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21. 发明申请

US20070040128A1 Processing apparatus using focused charged particle beam 有权
标题翻译：使用聚焦带电粒子束的处理装置
公开(公告)号：US20070040128A1
公开(公告)日：2007-02-22
申请号：US11501629
申请日：2006-08-09
申请人： Yo Yamamoto , Haruo Takahashi , Toshiaki Fujii
发明人： Yo Yamamoto , Haruo Takahashi , Toshiaki Fujii
IPC分类号： H01J37/20
CPC分类号： G01N1/32
摘要： A sample to be observed or processed with a focused charged particle beam is formed small, and only the micro sample is locally cooled. Alternatively, a sample mount part is used which has the structure that can relax a thermal drift.
摘要翻译：用聚焦带电粒子束观察或加工的样品形成较小，并且只有微样品局部冷却。或者，使用具有可以放松热漂移的结构的样品安装部件。

22. 发明授权

US08198603B2 Sample preparing device and sample posture shifting method 有权
标题翻译：样品制备装置和样品姿态转换方法
公开(公告)号：US08198603B2
公开(公告)日：2012-06-12
申请号：US12290397
申请日：2008-10-29
申请人： Haruo Takahashi , Ikuko Nakatani , Junichi Tashiro
发明人： Haruo Takahashi , Ikuko Nakatani , Junichi Tashiro
IPC分类号： H01J37/20 , G21K5/10 , G01N1/28
CPC分类号： H01J37/20 , H01J37/023 , H01J37/3056 , H01J2237/202 , H01J2237/204 , H01J2237/2062 , H01J2237/208 , H01J2237/31745 , H01J2237/31749
摘要： A sample preparing device has a sample stage that supports a sample and undergoes rotation about a first rotation axis to bring a preselected direction of the sample piece into coincidence with an intersection line between a first plane formed by a surface of the sample piece and a second plane. A manipulator holds sample piece of the sample and undergoes rotation about a second rotation axis independently of the sample stage to rotate the sample piece to a preselected position in the state in which the preselected direction of the sample piece coincides with the intersection line. The manipulator is disposed relative to the sample stage so that an angle between the second rotation axis and the surface of the sample is in the range of 0° to 45°. The second plane corresponds to a plane obtained by rotating around the second rotation axis a line segment which is vertical to the surface of the sample and of which one end corresponds to an intersection between the surface of the sample and the second rotation axis.
摘要翻译：样品制备装置具有样品台，其支撑样品并围绕第一旋转轴线旋转以使样品片的预选方向与由样品片的表面形成的第一平面和第二面之间的交线相符，飞机操纵器保持样品的样品并且独立于样品台绕第二旋转轴旋转，以在样品的预选方向与交叉线重合的状态下将样品片旋转到预选位置。操纵器相对于样品台设置，使得第二旋转轴与样品表面之间的角度在0°至45°的范围内。第二平面对应于通过围绕第二旋转轴旋转垂直于样品表面的线段并且其一端对应于样品表面和第二旋转轴线之间的交叉而获得的平面。

23. 发明授权

US07964382B2 DNA encoding a protein having D-lactate dehydrogenase activity and uses thereof 有权
标题翻译：编码具有D-乳酸脱氢酶活性的蛋白质的DNA及其用途
公开(公告)号：US07964382B2
公开(公告)日：2011-06-21
申请号：US12324804
申请日：2008-11-26
申请人： Nobuhiro Ishida , Kenro Tokuhiro , Haruo Takahashi , Eiji Nagamori , Masana Hirai , Satoshi Saitoh , Tohru Ohnishi
发明人： Nobuhiro Ishida , Kenro Tokuhiro , Haruo Takahashi , Eiji Nagamori , Masana Hirai , Satoshi Saitoh , Tohru Ohnishi
IPC分类号： C12N9/04 , C12N1/20 , C12N15/00 , C12P7/56 , C12P21/04 , C12Q1/00 , C12Q1/68 , C12Q1/32 , C07H21/04
CPC分类号： C12N9/0006 , C12P7/56 , C12P7/625
摘要： This invention provides a polynucleotide that encodes a protein having lactate dehydrogenase activity and such protein that can be used for producing D-lactic acid. This polynucleotide has the nucleotide sequence as shown in SEQ ID NO: 1 (a), and it hybridizes under stringent conditions with a probe comprising all or part of the nucleotide sequence as shown in SEQ ID NO: 1 or a complementary strand thereof and encodes a protein having D-lactate dehydrogenase activity (b).
摘要翻译：本发明提供编码具有乳酸脱氢酶活性的蛋白质的多核苷酸和可用于生产D-乳酸的蛋白质。该多核苷酸具有SEQ ID NO：1（a）所示的核苷酸序列，并且在严格条件下与包含SEQ ID NO：1所示的全部或部分核苷酸序列或其互补链的探针杂交，并编码具有D-乳酸脱氢酶活性的蛋白质（b）。

