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21. 发明申请

US20080316930A1 Robust Cable Connectivity Test Receiver For High-Speed Data Receiver 有权
标题翻译：用于高速数据接收器的坚固的电缆连接测试接收器
公开(公告)号：US20080316930A1
公开(公告)日：2008-12-25
申请号：US11766268
申请日：2007-06-21
申请人： Huihao Xu , Louis L. Hsu , Kevin G. Kramer , James D. Rockrohr , Michael A. Sorna
发明人： Huihao Xu , Louis L. Hsu , Kevin G. Kramer , James D. Rockrohr , Michael A. Sorna
IPC分类号： G01R31/08
CPC分类号： G01R31/041 , G01R31/026
摘要： A system is provided for detecting a fault in a signal transmission path. In one embodiment, the system can include a variable amplitude signal attenuator which is operable to modify an input signal by variably attenuating a signal voltage swing of the input signal. Desirably, the input signal is attenuated only when transitioning from a high signal voltage level towards a low signal voltage level d variably, such that a larger high-to-low signal voltage swing is attenuated more than a smaller high-to-low signal voltage swing. Desirably, a comparator, which may apply hysteresis to the output signals, may detect a crossing of a reference voltage level by the modified input signal. In this way, when the comparator does not detect an expected crossing of the reference voltage level by the modified input signal, a determination can be made that a fault exists in the signal transmission path.
摘要翻译：提供了一种用于检测信号传输路径中的故障的系统。在一个实施例中，系统可以包括可变幅度信号衰减器，其可操作以通过可变地衰减输入信号的信号电压摆幅来修改输入信号。期望地，只有当从高信号电压电平转换到低信号电压电平d时，输入信号才被衰减，使得较高的高电平到低的信号电压摆幅比较小的高到低的信号电压衰减摇摆。期望地，可能对输出信号施加迟滞的比较器可以检测参考电压电平与修改的输入信号的交叉。以这种方式，当比较器没有检测到通过修改的输入信号的参考电压电平的预期交叉时，可以确定在信号传输路径中存在故障。

22. 发明申请

US20090132985A1 Design structure for on-chip electromigration monitoring system 有权
标题翻译：片上电迁移监控系统的设计结构
公开(公告)号：US20090132985A1
公开(公告)日：2009-05-21
申请号：US11985966
申请日：2007-11-19
申请人： Louis L. Hsu , Hayden C. Cranford, JR. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
发明人： Louis L. Hsu , Hayden C. Cranford, JR. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G01R31/2858
摘要： A design structure embodied in a machine readable medium used in a design process can include apparatus of a semiconductor chip operable to detect an increase in resistance of a monitored element of the semiconductor chip. The design structure can include, for example, a resistive voltage divider circuit operable to output a plurality of reference voltages having different values. A plurality of comparators in the semiconductor chip may be coupled to receive the reference voltages and a monitored voltage representative of a resistance of the monitored element. Each of the comparators may produce an output indicating whether the monitored voltage exceeds the reference voltages, so that the resistance value of the monitored element may be precisely determined.
摘要翻译：体现在设计过程中使用的机器可读介质中的设计结构可以包括半导体芯片的装置，其可操作以检测半导体芯片的被监测元件的电阻的增加。该设计结构可以包括例如可操作以输出具有不同值的多个参考电压的电阻分压器电路。可以将半导体芯片中的多个比较器耦合以接收参考电压和表示所监视元件的电阻的监视电压。每个比较器可以产生指示监视的电压是否超过参考电压的输出，使得可以精确地确定被监视元件的电阻值。

