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    • 22. 发明授权
    • Non volatile memory
    • 非易失性存储器
    • US07426136B2
    • 2008-09-16
    • US11130274
    • 2005-05-17
    • Ryotaro SakuraiHitoshi TanakaSatoshi NodaKoji Shigematsu
    • Ryotaro SakuraiHitoshi TanakaSatoshi NodaKoji Shigematsu
    • G11C16/30
    • G11C16/3409G11C11/5621G11C16/225G11C16/30G11C16/3404
    • An electrically programmable and erasable non-volatile semiconductor memory such as a flash memory is designed into a configuration in which, when a cutoff of the power supply occurs in the course of a write or erase operation carried out on a memory cell employed in the non-volatile semiconductor memory, the operation currently being executed is discontinued and a write-back operation is carried out to change a threshold voltage of the memory cell in the reversed direction. In addition, the configuration also allows the number of charge-pump stages in an internal power-supply configuration to be changed in accordance with the level of a power-supply voltage so as to make the write-back operation correctly executable. As a result, no memory cells are put in deplete state even in the event of a power-supply cutoff in the course of a write or erase operation.
    • 一种电可编程和可擦除的非易失性半导体存储器,例如闪速存储器被设计成这样的配置,其中当在非非易失性存储器中使用的存储器单元执行写入或擦除操作的过程中发生电源的截止时, 不稳定的半导体存储器,中断正在执行的操作,并且执行回写操作以改变存储单元在相反方向上的阈值电压。 此外,该配置还允许根据电源电压的电平来改变内部电源配置中的电荷泵级数,以使回写操作正确执行。 结果,即使在写入或擦除操作的过程中电源断开的情况下,也不会将存储器单元置于耗尽状态。
    • 23. 发明申请
    • Semiconductor integrated circuit supplying temperature signal as digital value
    • 半导体集成电路提供温度信号作为数字值
    • US20080059110A1
    • 2008-03-06
    • US11896295
    • 2007-08-30
    • Hiroki FujisawaHitoshi TanakaAtsuo Koshizuka
    • Hiroki FujisawaHitoshi TanakaAtsuo Koshizuka
    • G01K1/00
    • G01K7/015G01K2219/00
    • A semiconductor integrated circuit includes a temperature detecting unit that detects the temperature of a chip, and an A/D converter that converts an analog output VBE from the temperature detecting unit into a digital output. The A/D converter includes an up/down counter, a D/A converter that converts an output T2 from the up/down counter into an analog output, and a comparator that compares the analog output DAC_OUT of the D/A converter and the analog output VBE (VTEMP) of the temperature detecting unit. The up/down counter is adapted to be able to preset an initial value that is different from the minimum value or the maximum value. Accordingly, the determination time required at the initial conversion can be reduced although the linear search method is used.
    • 半导体集成电路包括检测芯片的温度的温度检测单元和将来自温度检测单元的模拟输出VBE转换为数字输出的A / D转换器。 A / D转换器包括一个向上/向下计数器,一个将输出T 2从上/下计数器转换为模拟输出的D / A转换器,以及比较器,用于将D / A转换器的模拟输出DAC_OUT和 温度检测单元的模拟输出VBE(VTEMP)。 上/下计数器适于能够预设不同于最小值或最大值的初始值。 因此,尽管使用线性搜索方法,但是可以减少初始转换所需的确定时间。
    • 26. 发明申请
    • Test circuit for semiconductor device
    • 半导体器件测试电路
    • US20070208966A1
    • 2007-09-06
    • US11709786
    • 2007-02-23
    • Hiroyuki FukuyamaTakeru YonagaHitoshi Tanaka
    • Hiroyuki FukuyamaTakeru YonagaHitoshi Tanaka
    • G06K5/04
    • G11C29/30G11C2029/0405G11C2029/3202
    • A semiconductor test circuit includes an input terminal, a controller, a setting circuit, a command generator, a transmission path switching circuit and a comparator. The input terminal receives a serial data including a command code and a control data. The controller receives a control signal and outputs an internal control signal based on the control signal. The setting circuit receives the serial data and outputs it in response to the internal control signal. The command generator generates an interface signal based on the serial data received from the setting circuit. The switching circuit has ports, receives the signal from one of the ports and outputs the received signal to another one of the ports in response to the internal control signal and the command code. The comparator compares the interface signal received from the command generator with the signal received from the switching circuit.
    • 半导体测试电路包括输入端子,控制器,设置电路,命令发生器,传输路径切换电路和比较器。 输入端子接收包括命令码和控制数据的串行数据。 控制器接收控制信号,并根据控制信号输出内部控制信号。 设置电路接收串行数据并根据内部控制信号输出。 命令发生器基于从设置电路接收的串行数据生成接口信号。 开关电路具有端口,从一个端口接收信号,并响应于内部控制信号和命令码将接收的信号输出到另一个端口。 比较器将从命令发生器接收的接口信号与从开关电路接收的信号进行比较。
    • 29. 发明授权
    • Cam mechanism for lens barrel
    • 镜筒的凸轮机构
    • US06906871B2
    • 2005-06-14
    • US10731474
    • 2003-12-10
    • Hitoshi TanakaTakamitsu SasakiKunihiko Shimizu
    • Hitoshi TanakaTakamitsu SasakiKunihiko Shimizu
    • G02B7/04G02B7/10G02B15/14
    • G02B15/14G02B7/102
    • A cam mechanism for a lens barrel includes an annular member which is linearly guided along an optical axis, and having a cam follower on an outer peripheral surface; a cam ring having a cam groove on an inner peripheral surface including a photographing section and an accommodation section, the cam follower being engaged in the cam groove; and a biasing device for biasing the annular member forward to normally press the cam follower against a front cam surface in the cam groove. A rear end portion of the cam groove is open at a rear end surface of the cam ring to serve as the accommodation section, and the cam follower is disengageable from the front cam surface in the cam groove against a biasing force of the biasing device when the cam follower is engaged in the accommodation section.
    • 用于透镜镜筒的凸轮机构包括沿着光轴线性地引导并且在外周面上具有凸轮从动件的环形构件; 凸轮环,其在包括拍摄部分和收纳部分的内周表面上具有凸轮槽,所述凸轮从动件接合在所述凸轮槽中; 以及偏置装置,用于向前偏压环形构件,以正常地将凸轮从动件抵靠在凸轮槽中的前凸轮表面。 所述凸轮槽的后端部在所述凸轮环的后端面开口,以作为所述容纳部,并且所述凸轮从动件抵抗所述偏置装置的偏置力而与所述凸轮槽的前凸轮面脱离接触, 凸轮从动件接合在容纳部中。