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    • 21. 发明申请
    • ELECTRONIC APPARATUS
    • 电子设备
    • US20120139074A1
    • 2012-06-07
    • US13389776
    • 2010-08-05
    • Masayuki Abe
    • Masayuki Abe
    • H01L27/142
    • H01L27/16H01L31/105
    • Disclosed is an electronic apparatus in which a thermoelectric conversion element and at least one of a photoelectric conversion element and a transistor or a diode are monolithically integrated, or which prevents interference between a p-type thermoelectric conversion unit and an n-type thermoelectric conversion unit. This electronic apparatus includes a thermoelectric conversion element (100) including a semiconductor layer (38) which performs thermoelectric conversion and at least one of a photoelectric conversion element (102) in which at least a portion of the semiconductor layer (38) performs photoelectric conversion and a transistor (104) or a diode having at least a portion of the semiconductor layer (38) as an operating layer.
    • 公开了一种电子设备,其中热电转换元件和光电转换元件和晶体管或二极管中的至少一个是单片集成的,或者可以防止p型热电转换单元和n型热电转换单元之间的干扰 。 该电子设备包括:热电转换元件(100),其包括进行热电转换的半导体层(38)和至少一部分半导体层(38)进行光电转换的光电转换元件 以及具有半导体层(38)的至少一部分作为工作层的晶体管(104)或二极管。
    • 24. 发明授权
    • Atomic force microscope and interaction force measurement method using atomic force microscope
    • 原子力显微镜和相互作用力测量方法使用原子力显微镜
    • US07975316B2
    • 2011-07-05
    • US12523661
    • 2008-01-07
    • Masahiro OtaNoriaki OyabuMasayuki AbeOscar CustanceYoshiaki SugimotoSeizo Morita
    • Masahiro OtaNoriaki OyabuMasayuki AbeOscar CustanceYoshiaki SugimotoSeizo Morita
    • G01B5/28
    • G01Q60/32G01Q30/04Y10S977/863
    • A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLR derived from a long-range interaction force and a ΔfSR derived from a short-range interaction force. Given this factor, a Δf curve on an atomic defect and a Δf curve on a target atom on the sample surface are each measured for only a relatively short range scale (S1 and S2), and a difference Δf curve of those two curves is obtained (S3). Since the difference Δf curve is derived only from a short-range interaction force, a known conversion operation is applied to this curve obtain an F curve which illustrates the relationship between the force and the distance Z, and then the short-range interaction force on the target atom is obtained from the F curve (S4). Since the range scale in measuring the Δf curve can be narrowed, the measurement time can be shortened, and since the conversion from the Δf curve into F curve is required only once, the computational time can also be shortened. Consequently, in obtaining the short-range interaction force which acts between the atom on the sample surface and the probe, the time required for the Δf curve's measurement and the computational time are shortened, which leads to accuracy improvement and throughput enhancement.
    • 通过FM-AFM获得的频移和Dgr f可以通过从远程相互作用力得到的&Dgr; fLR和从短程相互作用力得到的&Dgr; fSR的简单线性耦合来表示。 考虑到这个因素,样品表面上的原子缺陷和目标原子上的&Dgr; f曲线每个都只测量相对较短的范围尺度(S1和S2),并且差分Dgr f曲线 得到这两条曲线(S3)。 由于差值Dgr f曲线仅来自短距离相互作用力,因此将已知的转换操作应用于该曲线,获得F曲线,该F曲线说明了力与距离Z之间的关系,然后是短距离相互作用 从F曲线获得目标原子上的力(S4)。 由于可以缩小&Dgr。f曲线的测量范围,所以可以缩短测量时间,由于从&Dgr。f曲线到F曲线的转换只需要一次,所以计算时间也可以缩短。 因此,在获得样品表面上的原子和探针之间作用的短程相互作用力时,缩短了&Dgr。f曲线测量所需的时间和计算时间,从而提高了精度和提高了生产率。
    • 26. 发明授权
    • Reflective liquid crystal display apparatus
    • 反光液晶显示装置
    • US07847867B2
    • 2010-12-07
    • US12544040
    • 2009-08-19
    • Masayuki Abe
    • Masayuki Abe
    • G02F1/1335
    • H04N9/315G02B27/283G02F2001/13355G02F2001/133638G02F2203/02H04N5/7441
    • At least one exemplary embodiment is directed to a reflective liquid crystal display apparatus which includes a polarization beam splitter having a polarization split film used as both a polarizer and an analyzer; a reflective liquid crystal display device; a quarter wave plate; and a projection optical system; where the absolute value of phase difference of diffracted light generated by the reflective liquid crystal display device in a black display state is reduced by the phase difference of the quarter wave plate, and thus the amount of stray light of the diffracted light guided from the polarizing beam splitter to the projection optical system decreases.