24. 发明授权

US07755044B2 Apparatus for working and observing samples and method of working and observing cross sections 有权
标题翻译：用于工作和观察样品的装置和工作和观察截面的方法
公开(公告)号：US07755044B2
公开(公告)日：2010-07-13
申请号：US12047013
申请日：2008-03-12
申请人： Toshiaki Fujii , Haruo Takahashi , Junichi Tashiro
发明人： Toshiaki Fujii , Haruo Takahashi , Junichi Tashiro
IPC分类号： G21K5/04 , G21K5/10
CPC分类号： H01J37/3056 , G01N1/286 , H01J2237/31745
摘要： The apparatus for working and observing samples comprises a sample plate on which a sample is to be placed; a first ion beam lens barrel capable of irradiating a first ion beam over a whole predetermined irradiation range at one time; a mask that can be arranged between the sample plate and the first ion beam lens barrel, and shields part of the first ion beam; mask-moving means capable of moving the mask; a charged particle beam lens barrel capable of scanning a focused beam of charged particles in the range irradiated with the first ion beam; and detection means capable of detecting a secondarily generated substance.
摘要翻译：用于工作和观察样品的装置包括样品板，样品板将放置在样品板上; 一次能够在整个预定照射范围内照射第一离子束的第一离子束透镜镜筒; 可以在样品板和第一离子束透镜筒之间布置的掩模，并且屏蔽第一离子束的一部分; 掩模移动装置，能够移动面罩; 带电粒子束透镜镜筒，其能够扫描在第一离子束照射的范围内的聚集的带电粒子束; 以及能够检测次要生成物质的检测装置。

25. 发明授权

US07718981B2 Composite charged-particle beam system 有权
标题翻译：复合带电粒子束系统
公开(公告)号：US07718981B2
公开(公告)日：2010-05-18
申请号：US12134919
申请日：2008-06-06
申请人： Haruo Takahashi , Yo Yamamoto , Toshiaki Fujii
发明人： Haruo Takahashi , Yo Yamamoto , Toshiaki Fujii
IPC分类号： G01N23/00
CPC分类号： H01J37/20 , H01J37/3056 , H01J2237/20242 , H01J2237/31745 , H01J2237/31749
摘要： There is provided a method of arranging, as a composite charged-particle beam system, a gas ion beam apparatus, an FIB and an SEM in order to efficiently prepare a TEM sample. The composite charged-particle beam system includes an FIB lens-barrel 1, an SEM lens-barrel 2, a gas ion beam lens-barrel 3, and a rotary sample stage 9 having an eucentric tilt mechanism and a rotating shaft 10 orthogonal to an eucentric tilt axis 8. In the composite charged-particle beam system, an arrangement is made such that a focused ion beam 4, an electron beam 5 and a gas ion beam 6 intersect at a single point, an axis of the FIB lens-barrel 1 and an axis of the SEM lens barrel 2 are orthogonal to the eucentric tilt axis 8, respectively, and the axis of the FIB lens-barrel 1, an axis of the gas ion beam lens-barrel 3 and the eucentric tilt axis 8 are in one plane.
摘要翻译：提供了一种作为复合带电粒子束系统布置气体离子束装置，FIB和SEM以便有效地制备TEM样品的方法。复合带电粒子束系统包括FIB透镜镜筒1，SEM透镜镜筒2，气体离子束透镜镜筒3以及具有偏心倾斜机构的旋转样品台9和与其垂直的旋转轴10 在复合带电粒子束系统中，使得聚焦离子束4，电子束5和气体离子束6在单点相交，FIB透镜镜筒的轴线 1并且SEM透镜镜筒2的轴线分别与偏心倾斜轴8正交，并且FIB透镜镜筒1的轴线，气体离子束透镜镜筒3的轴线和偏心倾斜轴线8是在一架飞机上

