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    • 23. 发明授权
    • Vaporizing material at a uniform rate
    • 蒸发材料以均匀的速度
    • US07989021B2
    • 2011-08-02
    • US11190653
    • 2005-07-27
    • Michael LongBruce E. Koppe
    • Michael LongBruce E. Koppe
    • C23C16/448
    • C23C14/246
    • A method of vaporizing material at a uniform rate for forming a layer on a substrate includes feeding a column of vaporizable material from a temperature controlled region maintained below the vaporizable material's effective vaporization temperature to a source of vaporization energy, wherein the volume of the column can vary during vaporization; and providing a source of vaporization energy delivering a constant heat flux to the surface of the column so that a uniform volume per unit time of the vaporizable material is vaporized to form the layer on the substrate, irrespective of the feeding rate.
    • 以均匀的速率蒸发材料以在衬底上形成层的方法包括将可蒸发材料柱从保持在可蒸发材料的有效蒸发温度以下的温度控制区域供给到蒸发能源,其中柱的体积可以 在蒸发期间变化; 并且提供蒸发能量源,其将恒定的热通量输送到塔的表面,使得可蒸发材料的每单位时间的均匀体积被蒸发以在基材上形成层,而与进料速率无关。
    • 24. 发明申请
    • Device and Method for Vaporizing Temperature Sensitive Materials
    • 蒸发温度敏感材料的装置和方法
    • US20100206233A1
    • 2010-08-19
    • US12768312
    • 2010-04-27
    • Michael LongRandolph C. BrostJeremy M. GraceDennis R. FreemanNeil P. ReddenBruce E. Koppe
    • Michael LongRandolph C. BrostJeremy M. GraceDennis R. FreemanNeil P. ReddenBruce E. Koppe
    • C23C16/00
    • C23C14/243C23C14/12H01L51/001H01L51/0059H01L51/0077H01L51/0081
    • A device vaporizes organic materials onto a substrate surface to form a film. The device includes a vaporization apparatus to receive a quantity of organic material that can have one or more components each having a different vaporization temperature, the vaporization apparatus having a first region and a second region spaced from the first region; a cooling unit to actively cool the organic material in the first region so that each of the one or more organic components is maintained well below its vaporization temperature to reduce degradation of the organic material; heating unit to heat the second region of the vaporization apparatus above the vaporization temperature of each of the one or more organic components; and a metering unit having a permeable member to meter organic material at a controlled rate from the first region into the second region so that a thin cross section of the organic material is heated at a desired rate-dependent vaporization temperature, whereby organic material vaporizes and forms a film on the substrate surface.
    • 装置将有机材料蒸发到基材表面上以形成膜。 该装置包括一个蒸发装置,用于接收一定量的有机材料,该有机材料可以具有各自具有不同蒸发温度的一种或多种组分,该蒸发装置具有第一区域和与该第一区域间隔开的第二区域; 冷却单元,用于主动冷却第一区域中的有机材料,使得一种或多种有机组分中的每一种保持在低于其蒸发温度以降低有机材料的降解; 加热单元以将所述蒸发装置的所述第二区域加热到所述一个或多个有机组分中的每一个的蒸发温度之上; 以及计量单元,其具有以从第一区域到第二区域的受控速率计量有机材料的渗透构件,使得有机材料的薄横截面以期望的速率依赖性蒸发温度被加热,由此有机材料蒸发, 在基板表面上形成膜。
    • 26. 发明授权
    • Apparatus and method for measuring particle contamination
    • 测量颗粒污染的仪器和方法
    • US5373365A
    • 1994-12-13
    • US995435
    • 1992-12-23
    • Paul T. BrownBruce E. KoppeRobert Lewis Walton
    • Paul T. BrownBruce E. KoppeRobert Lewis Walton
    • G01N21/89G01N21/86G01N21/892G01N21/94G01N21/84
    • G01N21/94G01N21/4738G01N21/86
    • An apparatus, and a method for its use, for measuring particulate contamination on a web (10) in a web-cleaning system having means for contacting and removing particles from the web (12). The means for contacting and removing particles has a particle-collecting surface (14). A light source (16) is positioned to direct a light beam against the particle-collecting surface. A sensor (18) senses the intensity of light reflected from the particle collecting surface and generates a signal R.sub.0 representative of the initial reflected light intensity prior to particle collection by the particle collecting surface and a signal R.sub.f representative of the reflected light intensity after particle collection by the particle collecting surface, the difference between R.sub.0 and R.sub.f being a measure of the particulate contamination level on the web.
    • 一种用于测量幅材清洁系统中的幅材(10)上的微粒污染物的装置及其使用方法,其具有用于从所述幅材(12)接触和除去颗粒的装置。 用于接触和除去颗粒的装置具有颗粒收集表面(14)。 光源(16)被定位成将光束引导到颗粒收集表面。 传感器(18)感测从颗粒收集表面反射的光的强度,并产生代表颗粒收集表面的颗粒收集之前的初始反射光强度的信号R0,以及代表颗粒收集后的反射光强度的信号Rf 通过颗粒收集表面,R0和Rf之间的差异是幅材上颗粒污染物水平的量度。
    • 27. 发明授权
    • Magnetic position sensor
    • 磁性位置传感器
    • US5177631A
    • 1993-01-05
    • US728910
    • 1991-06-28
    • David M. OrlickiBruce E. KoppeJohn M. Kresock
    • David M. OrlickiBruce E. KoppeJohn M. Kresock
    • B41J2/44G01R5/16G02B26/10
    • G01R5/16G02B26/10
    • A beam scanning galvanometer is disclosed which oscillates a mirror in a non-resonant mode. The moving parts of the galvanometer are made with as small a moment of inertia as possible because the mirror is oscillated in a non-resonant mode. The galvanometer uses two sets of crossed leaf-springs to support the mirror instead of bearings which are usually used in non-resonant galvanometers. Each of the sets of leaf-springs is formed of a single strip of cold rolled stainless steel. The springs are embedded in uniquely shaped cavities in a permanent magnet that supports the mirror at a distance very close to an axis of rotation of the mirror. The mirror is specially shaped with beveled edges so that its moment of inertia is low and so that it can oscillate in very close proximity to a driving current coil which surrounds the mirror supporting magnet. A magnetic position sensor is used to detect as angular position of the mirror during operation of the galvanometer. A compensating system eliminates distorting magnetic field effects from a magnetic driving system from adversely influencing the magnetic position sensor. Signals from the magnetic position sensor are usable to provide accurate feedback information to a galvanometer driving system.