    • 至少一个示例性实施例涉及一种反射型液晶显示装置,其包括具有用作偏振器和分析器两者的偏振分束膜的偏振分束器; 反射型液晶显示装置; 四分之一波片; 和投影光学系统; 其中由黑色显示状态的反射型液晶显示装置产生的衍射光的相位差的绝对值通过四分之一波片的相位差而减小,并且因此从偏振光引导的衍射光的杂散光量 投影光学系统的分束器减小。
    • 27. 发明申请
    • MANAGEMENT SYSTEM AND MANAGEMENT METHOD
    • 管理系统与管理方法
    • US20100271173A1
    • 2010-10-28
    • US12712714
    • 2010-02-25
    • Shinichiro AIKAWAMasayuki AbeKenichi Mizuishi
    • Shinichiro AIKAWAMasayuki AbeKenichi Mizuishi
    • G05B19/00
    • G07C9/00087
    • Provided is a management technology capable of ensuring adequate security management even when using finger vein authentication for restricting entry by specific workers to a controlled area and for limiting the use of apparatuses inside the controlled area. This invention is a system for managing authority of a worker to work in a controlled area that requires wearing of protective clothing. The system performs: personal authentication outside the controlled area, using biometric information of the worker when not wearing the protective clothing; and determination processing to determine, in the controlled area, whether or not the worker who has been authenticated has authority to work in the controlled area, using security information other than the biometric information.
    • 提供了一种管理技术,即使当使用指静脉认证来限制特定工作人员进入受控区域并限制受控区域内的设备的使用时,也能够确保足够的安全管理。 本发明是一种用于管理工作人员在需要穿着防护服的受控区域工作的权限的系统。 系统执行:受控区外的个人认证,使用工作人员穿戴防护服时的生物识别信息; 以及确定处理,在受控区域中,使用除了生物特征信息之外的安全信息来确定已经被认证的工作人员是否有权在受控区域中工作。
    • 29. 发明授权
    • Projection image display apparatus
    • 投影图像显示装置
    • US06831706B2
    • 2004-12-14
    • US10197131
    • 2002-07-17
    • Masayuki AbeKeiji OhtakaAtsushi Okuyama
    • Masayuki AbeKeiji OhtakaAtsushi Okuyama
    • G02F11335
    • G02B27/1026G02B27/14G02B27/145G02B27/283H04N5/7441H04N9/3167
    • When light from a reflection image display element is incident on a polarization split surface at an angle other than 45°, leakage light that decreases the contrast of an image is produced. In a projection image display apparatus which illuminates an image display element with light from a light source and projects light from the image display element through two polarization split surfaces, when the angles of first and second light rays, of light rays incident on the polarization split surface, with respect to the optical axis correspond to 55% of the maximum angle of the incident light rays with respect to the optical axis, where light rays of which incident angle with respect to said image display element is larger is set as first light ray and light rays of which incident angle with respect to said image display element is smaller is set as second light ray, and a light shielding characteristic value L on the two polarization split surfaces is represented by L=[(M1)a·(M1)b+(M2)a·(M2)b]/2 where (M1)a is the amount of leakage light of the first light ray on the polarization split on the reflection image display element side, (M2)a is the amount of leakage light of the second light ray, (M1)b is the amount of leakage light of the first light ray on the polarization split on the projection optical system side, and (M2)b is the amount of leakage light of the second light ray.
    • 当来自反射图像显示元件的光以不同于45°的角度入射到偏振分割表面时,产生降低图像的对比度的泄漏光。 在利用来自光源的光照射图像显示元件的投影图像显示装置中,通过两个偏振分割面投影来自图像显示元件的光,当入射到偏振光分离体上的光线的第一和第二光线的角度 表面相对于光轴对应于入射光线相对于光轴的最大角度的55%,其中相对于所述图像显示元件的入射角较大的光线较大,被设定为第一光线 将相对于所述图像显示元件的入射角较小的光线设定为第二光线,并且将两个偏振分割面的遮光特性值L表示为L = [(M1)a(M1) b +(M2)a。(M2)b] / 2其中(M1)a是第一光线在反射图像显示元件侧的偏振分束上的泄漏光量,(M2)a是泄漏量 的光 (M1)b是投影光学系统侧的偏振光分割时的第一光线的泄漏光量,(M2)b是第二光线的漏光量。
    • 30. 发明授权
    • Method and apparatus for measuring magnetic head
    • 磁头测量方法及装置
    • US06639400B2
    • 2003-10-28
    • US10228189
    • 2002-08-27
    • Masayuki Abe
    • Masayuki Abe
    • G01R3312
    • G01R33/0385G01Q60/54G11B5/3166G11B5/455Y10S977/865
    • In a magnetic head measuring apparatus for measuring a magnetic head, an amplitude-modulated electric current whose amplitude is modulated by a specified carrier wave frequency and modulation frequency is applied to a magnetic head. A calibrating magnetic field generating source causes the magnetic head to generate a magnetic field having a specified strength and frequency, thereby calibrating measurement variations of the magnetic head. A magnetic head measuring device measures a high-frequency magnetic field generated from the magnetic head. If necessary, an interchangeable magnetic material probe is used to replace a probe of the magnetic head measuring device.
    • 在用于测量磁头的磁头测量装置中,将振幅由指定的载波频率和调制频率调制的幅度调制电流施加到磁头。 校准磁场产生源使得磁头产生具有指定强度和频率的磁场,从而校准磁头的测量变化。 磁头测量装置测量从磁头产生的高频磁场。 如果需要,可以使用可互换的磁性材料探针来代替磁头测量装置的探头。