214
    • 2007-07-03
    • Kwang-Jin LeeWon-Seok LeeDu-Eung Kim
    • Kwang-Jin LeeWon-Seok LeeDu-Eung Kim
    • G06F11/10
    • G06F11/1008G06F11/1076G11C8/04G11C8/12
    • A semiconductor memory device includes a memory cell array, a mode setting circuit, a parity data generation unit, and a data error detection and correction unit. The memory cell array has a plurality of first memory banks for storing normal data, and a predetermined number of second memory banks less than the number of the first memory banks for storing parity data according to control of a first flag signal. The mode setting circuit sets the first flag signal and a second flag signal controlling based on whether a separate memory bank is used to store the parity data in the second memory banks. The parity data generation unit receives normal write data during a write operation, generates parity data with respect to the normal write data in response to the second flag signal, and outputs the normal data and the parity data. The data error detection and correction unit receives normal read data and parity read data read from the memory cell array during a read operation, detects errors of the normal read data in response to the second flag signal, corrects the normal read data when the errors are detected, and outputs the corrected read data.
    • 半导体存储器件包括存储单元阵列,模式设置电路,奇偶校验数据生成单元和数据错误检测和校正单元。 存储单元阵列具有用于存储正常数据的多个第一存储体和小于根据第一标志信号的控制存储奇偶校验数据的第一存储体的数量的预定数量的第二存储体。 模式设置电路基于是否使用单独的存储体来存储第二存储体中的奇偶校验数据来设置第一标志信号和第二标志信号。 奇偶校验数据生成单元在写入操作期间接收正常写入数据,响应于第二标志信号生成相对于正常写入数据的奇偶校验数据,并输出正常数据和奇偶校验数据。 数据错误检测和校正单元在读取操作期间接收从存储单元阵列读取的正常读取数据和奇偶校验读取数据,响应于第二标志信号检测正常读取数据的错误,当错误为 检测并输出校正的读取数据。