会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 26. 发明授权
    • Scanning microscope
    • 扫描显微镜
    • US07492511B2
    • 2009-02-17
    • US11572514
    • 2005-07-20
    • Werner KnebelBernd Widzgowski
    • Werner KnebelBernd Widzgowski
    • G02B21/00G02B27/40
    • G02B21/0064G02B21/0032
    • The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.
    • 本发明涉及一种扫描显微镜,其包括光束偏转装置(11),其将照明光束(5)引导到或穿过样本(21),并且包括检测器(33),用于接收离开所述检测器 样品。 扫描显微镜包括提取端口(67)或另一个检测器(37),并且包括与光束偏转装置同步的重定向装置(27),并且根据光束偏转装置的偏转位置引导检测光 到检测器或提取端口或另一检测器。
    • 27. 发明申请
    • Scanning Microscope
    • 扫描显微镜
    • US20070223076A1
    • 2007-09-27
    • US11572514
    • 2005-07-20
    • Werner KnebelBernd Widzgowski
    • Werner KnebelBernd Widzgowski
    • G02B26/10
    • G02B21/0064G02B21/0032
    • The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.
    • 本发明涉及一种扫描显微镜,其包括光束偏转装置(11),其将照明光束(5)引导到或穿过样本(21),并且包括检测器(33),用于接收离开所述检测器 样品。 扫描显微镜包括提取端口(67)或另一个检测器(37),并且包括与光束偏转装置同步的重定向装置(27),并且根据光束偏转装置的偏转位置引导检测光 到检测器或提取端口或另一检测器。
    • 29. 发明申请
    • Optical arrangement for deflecting a light beam
    • 用于偏转光束的光学布置
    • US20060176536A1
    • 2006-08-10
    • US11347450
    • 2006-02-03
    • Bernd Widzgowski
    • Bernd Widzgowski
    • G02B26/08
    • G02B21/0048G02B26/101
    • An optical arrangement for deflecting a light beam includes first and second deflection devices, and a coupling mirror. The first deflection device is rotatable about a first axis using a first rotary drive, and includes two mirrors disposed non-rotatably with respect to each other in an angular position so as to rotate jointly about the first axis. The second deflection device is rotatable about a second axis using a second rotary drive, and includes a third mirror. The coupling mirror deflects the light beam onto the first or second mirror at an angle greater than 45° relative to the surface of the mirror. The first and second axes are perpendicular to each other. The first and a second mirrors rotate jointly about the first axis so that the light beam rotates about a center of rotation located on the second axis.
    • 用于偏转光束的光学装置包括第一和第二偏转装置和耦合镜。 第一偏转装置可以使用第一旋转驱动器围绕第一轴线旋转,并且包括相对于彼此不可旋转地设置在角位置上的两个反射镜,以便围绕第一轴线共同旋转。 第二偏转装置可以使用第二旋转驱动器围绕第二轴线旋转,并且包括第三反射镜。 耦合镜相对于反射镜的表面以大于45°的角度将光束偏转到第一或第二反射镜上。 第一和第二轴线彼此垂直。 第一和第二反射镜围绕第一轴线共同旋转,使得光束围绕位于第二轴线上的旋转中心旋转。
    • 30. 发明授权
    • Method for examining an object using a microscope with delayed control signals and a microscope for examining an object
    • 使用具有延迟控制信号的显微镜检查物体的方法和用于检查物体的显微镜
    • US08735790B2
    • 2014-05-27
    • US12954629
    • 2010-11-25
    • Ludger SchulteBernd Widzgowski
    • Ludger SchulteBernd Widzgowski
    • G02B7/04G02B27/40G02B27/64
    • G02B21/0032
    • A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.
    • 用于检查物体的显微镜包括产生脉冲光以激发物体的激光光源。 包括检测器的测量系统适于检测来自物体的检测光,并且测量系统基于检测光产生测量信号。 显微镜包括可编程集成电路,其包括控制元件和第一延迟元件和第二延迟元件中的至少一个。 控制元件被配置为产生适于控制检测器和测量系统的第一控制信号。 控制元件还被配置为产生适于控制激光光源的第二控制信号。 第一和第二延迟元件被配置为分别延迟第一和第二控制信号。