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    • 21. 发明申请
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US20070140017A1
    • 2007-06-21
    • US11637026
    • 2006-12-12
    • Seiji KanekoNaoki Ueda
    • Seiji KanekoNaoki Ueda
    • G11C16/04G11C11/34
    • G11C16/3454G11C11/5628G11C11/5635G11C16/3404G11C16/3409G11C16/3413G11C16/344G11C16/3445G11C16/3459G11C2211/5621
    • There is provided a nonvolatile semiconductor memory device capable of accelerating writing time and avoiding readout errors of information by eliminating variation in threshold voltage of unselected memory cells. In a nonvolatile semiconductor memory device having a memory cell array with memory cells capable of erasing and programming information, the memory cells store one data value selected from the same number of data values as programming distribution ranges, associated with that the electrical attribute belongs to any one of the more than one programming distribution ranges. The device comprises an erasure means for erasing the selected memory cell to be erased so that its electrical attribute belongs to a erasure distribution range not overlapping any of the programming distribution ranges and a programming means for programming an erased memory cell to be programmed so that its electrical attribute belongs to any one of the programming distribution ranges.
    • 提供一种非易失性半导体存储器件,其能够通过消除未选择的存储单元的阈值电压的变化来加速写入时间并避免信息的读出错误。 在具有具有能够擦除和编程信息的存储器单元的存储单元阵列的非易失性半导体存储器件中,存储器单元存储从与电属性属于任何相关联的编程分配范围相同数量的数据值中选择的一个数据值 多个编程分布范围之一。 该装置包括擦除装置,用于擦除被擦除的所选择的存储单元,使得其电属性属于不与任何编程分布范围重叠的擦除分布范围,以及编程装置,用于对要编程的擦除存储器单元进行编程, 电属性属于编程分布范围中的任何一个。
    • 22. 发明申请
    • Nonvolatile semiconductor memory device and its writing method
    • 非易失性半导体存储器件及其写入方法
    • US20070097724A1
    • 2007-05-03
    • US11592043
    • 2006-11-01
    • Masahiro TomidaNaoki Ueda
    • Masahiro TomidaNaoki Ueda
    • G11C5/06
    • G11C8/08G11C7/22G11C16/10
    • A nonvolatile semiconductor memory device and its writing method for reducing a writing rate variation without changing a voltage condition applied for each memory cell in writing operation is provided. The device comprises a memory cell array configuration where each drain of the memory cells on the same column is connected to a first bit line via a second bit line and a bit line contact, and the shortest distance from each drain of the memory cells to the bit line contact varies according to a location of the memory cell in the column direction. The method includes a writing operation carried out sequentially from the nearest memory cell to the bit line contact, upon writing continuously so that the memory cell current becomes small for all or some of the memory cells on the same column between the two adjacent bit line contacts in the column direction.
    • 提供了一种非易失性半导体存储器件及其写入方法,用于在不改变在写入操作中对每个存储单元施加的电压条件的同时降低写入速率变化。 该器件包括存储单元阵列配置,其中同一列上的存储器单元的每个漏极经由第二位线和位线接触连接到第一位线,以及从存储器单元的每个漏极到第一位线的最短距离 位线接触根据存储单元在列方向上的位置而变化。 该方法包括在连续写入时从最近的存储单元顺序执行的写入操作,使得存储单元电流对于两个相邻位线触点之间的同一列上的所有或一些存储单元的电流变小 在列方向。
    • 24. 发明申请
    • Method for setting erasing pulse and screening erasing defect of nonvolatile memory
    • 擦除脉冲设置方法和非易失性存储器屏蔽擦除缺陷的方法
    • US20060083073A1
    • 2006-04-20
    • US11251453
    • 2005-10-14
    • Naoki Ueda
    • Naoki Ueda
    • G11C16/04
    • G11C16/3445G11C16/16G11C16/344G11C16/349
    • Method for determining the number of applications of erasing pulses, memory cells comprises, extracting two pairs of the accumulated number of the erasing pulses Np and the ratio Re of the number of erased memory cells in the target block to be erased after the accumulated number of the erasing pulses Np has been applied, converting the two ratios Re into normalized variables S(Re) through normalizing the random variables of the normal distribution probability with standard deviations, converting the two accumulated numbers of the erasing pulses Np into common logarithms Log(Np), calculating a common logarithm Log(Nt) through extrapolating from two sets of coordinates [Log(Np), S(Re)], and determining the number of applications of the remaining erasing pulses so that the extrapolation erasing pulse number Nt is the target accumulated number of applications of erasing pulses.