23. 发明申请

US20080265931A1 On-chip electromigration monitoring 有权
标题翻译：片上电迁移监测
公开(公告)号：US20080265931A1
公开(公告)日：2008-10-30
申请号：US12215732
申请日：2008-06-30
申请人： Louis L. Hsu , Hayden C. Cranford , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
发明人： Louis L. Hsu , Hayden C. Cranford , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
IPC分类号： G01R31/26
CPC分类号： G01R31/2858 , G01R31/2884 , G01R31/318533
摘要： A method is provided for monitoring interconnect resistance within a semiconductor chip assembly. A semiconductor chip assembly can include a semiconductor chip having contacts exposed at a surface of the semiconductor chip and a substrate having exposed terminals in conductive communication with the contacts. A plurality of monitored elements of the semiconductor chip can include conductive interconnects, each interconnecting a respective pair of nodes of the semiconductor chip through wiring within the semiconductor chip. In an example of such method, a voltage drop across each monitored element is compared with a reference voltage drop across a respective reference element on the semiconductor chip at a plurality of different times during a lifetime of the semiconductor chip assembly. In that way, it can be detected when a resistance of such monitored element is over threshold. Based on a result of such comparison, a decision can be made whether to indicate an action condition.
摘要翻译：提供了一种用于监测半导体芯片组件内的互连电阻的方法。半导体芯片组件可以包括具有暴露在半导体芯片的表面处的触点的半导体芯片和具有与触点导电连通的暴露端子的基板。半导体芯片的多个受监测元件可以包括导电互连，每个导体互连通过半导体芯片内的布线互连半导体芯片的相应的一对节点。在这种方法的示例中，在半导体芯片组件的寿命期间，跨越每个被监测元件的电压降与在半导体芯片上的相应参考元件上的参考电压降在多个不同时间进行比较。以这种方式，当这种被监视的元件的电阻超过阈值时，可以检测它。基于这种比较的结果，可以做出是否指示动作条件的决定。

24. 发明授权

US07394273B2 On-chip electromigration monitoring system 有权
标题翻译：片上电迁移监控系统
公开(公告)号：US07394273B2
公开(公告)日：2008-07-01
申请号：US11306985
申请日：2006-01-18
申请人： Louis L. Hsu , Hayden C. Cranford, Jr. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
发明人： Louis L. Hsu , Hayden C. Cranford, Jr. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
IPC分类号： G01R31/02
CPC分类号： G01R31/2858 , G01R31/2884 , G01R31/318533
摘要： A packaged semiconductor chip is provided which includes a semiconductor chip and a package element. The semiconductor chip includes a plurality of semiconductor devices and a plurality of conductive features disposed at an exterior face of the semiconductor chip. The package element has a plurality of external features conductively connected to the plurality of conductive features of the semiconductor chip. The semiconductor chip includes a monitored element including a conductive interconnect that conductively interconnects a first node of the semiconductor chip to a second node of the semiconductor chip. A detection circuit in the semiconductor chip is operable to compare a variable voltage drop across the monitored element with a reference voltage drop across a reference element on the chip at a plurality of different times during a lifetime of the packaged semiconductor chip so as to detect when the resistance of the monitored element is over threshold.
摘要翻译：提供一种封装的半导体芯片，其包括半导体芯片和封装元件。半导体芯片包括多个半导体器件和设置在半导体芯片的外表面处的多个导电特征。封装元件具有导电连接到半导体芯片的多个导电特征的多个外部特征。半导体芯片包括被监视的元件，该元件包括将半导体芯片的第一节点与半导体芯片的第二节点导电互连的导电互连。半导体芯片中的检测电路可操作以在封装的半导体芯片的寿命期间的多个不同时间将所监视的元件上的可变电压降与芯片上的参考元件上的参考电压降进行比较，以便检测何时被监测元件的电阻超过阈值。

25. 发明申请

US20090128161A1 Structure for robust cable connectivity test receiver for high-speed data receiver 有权
标题翻译：用于高速数据接收机的坚固电缆连接测试接收机的结构
公开(公告)号：US20090128161A1
公开(公告)日：2009-05-21
申请号：US11985956
申请日：2007-11-19
申请人： Huihao Xu , Louis L. Hsu , Kevin G. Kramer , James D. Rockrohr , Michael A. Sorna
发明人： Huihao Xu , Louis L. Hsu , Kevin G. Kramer , James D. Rockrohr , Michael A. Sorna
IPC分类号： H04B3/46
CPC分类号： G06F11/24
摘要： A design structure embodied in a machine-readable medium used in a design process may include a system for detecting a fault in a signal transmission path. Such system may include, for example, a hysteresis comparator including a latch having n-type field effect transistor (“NFET”) storage elements. The hysteresis comparator may be operable to detect a crossing of a reference voltage level by an input signal arriving from the signal transmission path such that when the comparator does not detect an expected crossing of the reference voltage level by the input signal, the fault is determined to be detected in the signal transmission path.
摘要翻译：在设计过程中使用的机器可读介质中体现的设计结构可以包括用于检测信号传输路径中的故障的系统。这种系统可以包括例如包括具有n型场效应晶体管（“NFET”）存储元件的锁存器的滞后比较器。滞后比较器可以用于检测参考电压电平与从信号传输路径到达的输入信号的交叉，使得当比较器没有检测到参考电压电平与输入信号的预期交叉时，确定故障以在信号传输路径中被检测。