26. 发明申请

US20090114842A1 Sample preparing device and sample posture shifting method 有权
标题翻译：样品制备装置和样品姿态转换方法
公开(公告)号：US20090114842A1
公开(公告)日：2009-05-07
申请号：US12290397
申请日：2008-10-29
申请人： Haruo Takahashi , Ikuko Nakatani , Junichi Tashiro
发明人： Haruo Takahashi , Ikuko Nakatani , Junichi Tashiro
IPC分类号： G21K5/10
CPC分类号： H01J37/20 , H01J37/023 , H01J37/3056 , H01J2237/202 , H01J2237/204 , H01J2237/2062 , H01J2237/208 , H01J2237/31745 , H01J2237/31749
摘要： After a certain direction of a sample piece is allowed to coincide with an intersection line made by two planes of a surface of the sample and a conical side plane obtained by rotating, around a manipulator rotation axis, a line segment which is vertical to the surface of the sample and of which one end is an intersection of the surface of a sample and the manipulator rotation axis, the sample piece is supported by a manipulator and the manipulator rotation axis is operated.
摘要翻译：在样品的一定方向被允许与由样品表面的两个平面形成的交线和通过围绕机械手旋转轴线旋转而获得的圆锥形侧面的与表面垂直的线段并且其一端是样品的表面与操纵器旋转轴线的交点，样品片由操纵器支撑并且操纵器旋转轴被操作。

27. 发明申请

US20080315088A1 COMPOSITE CHARGED-PARTICLE BEAM SYSTEM 有权
标题翻译：复合充电粒子束系统
公开(公告)号：US20080315088A1
公开(公告)日：2008-12-25
申请号：US12134919
申请日：2008-06-06
申请人： Haruo Takahashi , Yo YAMAMOTO , Toshiaki FUJII
发明人： Haruo Takahashi , Yo YAMAMOTO , Toshiaki FUJII
IPC分类号： G01N23/00
CPC分类号： H01J37/20 , H01J37/3056 , H01J2237/20242 , H01J2237/31745 , H01J2237/31749
摘要： There is provided a method of arranging, as a composite charged-particle beam system, a gas ion beam apparatus, an FIB and an SEM in order to efficiently prepare a TEM sample. The composite charged-particle beam system includes an FIB lens-barrel 1, an SEM lens-barrel 2, a gas ion beam lens-barrel 3, and a rotary sample stage 9 having an eucentric tilt mechanism and a rotating shaft 10 orthogonal to an eucentric tilt axis 8. In the composite charged-particle beam system, an arrangement is made such that a focused ion beam 4, an electron beam 5 and a gas ion beam 6 intersect at a single point, an axis of the FIB lens-barrel 1 and an axis of the SEM lens barrel 2 are orthogonal to the eucentric tilt axis 8, respectively, and the axis of the FIB lens-barrel 1, an axis of the gas ion beam lens-barrel 3 and the eucentric tilt axis 8 are in one plane.
摘要翻译：提供了一种作为复合带电粒子束系统布置气体离子束装置，FIB和SEM以便有效地制备TEM样品的方法。复合带电粒子束系统包括FIB透镜镜筒1，SEM透镜镜筒2，气体离子束透镜镜筒3以及具有偏心倾斜机构的旋转样品台9和与其垂直的旋转轴10 在复合带电粒子束系统中，使得聚焦离子束4，电子束5和气体离子束6在单点相交，FIB透镜镜筒的轴线 1并且SEM透镜镜筒2的轴线分别与偏心倾斜轴8正交，并且FIB透镜镜筒1的轴线，气体离子束透镜镜筒3的轴线和偏心倾斜轴线8是在一架飞机上