    • 用于确定擦除脉冲的应用次数的方法,存储器单元包括:提取两对累积数量的擦除脉冲Np,以及在累积数量的擦除脉冲数目的累积数量之后提取要擦除的目标块中的擦除存储器单元数量的比率Re 已经施加了擦除脉冲Np,通过用标准偏差标准化正态分布概率的随机变量将两个比率Re转换成归一化变量S(Re),将擦除脉冲Np的两个累加数转换为通用对数Log(Np ),通过从两组坐标[Log(Np),S(Re)]进行外推来计算通常的对数Log(Nt),并且确定剩余擦除脉冲的应用次数,使得外插擦除脉冲数Nt为 目标累计擦除脉冲数。
    • 25. 发明授权
    • Non-volatile semiconductor memory device and manufacturing method for the same
    • 非易失性半导体存储器件及其制造方法相同
    • US06916709B2
    • 2005-07-12
    • US10732444
    • 2003-12-11
    • Tadahiro OmiNaoki Ueda
    • Tadahiro OmiNaoki Ueda
    • C23C16/34C23C16/40C23C16/511H01L21/28H01L21/318H01L21/336H01L21/8247H01L27/115H01L29/788H01L29/792
    • H01L29/66825H01L21/28273H01L27/11531
    • A non-volatile semiconductor memory device comprising: a first insulating film provided on a silicon based substrate; a first electrode provided on the first insulating film as a floating gate; a second insulating film provided on the first electrode; and a second electrode formed as a control gate on the first electrode through the second insulating film, wherein the first insulating film is formed of at least two layers of: a lower silicon nitride film obtained by nitriding the silicon based substrate; and an upper silicon nitride film or upper silicon oxide film formed on the lower silicon nitride film according to a chemical vapor deposition method, and the lower silicon nitride film contains rare gas elements at an area density of 1010 cm−2 or more in at least a part of the lower silicon nitride film.
    • 一种非易失性半导体存储器件,包括:设置在硅基衬底上的第一绝缘膜; 设置在作为浮动栅极的第一绝缘膜上的第一电极; 设置在第一电极上的第二绝缘膜; 以及通过所述第二绝缘膜在所述第一电极上形成作为控制栅极的第二电极,其中所述第一绝缘膜由至少两层形成:通过氮化所述硅基衬底而获得的下部氮化硅膜; 以及根据化学气相沉积法形成在下部氮化硅膜上的上部氮化硅膜或上部氧化硅膜,并且下部氮化硅膜包含10 10的区域密度的稀有气体元素, 在下部氮化硅膜的至少一部分中具有≥2以上的厚度。
    • 28. 发明授权
    • Nonvolatile memory having gate electrode and charge storage layer formed respectively over opposite surfaces of semiconductor layer
    • 具有分别形成在半导体层的相对表面上的栅电极和电荷存储层的非易失性存储器
    • US08610197B2
    • 2013-12-17
    • US13201584
    • 2009-12-14
    • Naoki UedaYoshimitsu Yamauchi
    • Naoki UedaYoshimitsu Yamauchi
    • H01L29/786H01L29/788
    • H01L27/11524H01L29/42328H01L29/66825H01L29/7881
    • Provided is a nonvolatile memory 10 having a selective gate SG formed below a silicon layer 14, which is to be a channel region formed between a source region S and a drain region D of a transistor, through a gate insulating film 15 between the silicon layer and the selective gate, a floating gate FG formed on a part over the silicon layer 14 through a gate insulating film 16, and a control gate CG connected to the floating gate FG. The selective gate SG has one end overlapping the source region S through the gate insulating film 15, and the floating gate FG has one end overlapping the drain region D through the gate insulating film 16, and the other end separated from the source region S and overlapping the silicon layer 14 through the gate insulating film 16. Thus, a nonvolatile memory whose performance is not deteriorated even when it is formed on an insulating substrate having a low heat dissipating characteristic can be achieved.
    • 提供了一种非易失性存储器10,其具有形成在作为在晶体管的源极区域S和漏极区域D之间形成的沟道区域的硅层14下方的选择栅极SG,通过硅层之间的栅极绝缘膜15 选择栅极,通过栅极绝缘膜16形成在硅层14上的部分上的浮置栅极FG,以及连接到浮置栅极FG的控制栅极CG。 选择栅极SG的一端通过栅极绝缘膜15与源极区域S重叠,并且浮置栅极FG的一端通过栅极绝缘膜16与漏极区域D重叠,另一端与源极区域S分离, 通过栅极绝缘膜16与硅层14重叠。因此,即使在具有低散热特性的绝缘基板上形成性能也不会劣化的非易失性存储器。
    • 30. 发明申请
    • Method of transforming geographic coordinate
    • 变换地理坐标的方法
    • US20100289675A1
    • 2010-11-18
    • US12010924
    • 2008-01-31
    • Naoki Ueda
    • Naoki Ueda
    • H03M7/02
    • G09B29/10G01C21/20G09B29/00
    • A method of transforming a geographic coordinate to a geographic location code includes the steps of: retrieving a latitude value and a longitude value of the geographic coordinate; quantizing the latitude value to a first integer value; quantizing the longitude value to a second integer value; converting the first integer value to a first code string, said first code string including a first digit representing a non-numeric character, a second digit representing a non-numeric character, and a third digit representing a numeric character; converting the second integer value to a second code string, said second code string including a fourth digit representing a non-numeric character, a fifth digit representing a non-numeric character, and a sixth digit representing a numeric character; and combining the first code string and the second code string to obtain the geographic location code having a fixed pattern of radix in a mixed radix notation system representation.
    • 将地理坐标变换为地理位置码的方法包括以下步骤:检索地理坐标的纬度值和经度值; 将纬度值量化为第一个整数值; 将经度值量化为第二整数值; 将所述第一整数值转换为第一代码串,所述第一代码串包括表示非数字字符的第一数字,表示非数字字符的第二数字和表示数字字符的第三数字; 将所述第二整数值转换为第二代码串,所述第二代码串包括表示非数字字符的第四数字,表示非数字字符的第五数字和表示数字字符的第六数字; 以及组合所述第一代码串和所述第二代码串,以获得具有固定模式的基数的地理位置代码。