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    • 21. 发明申请
    • METHOD AND DEVICE FOR EXTRACTING SCINTILLATION PULSE INFORMATION
    • 提取激光脉冲信息的方法和装置
    • US20140052414A1
    • 2014-02-20
    • US14112535
    • 2011-05-10
    • Qingguo XiePeng XiaoXi WangNa LiYuanbao ChenWei Liu
    • Qingguo XiePeng XiaoXi WangNa LiYuanbao ChenWei Liu
    • G01T1/20
    • G01T1/2006G01T1/17
    • A method for extracting scintillation pulse information includes followed steps: 1. obtaining a peak value of the scintillation pulse in a certain energy spectrum, and setting at least three threshold voltages according to the peak value; 2. determining the time when the scintillation pulse passes through the each threshold voltage, wherein each time value and its corresponding threshold voltage form a sampling point; 3. selecting multiple sampling points as sampling points for reconstructing and reconstructing pulse waveform; 4. obtaining the data of original scintillation pulse by using reconstructed pulse waveform. A device for extracting scintillation pulse information includes a threshold voltage setting module (100), a time sampling module (200), a pulse reconstruction module (300) and an information acquiring module (400).
    • 提取闪烁脉冲信息的方法包括以下步骤:1.获得特定能谱中的闪烁脉冲的峰值,并根据峰值设定至少三个阈值电压; 2.确定闪烁脉冲通过每个阈值电压的时间,其中每个时间值及其相应的阈值电压形成采样点; 3.选择多个采样点作为重建和重构脉搏波形的采样点; 4.通过重建脉冲波形获得原始闪烁脉冲的数据。 用于提取闪烁脉冲信息的装置包括阈值电压设定模块(100),时间采样模块(200),脉冲重建模块(300)和信息获取模块(400)。
    • 25. 发明授权
    • Dynamic estimation of cell core temperature by simple external measurements
    • 通过简单的外部测量动态估计细胞核心温度
    • US08529125B2
    • 2013-09-10
    • US13112541
    • 2011-05-20
    • Andrew H. LeutheuserWei LiuMark E. FranchettMahendra M. KenkrePaul J. DudleyJason J. NolteCharles Hua
    • Andrew H. LeutheuserWei LiuMark E. FranchettMahendra M. KenkrePaul J. DudleyJason J. NolteCharles Hua
    • G01K1/00G01K7/00
    • H01M10/443G01K7/427
    • Methods and systems for dynamically estimating the core temperature of at least one cell in a battery during an operative period. The method includes receiving by at least one controller the surface temperature, the current, the voltage, the state of charge, and the period of time from the initiation of a rest period to the termination of the rest period, determining an initial value of the lumped internal resistance of the at least one cell, determining subsequent values of the lumped internal resistance recursively in real-time based on the initial value, the current, and the voltage, and determining the core temperature of the at least one cell based on the surface temperature, the current, the obtained time, and the lumped internal resistance. The system for dynamically estimating the core temperature of the cells in a battery includes a plurality of sensors configured to transmit signals related to surface temperature, current, and voltage of the battery, a timing device configured to transmit signals related to the period of time from the initiation of a rest period to the termination of the rest period, and a control system, wherein the control system comprises a memory device and a controller.
    • 在操作期间动态估计电池中至少一个电池的核心温度的方法和系统。 所述方法包括由至少一个控制器接收表面温度,电流,电压,充电状态以及从休止期开始到休息期终止的时间段,确定 基于初始值,电流和电压实时递归地确定集总内部电阻的后续值,并且基于所述至少一个单元确定所述至少一个单元的核心温度 表面温度,电流,获得的时间和集总内阻。 用于动态地估计电池中的电池的核心温度的系统包括:多个传感器,被配置为传送与电池的表面温度,电流和电压相关的信号;定时装置,被配置为将与所述电池相关的时间相关的信号从 开始休息期到休息期的终止,以及控制系统,其中控制系统包括存储器装置和控制器。
    • 27. 发明申请
    • CORRECTION FOR FLARE EFFECTS IN LITHOGRAPHY SYSTEM
    • 校正系统中的FLASH效应的校正
    • US20130185681A1
    • 2013-07-18
    • US13823685
    • 2011-09-01
    • Hua-Yu LiuJiangwei LiLuoqi ChenWei LiuJiong Jiang
    • Hua-Yu LiuJiangwei LiLuoqi ChenWei LiuJiong Jiang
    • G06F17/50
    • G06F17/5045G03F7/705G03F7/70941G06F17/5009
    • A method for reducing an effect of flare produced by a lithographic apparatus for imaging a design layout onto a substrate is described. A flare map in an exposure field of the lithographic apparatus is simulated by mathematically combining a density map of the design layout at the exposure field with a point spread function (PSF), wherein system-specific effects on the flare map may be incorporated in the simulation. Location-dependent flare corrections for the design layout are calculated by using the determined flare map, thereby reducing the effect of flare. Some of the system-specific effects included in the simulation are: a flare effect due to reflection from black border of a mask, a flare effect due to reflection from one or more reticle-masking blades defining an exposure slit, a flare effect due to overscan, a flare effect due reflections from a gas-lock sub-aperture of a dynamic gas lock (DGL) mechanism, and a flare effect due to contribution from neighboring exposure fields.
    • 描述了一种用于降低由用于将设计布局成像到基板上的光刻设备产生的火炬的影响的方法。 通过将曝光场上的设计布局的密度图与点扩散函数(PSF)进行数学组合来模拟光刻设备的曝光区域中的耀斑图,其中可以在闪光图中对系统特定的影响 模拟。 通过使用确定的耀斑图计算设计布局的位置相关的光斑校正,从而减少了耀斑的影响。 仿真中包括的一些系统特定效果是:由于掩模的黑色边缘的反射引起的耀斑效应,由于限定曝光狭缝的一个或多个掩模版掩模片的反射引起的耀斑效应,由于 过扫描,来自动态气体锁(DGL)机构的气体锁定子孔的反射引起的闪光效应,以及由于来自相邻曝光场的贡献而产生的耀斑效果。