28. 发明申请

US20070105202A1 Dna encoding a protein having d-lactate dehydrogenase activity and uses thereof 审中-公开
标题翻译： Dna编码具有d-乳酸脱氢酶活性的蛋白质及其用途
公开(公告)号：US20070105202A1
公开(公告)日：2007-05-10
申请号：US10557306
申请日：2004-05-21
申请人： Nobuhiro Ishida , Kenro Tokuhiro , Haruo Takahashi , Eiji Nagamori , Masana Hirai , Satoshi Saitoh , Tohru Ohnishi
发明人： Nobuhiro Ishida , Kenro Tokuhiro , Haruo Takahashi , Eiji Nagamori , Masana Hirai , Satoshi Saitoh , Tohru Ohnishi
IPC分类号： C12P7/62 , C12P7/56 , C07H21/04 , C12N9/02 , C12N15/74
CPC分类号： C12N9/0006 , C12P7/56 , C12P7/625
摘要： This invention provides a polynucleotide that encodes a protein having lactate dehydrogenase activity and such protein that can be used for producing D-lactic acid. This polynucleotide has the nucleotide sequence as shown in SEQ ID NO: 1 (a), and it hybridizes under stringent conditions with a probe comprising all or part of the nucleotide sequence as shown in SEQ ID NO: 1 or a complementary strand thereof and encodes a protein having D-lactate dehydrogenase activity (b).
摘要翻译：本发明提供编码具有乳酸脱氢酶活性的蛋白质的多核苷酸和可用于生产D-乳酸的蛋白质。该多核苷酸具有SEQ ID NO：1（a）所示的核苷酸序列，并且在严格条件下与包含SEQ ID NO：1所示的全部或部分核苷酸序列或其互补链的探针杂交，并编码具有D-乳酸脱氢酶活性的蛋白质（b）。

29. 发明申请

US20070072267A1 Transformant having galactose induction system and use thereof 审中-公开
标题翻译：具有半乳糖诱导系统的转化体及其用途
公开(公告)号：US20070072267A1
公开(公告)日：2007-03-29
申请号：US11529443
申请日：2006-09-29
申请人： Takashi Matsuyama , Haruo Takahashi , Kenro Tokuhiro , Nobuhiro Ishida , Eiji Nagamori
发明人： Takashi Matsuyama , Haruo Takahashi , Kenro Tokuhiro , Nobuhiro Ishida , Eiji Nagamori
IPC分类号： C07K14/47 , C07H21/04 , C12P21/06 , C12N1/18 , C12N15/74
CPC分类号： C12N15/81 , C07K14/395 , C12N15/815
摘要： The present invention provides a transformant having a gene expression inducing system having better responsiveness. The transformant of the invention has a galactose induction system and retains a coding region having a galactose induction system and encoding an assisting protein assisting transcription activation by a protein having the Gal4 activity under control of a constitutive promoter, and a coding region encoding an endogenous or exogenous desired protein under control of a galactose-inducible promoter.
摘要翻译：本发明提供具有更好反应性的基因表达诱导体系的转化体。本发明的转化体具有半乳糖诱导系统，并保留了具有半乳糖诱导系统的编码区，并且编码辅助蛋白质，其辅助转录激活由具有组成型启动子控制下的Gal4活性的蛋白质和编码区域编码内源或在半乳糖诱导型启动子控制下的外源性所需蛋白质。

30. 发明申请

US20070045560A1 Charged particle beam apparatus 有权
标题翻译：带电粒子束装置
公开(公告)号：US20070045560A1
公开(公告)日：2007-03-01
申请号：US11509520
申请日：2006-08-24
申请人： Haruo Takahashi , Toshiaki Fujii , Yutaka Ikku , Kouji Iwasaki , Yo Yamamoto
发明人： Haruo Takahashi , Toshiaki Fujii , Yutaka Ikku , Kouji Iwasaki , Yo Yamamoto
IPC分类号： H01J37/20 , G01N1/28
CPC分类号： H01J37/304 , G01N1/32 , H01J2237/31745 , H01J2237/31749
摘要： To include a focused ion beam apparatus fabricating a sliced specimen by processing a specimen as well as observing the sliced specimen, a scanning electron microscope observing the slice specimen, a gas-ion beam irradiation apparatus performing finishing processing by irradiating a gas-ion beam onto a surface of the sliced specimen, a specimen stage on which the sliced specimen is fixed and having at least one or more rotation axis, a specimen posture recognition means recognizing positional relation of the sliced specimen with respect to the specimen stage and a specimen stage control means controlling the specimen stage based on a specimen posture recognized by the posture recognition means and an installation angle of the gas-ion beam irradiation apparatus in order to allow an incident angle of the gas-ion beam with respect to the obverse or the reverse of the sliced specimen to be a desired value.
摘要翻译：为了包括聚焦离子束装置，通过加工试样和观察切片试样来制造切片样品，观察切片试样的扫描电子显微镜，气相离子束照射装置，通过将气体离子束照射到切片试样的表面，切片试样固定并具有至少一个以上的旋转轴的试样台，识别切片试样相对于试样台的位置关系的试样姿势识别装置和试样台控制意味着基于由姿势识别装置识别的样本姿势和气体离子束照射装置的安装角度来控制样本台，以便允许气体离子束相对于正面或反向的入射角切片样品为期望值。

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