26. 发明授权

US07873922B2 Structure for robust cable connectivity test receiver for high-speed data receiver 有权
标题翻译：用于高速数据接收机的坚固电缆连接测试接收机的结构
公开(公告)号：US07873922B2
公开(公告)日：2011-01-18
申请号：US11985956
申请日：2007-11-19
申请人： Huihao Xu , Louis L. Hsu , Kevin G. Kramer , James D. Rockrohr , Michael A. Sorna
发明人： Huihao Xu , Louis L. Hsu , Kevin G. Kramer , James D. Rockrohr , Michael A. Sorna
IPC分类号： G06F17/50
CPC分类号： G06F11/24
摘要： A design structure embodied in a machine-readable medium used in a design process may include a system for detecting a fault in a signal transmission path. Such system may include, for example, a hysteresis comparator including a latch having n-type field effect transistor (“NFET”) storage elements. The hysteresis comparator may be operable to detect a crossing of a reference voltage level by an input signal arriving from the signal transmission path such that when the comparator does not detect an expected crossing of the reference voltage level by the input signal, the fault is determined to be detected in the signal transmission path.
摘要翻译：在设计过程中使用的机器可读介质中体现的设计结构可以包括用于检测信号传输路径中的故障的系统。这种系统可以包括例如包括具有n型场效应晶体管（“NFET”）存储元件的锁存器的滞后比较器。滞后比较器可以用于检测参考电压电平与从信号传输路径到达的输入信号的交叉，使得当比较器没有检测到参考电压电平与输入信号的预期交叉时，确定故障以在信号传输路径中被检测。

27. 发明授权

US07840916B2 Structure for on-chip electromigration monitoring system 有权
标题翻译：片上电迁移监控系统结构
公开(公告)号：US07840916B2
公开(公告)日：2010-11-23
申请号：US11985966
申请日：2007-11-19
申请人： Louis L. Hsu , Hayden C. Cranford, Jr. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
发明人： Louis L. Hsu , Hayden C. Cranford, Jr. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G01R31/2858
摘要： A design structure embodied in a machine readable medium used in a design process can include apparatus of a semiconductor chip operable to detect an increase in resistance of a monitored element of the semiconductor chip. The design structure can include, for example, a resistive voltage divider circuit operable to output a plurality of reference voltages having different values. A plurality of comparators in the semiconductor chip may be coupled to receive the reference voltages and a monitored voltage representative of a resistance of the monitored element. Each of the comparators may produce an output indicating whether the monitored voltage exceeds the reference voltages, so that the resistance value of the monitored element may be precisely determined.
摘要翻译：体现在设计过程中使用的机器可读介质中的设计结构可以包括半导体芯片的装置，其可操作以检测半导体芯片的被监测元件的电阻的增加。该设计结构可以包括例如可操作以输出具有不同值的多个参考电压的电阻分压器电路。可以将半导体芯片中的多个比较器耦合以接收参考电压和表示所监视元件的电阻的监视电压。每个比较器可以产生指示监视的电压是否超过参考电压的输出，使得可以精确地确定被监视元件的电阻值。

28. 发明授权

US07719302B2 On-chip electromigration monitoring 有权
标题翻译：片上电迁移监测
公开(公告)号：US07719302B2
公开(公告)日：2010-05-18
申请号：US12215732
申请日：2008-06-30
申请人： Louis L. Hsu , Hayden C. Cranford, Jr. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
发明人： Louis L. Hsu , Hayden C. Cranford, Jr. , Oleg Gluschenkov , James S. Mason , Michael A. Sorna , Chih-Chao Yang
IPC分类号： G01R31/02
CPC分类号： G01R31/2858 , G01R31/2884 , G01R31/318533
摘要： A method is provided for monitoring interconnect resistance within a semiconductor chip assembly, A semiconductor chip assembly can include a semiconductor chip having contacts exposed at a surface of the semiconductor chip and a substrate having exposed terminals in conductive communication with the contacts. A plurality of monitored elements of the semiconductor chip can include conductive interconnects, each interconnecting a respective pair of nodes of the semiconductor chip through wiring within the semiconductor chip. In an example of such method, a voltage drop across each monitored element is compared with a reference voltage drop across a respective reference element on the semiconductor chip at a plurality of different times during a lifetime of the semiconductor chip assembly. In that way, it can be detected when a resistance of such monitored element is over threshold. Based on a result of such comparison, a decision can be made whether to indicate an action condition.
摘要翻译：提供了一种用于监测半导体芯片组件内的互连电阻的方法。半导体芯片组件可以包括具有在半导体芯片的表面处露出的触点的半导体芯片和具有与触点导电连通的露出端子的基板。半导体芯片的多个受监测元件可以包括导电互连，每个导体互连通过半导体芯片内的布线互连半导体芯片的相应的一对节点。在这种方法的示例中，在半导体芯片组件的寿命期间，跨越每个被监测元件的电压降与在半导体芯片上的相应参考元件上的参考电压降在多个不同时间进行比较。以这种方式，当这种被监视的元件的电阻超过阈值时，可以检测它。基于这种比较的结果，可以做出是否指示动作条件的决定。

29. 发明授权

US07145413B2 Programmable impedance matching circuit and method 失效
标题翻译：可编程阻抗匹配电路及方法
公开(公告)号：US07145413B2
公开(公告)日：2006-12-05
申请号：US10250177
申请日：2003-06-10
申请人： Louis L. Hsu , Joseph Natonio , Daniel W. Storaska , William F. Washburn
发明人： Louis L. Hsu , Joseph Natonio , Daniel W. Storaska , William F. Washburn
IPC分类号： H03H7/38
CPC分类号： H03H7/38
摘要： As disclosed herein, a microelectronic circuit and method are provided for improving signal integrity at a transmission line. The circuit includes a programmably adjustable impedance matching circuit which is coupled to a transmission line which includes a programmably adjustable inductive element. The programmably adjustable impedance matching circuit is desirably provided on the same chip as a receiver or transmitter to which the transmission line is coupled, or alternatively, on an element packaged together with the chip that includes the receiver or transmitter. The impedance of the programmably adjustable impedance matching circuit is adjustable in response to control input to improve signal integrity at the transmission line.
摘要翻译：如本文所公开的，提供微电子电路和方法来改善传输线处的信号完整性。该电路包括可编程调节的阻抗匹配电路，其耦合到包括可编程调节的电感元件的传输线。可编程可调节阻抗匹配电路理想地设置在与传输线耦合的接收器或发射器相同的芯片上，或者替代地在与包括接收器或发射器的芯片一起封装的元件上。可编程可调阻抗匹配电路的阻抗可以响应于控制输入而调节，以改善传输线处的信号完整性。

30. 发明授权

US06975140B2 Adaptive data transmitter having rewriteable non-volatile storage 失效
标题翻译：自适应数据发射机具有可重写的非易失性存储
公开(公告)号：US06975140B2
公开(公告)日：2005-12-13
申请号：US10707199
申请日：2003-11-26
申请人： Louis L. Hsu , Brian L. Ji , William F. Washburn
发明人： Louis L. Hsu , Brian L. Ji , William F. Washburn
IPC分类号： H03H21/00 , H04L25/03 , H04L27/04 , H03H19/0175
CPC分类号： H04L25/03343 , H03H21/0012
摘要： A data transmitter and transmitting method are provided in which an adaptive finite impulse response (FIR) driver has a plurality of taps to which coefficients having updateable values are applied. The FIR driver has a transfer function between an input stream of data bits and an output stream of data bits such that each data bit output from the FIR driver has an amplitude adjusted as a function of the values of a plurality of data bits of the input stream, and the values of the coefficients. The data transmitter includes a rewriteable non-volatile storage, operable to be rewritten with control information representing the values of the coefficients updated during operation of the FIR driver.
摘要翻译：提供了一种数据发送器和发送方法，其中自适应有限脉冲响应（FIR）驱动器具有应用具有可更新值的系数的多个抽头。 FIR驱动器在数据位的输入流和数据位的输出流之间具有传递函数，使得从FIR驱动器输出的每个数据位的幅度根据输入的多个数据位的值而被调整流，以及系数的值。数据发送器包括可重写的非易失性存储器，可操作以用表示在FIR驱动器的操作期间更新的系数的值的控制信息进行重写。

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